EP0155126B2 - Self tuning coin recognition system - Google Patents
Self tuning coin recognition system Download PDFInfo
- Publication number
- EP0155126B2 EP0155126B2 EP85301409A EP85301409A EP0155126B2 EP 0155126 B2 EP0155126 B2 EP 0155126B2 EP 85301409 A EP85301409 A EP 85301409A EP 85301409 A EP85301409 A EP 85301409A EP 0155126 B2 EP0155126 B2 EP 0155126B2
- Authority
- EP
- European Patent Office
- Prior art keywords
- coin
- sensor
- test
- acceptable
- coins
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/08—Testing the magnetic or electric properties
-
- G—PHYSICS
- G07—CHECKING-DEVICES
- G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
- G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
- G07D5/02—Testing the dimensions, e.g. thickness, diameter; Testing the deformation
Definitions
- the present invention relates to the examination of coins for authenticity and denomination, and more particularly to an adjustment-free self-tuning mechanism for coin testing.
- WO-A-80/01963 discloses an apparatus for distinguishing test items, particularly banknotes. Each measurement of a test item is statistically processed with measurements for earlier items to calculate a mean value and a dispersion value, these being used to set limit values to determine whether a subsequently tested item is genuine.
- initial limits are set rather wide so that virtually 100% acceptance of all genuine 5-cent coins is assured.
- acceptable coins are inserted into the apparatus and are tested by one or more sensors.
- a statistical function of the parameter measured by each sensor is computed. For example, a running average of the parameter can be computed.
- a new acceptance limit is automatically established by the electronic coin testing apparatus.
- the new acceptance limits can be set at the running average plus or minus a stored, preestablished constant or a stored, preestablished percentage of the running average.
- standard initial acceptance limits are not stored and tuning is begun by transmitting an instruction signal that the apparatus is to be tuned for a particular coin such as the 5-cent coin.
- a predetermined number of valid 5-cent coins are inserted and tested.
- a single test coin representative of the average 5-cent coin may be used.
- a statistical function is computed and acceptance limits are set based thereon.
- the process is repeated for additional denominations of coins which are to be accepted. In either case, the initial factory tuning is accomplished by merely inserting a predetermined number of valid coins.
- the statistical function is continuously recomputed by the electronic coin testing apparatus as additional acceptable coins are inserted. In order to compensate for environmental changes such as a change of temperature or humidity after a large number of coins have been accepted, the coin testing apparatus reweights the computation so that the computation of the statistical function is based upon information for only a predetermined number of the most recently inserted and accepted coins.
- the self-tuning feature of a coin testing apparatus has the advantage of significantly reducing the time and skill required to originally tune the coin testing apparatus in the factory, thereby reducing the costs of labor used in the manufacturing process. Further, such apparatus continuously retunes itself during normal operation thereby compensating for parameter drift and environmental changes.
- the coin examining method and apparatus of this invention may be applied to a wide range of electronic coin tests for measuring a parameter indicative of a coin's acceptability and to the identification and acceptance of any number of coins from the coin sets of many countries, the invention will be adequately illustrated by explanation of its application to identifying the U.S. 5-cent coin.
- the following description concentrates on the details for setting the acceptance limits for a high frequency diameter test for U.S. 5-cent coins, but the application of the invention to other coin tests for U.S. 5-cent coins, such as a high frequency thickness test, and to other coins will be clear to those skilled in the art.
- Fig. 1 shows a block schematic diagram of an electronic coin testing apparatus 10 in accordance with the present invention.
- the mechanical portion of the electronic coin testing apparatus 10 is shown in Fig. 3.
- the electronic coin testing apparatus 10 includes two principal sections: a coin examining and sensing circuit 20 including individual sensor circuits 21, 22 and 23, and a processing and control circuit 30.
- the processing and control circuit 30 includes a programmed microprocessor 35, an analog to digital (A/D) converter circuit 40, a signal shaping circuit 45, a comparator circuit 50, a counter 55, and NOR-gates 61, 62, 63, 64 and 65.
- A/D analog to digital
- Each of the sensor circuits 21, 22 includes a two-sided inductive sensor 24, 25 having its series connected coils located adjacent opposing sidewalls of a coin passageway. As shown in Fig. 3, sensor 24 is preferably of a large diameter for testing coins of wideranging diameters.
- Sensor circuit 23 includes an inductive sensor 26 which is preferably arranged as shown in Fig. 3.
- Sensor circuit 21 is a high frequency low power oscillator used to test coin parameters, such as diameter and material, and to "wake up" the microprocessor 35.
- the frequency and amplitude of the output of sensor circuit 21 change as a result of coin interaction with the sensor 24.
- This output is shaped by the shaping circuit 45 and fed to the comparator circuit 50.
- the comparator circuit 50 produces an output on line 36 which is conected to the interrupt pin of microprocessor 35.
- a signal on line 36 directs the microprocessor 35 to "wake up” or in other words, to go from a low power idling or rest state to a full power coin evaluation state.
- the electronic coin testing apparatus 10 may be employed in a coin operated telephone or other environment in which low power operation is very important. In such environments, the above described wake up feature is particularly useful.
- the above described "wake up" is only one possible way for powering up upon detecting coin arrival. For examples a separate arrival detector could be used to detect coin arrival and wake up the microprocessor.
- the output from shaping circuit 45 is also fed to an input of the A/D converter circuit 40 which converts the analog signal at its input to a digital output.
- This digital output is serially fed on line 42 to the microprocessor 35.
- the digital output is monitored by microprocessor 35 to detect the effect of a passing coin on the amplitude of the output of sensor circuit 21. In conjunction with frequency shift information, the amplitude information provides the microprocessor 35 with adequate data for particularly reliable testing of coins of wideranging diameters using a single sensor 21.
- the output of sensor circuit 21 is also connected to one input of NOR gate 61 the output of which is in turn connected to an input of NOR gate 62.
- NOR gate 62 is connected as one input of NOR gate 65 which has its output connected to the counter 55.
- Frequency related information for the sensor circuit 21 is generated by selectively connecting the output of sensor circuit 21 through the NOR gates 61, 62 and 65 to the counter 55.
- Frequency information for sensor circuits 22 and 23 is similarly generated by selectively connecting the output of either sensor circuit 22 or 23 through its respective NOR gate 63 or 64 and the NOR gate 65 to the counter 55.
- Sensor circuit 22 is also a high frequency low power oscillator and it is used to test coin thickness.
- Sensor circuit 23 is a strobe sensor commonly found in vending machines.
- the sensor 26 is located after an accept gate 71.
- the output of sensor circuit 23 is used to control such functions as the granting of credit, to detect coin jams and to prevent customer fraud by methods such as lowering an acceptable coin into the machine with a string.
- the microprocessor 35 controls the selective connection of the outputs from the sensor circuits 21, 22 and 23 to counter 55 as described below.
- the frequency of the oscillation at the output of the sensor circuits 21, 22 and 23 is sampled by counting the threshold level crossings of the output signal occurring in a predetermined sample time. The counting is done by the counter circuit 55 and the length of the predetermined sample time is controlled by the microprocessor 35.
- One input of each of the NOR gates 62, 63 and 64 is connected to the output of its associated sensor circuit 21, 22 and 23.
- the output of sensor 21 is connected through the NOR gate 61 which is connected as an inverter amplifier.
- the other input of each of the NOR gates 62, 63 and 64 is connected to its respective control line 37, 38 and 39 from the microprocessor 35.
- the signals on the control lines 37, 38 and 39 control when each of the sensor circuits 21, 