EP0378281A3 - Time of flight mass spectrometer - Google Patents

Time of flight mass spectrometer Download PDF

Info

Publication number
EP0378281A3
EP0378281A3 EP19900200379 EP90200379A EP0378281A3 EP 0378281 A3 EP0378281 A3 EP 0378281A3 EP 19900200379 EP19900200379 EP 19900200379 EP 90200379 A EP90200379 A EP 90200379A EP 0378281 A3 EP0378281 A3 EP 0378281A3
Authority
EP
European Patent Office
Prior art keywords
ions
detector
mirror
spectrum
received
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP19900200379
Other languages
German (de)
French (fr)
Other versions
EP0378281A2 (en
Inventor
Yvon Le Beyec
Serge Della-Negra
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Original Assignee
Centre National de la Recherche Scientifique CNRS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS filed Critical Centre National de la Recherche Scientifique CNRS
Publication of EP0378281A2 publication Critical patent/EP0378281A2/en
Publication of EP0378281A3 publication Critical patent/EP0378281A3/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/405—Time-of-flight spectrometers characterised by the reflectron, e.g. curved field, electrode shapes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

Le spectromètre comprend une source d'ions (10), un miroir ionique (14) recevant les ions issus de la source, un premier détecteur (15) placé de manière à recevoir les ions réfléchis par le miroir et un second détecteur (16) disposé derrière le miroir. Un spectre "reflex" d'ions réfléchis par le miroir (14) et reçus par le premier détecteur (15) peut être obtenu en même temps qu'un spectre de neutres provenant de décomposition en vol d'ions métastables et reçus par le deuxième détecteur (16). Cette disposition est particulièrement adaptée à l'étude d'ions métastables, des moyens de traitement (20) étant prévus pour produire des spectres reflex corrélés avec un spectre de netures pour mettre en évidence les contributions des fragments ioniques correspondant à des fragments neutres reçus. The spectrometer comprises an ion source (10), an ion mirror (14) receiving the ions from the source, a first detector (15) positioned so as to receive the ions reflected by the mirror and a second detector (16) arranged behind the mirror. A "reflex" spectrum of ions reflected by the mirror (14) and received by the first detector (15) can be obtained at the same time as a spectrum of neutrals originating from the decomposition in flight of metastable ions and received by the second. detector (16). This arrangement is particularly suitable for the study of metastable ions, processing means (20) being provided to produce reflex spectra correlated with a spectrum of netures to highlight the contributions of the ionic fragments corresponding to neutral fragments received.

EP19900200379 1984-02-29 1985-02-28 Time of flight mass spectrometer Withdrawn EP0378281A3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8403127 1984-02-29
FR8403127A FR2560434B1 (en) 1984-02-29 1984-02-29 TIME OF FLIGHT MASS SPECTROMETER

Related Parent Applications (2)

Application Number Title Priority Date Filing Date
EP85400380.3 Division 1985-02-28
EP85400380A Division EP0154590B1 (en) 1984-02-29 1985-02-28 Time-of-flight mass spectrometer

Publications (2)

Publication Number Publication Date
EP0378281A2 EP0378281A2 (en) 1990-07-18
EP0378281A3 true EP0378281A3 (en) 1992-03-11

Family

ID=9301533

Family Applications (2)

Application Number Title Priority Date Filing Date
EP85400380A Expired - Lifetime EP0154590B1 (en) 1984-02-29 1985-02-28 Time-of-flight mass spectrometer
EP19900200379 Withdrawn EP0378281A3 (en) 1984-02-29 1985-02-28 Time of flight mass spectrometer

Family Applications Before (1)

Application Number Title Priority Date Filing Date
EP85400380A Expired - Lifetime EP0154590B1 (en) 1984-02-29 1985-02-28 Time-of-flight mass spectrometer

Country Status (5)

Country Link
US (1) US4694168A (en)
EP (2) EP0154590B1 (en)
JP (1) JPS60258841A (en)
DE (1) DE3579477D1 (en)
FR (1) FR2560434B1 (en)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4731538A (en) * 1986-06-20 1988-03-15 Galileo Electro-Optics Corp. Microchannel plate ion detector
JPH0789476B2 (en) * 1986-12-08 1995-09-27 株式会社島津製作所 Time-of-flight mass spectrometer
US4894536A (en) * 1987-11-23 1990-01-16 Iowa State University Research Foundation, Inc. Single event mass spectrometry
DE3842044A1 (en) * 1988-12-14 1990-06-21 Forschungszentrum Juelich Gmbh FLIGHT TIME (MASS) SPECTROMETER WITH HIGH RESOLUTION AND TRANSMISSION
AU5856490A (en) * 1989-06-06 1991-01-08 Viking Instruments Corp. Miniaturized mass spectrometer system
US5313061A (en) * 1989-06-06 1994-05-17 Viking Instrument Miniaturized mass spectrometer system
DE3920566A1 (en) * 1989-06-23 1991-01-10 Bruker Franzen Analytik Gmbh MS-MS FLIGHT TIME MASS SPECTROMETER
GB8915972D0 (en) * 1989-07-12 1989-08-31 Kratos Analytical Ltd An ion mirror for a time-of-flight mass spectrometer
US5026988A (en) * 1989-09-19 1991-06-25 Vanderbilt University Method and apparatus for time of flight medium energy particle scattering
US5155357A (en) * 1990-07-23 1992-10-13 Massachusetts Institute Of Technology Portable mass spectrometer
DE4106796A1 (en) * 1991-03-04 1991-11-07 Wollnik Hermann A FLIGHT-TIME MASS SPECTROMETER AS SECOND LEVEL OF AN MS-MS SYSTEM
US5168158A (en) * 1991-03-29 1992-12-01 The United States Of America As Represented By The United States Department Of Energy Linear electric field mass spectrometry
US5202563A (en) * 1991-05-16 1993-04-13 The Johns Hopkins University Tandem time-of-flight mass spectrometer
GB2266407A (en) * 1992-04-21 1993-10-27 Univ Wales Charged particle analyser
US5360976A (en) * 1992-08-25 1994-11-01 Southwest Research Institute Time of flight mass spectrometer, ion source, and methods of preparing a sample for mass analysis and of mass analyzing a sample
US5376788A (en) * 1993-05-26 1994-12-27 University Of Manitoba Apparatus and method for matrix-assisted laser desorption mass spectrometry
US5367162A (en) * 1993-06-23 1994-11-22 Meridian Instruments, Inc. Integrating transient recorder apparatus for time array detection in time-of-flight mass spectrometry
US5784424A (en) * 1994-09-30 1998-07-21 The United States Of America As Represented By The United States Department Of Energy System for studying a sample of material using a heavy ion induced mass spectrometer source
US5998215A (en) * 1995-05-01 1999-12-07 The Regents Of The University Of California Portable analyzer for determining size and chemical composition of an aerosol
US5625184A (en) * 1995-05-19 1997-04-29 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US6002127A (en) * 1995-05-19 1999-12-14 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
EP0939970A4 (en) * 1996-11-15 2000-04-12 Sensar Corp Multi-anode time to digital converter
US5777326A (en) * 1996-11-15 1998-07-07 Sensor Corporation Multi-anode time to digital converter
GB2339958B (en) 1998-07-17 2001-02-21 Genomic Solutions Ltd Time-of-flight mass spectrometer
US6717135B2 (en) 2001-10-12 2004-04-06 Agilent Technologies, Inc. Ion mirror for time-of-flight mass spectrometer
KR20040034252A (en) * 2002-10-21 2004-04-28 삼성전자주식회사 Matrix assisted laser desorption ionization time of flight mass spectrometry
US6912238B2 (en) * 2003-04-10 2005-06-28 Lockheed Martin Corporation Particle beam device
FR2895833B1 (en) * 2006-01-03 2008-02-29 Phisikron Soc Par Actions Simp METHOD AND SYSTEM FOR TANDEM MASS SPECTROMETRY WITHOUT PRIMARY MASS SELECTION AND FLIGHT TIME
US20080087814A1 (en) * 2006-10-13 2008-04-17 Agilent Technologies, Inc. Multi path tof mass analysis within single flight tube and mirror
US20080203304A1 (en) * 2007-02-22 2008-08-28 The Regents Of The University Of Ca Multichannel instrumentation for large detector arrays
WO2008142170A1 (en) * 2007-05-24 2008-11-27 Physikron Method and system of tandem mass spectrometry without primary mass selection with secondary ionization of dissociated neutral fragments.
US7888636B2 (en) * 2007-11-01 2011-02-15 Varian Semiconductor Equipment Associates, Inc. Measuring energy contamination using time-of-flight techniques
JP2013532366A (en) * 2010-07-09 2013-08-15 アルダン アサノビッチ サパカリエフ Mass spectrometry and apparatus thereof
US8935101B2 (en) * 2010-12-16 2015-01-13 Thermo Finnigan Llc Method and apparatus for correlating precursor and product ions in all-ions fragmentation experiments

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE956450C (en) * 1953-11-25 1957-01-17 Tno mass spectrometry
US3727047A (en) * 1971-07-22 1973-04-10 Avco Corp Time of flight mass spectrometer comprising a reflecting means which equalizes time of flight of ions having same mass to charge ratio
US3769513A (en) * 1972-12-14 1973-10-30 Perkin Elmer Corp Ion kinetic energy spectrometer

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PHYSICS. vol. 20, no. 1, Mai 1976, AMSTERDAM NL pages 77 - 88; R.IGERSHEIM ET AL.: 'Spectrometres de masse à temps de vol avec guides de particule' *
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PHYSICS. vol. 52, no. 2/3, Septembre 1983, AMSTERDAM NL pages 223 - 240; H.DANIGEL ET AL.: 'A 252Cf fission fragment-induced desorption mass spectrometer:design,operation and performance' *
NUCLEAR INSTRUMENTS AND METHODS. no. 188, 1981, AMSTERDAM NL pages 99 - 104; E.FESTA ET AL.: 'A multistop time-to-digital converter' *
NUCLEAR INSTRUMENTS AND METHODS. vol. 163, no. 2/3, Juillet 1979, AMSTERDAM NL pages 359 - 362; E.WEISSENBERGER: 'Compact time-zero detector for heavy ions' *

Also Published As

Publication number Publication date
EP0154590B1 (en) 1990-09-05
US4694168A (en) 1987-09-15
FR2560434B1 (en) 1987-09-11
FR2560434A1 (en) 1985-08-30
EP0154590A2 (en) 1985-09-11
DE3579477D1 (en) 1990-10-11
EP0378281A2 (en) 1990-07-18
EP0154590A3 (en) 1986-08-13
JPS60258841A (en) 1985-12-20

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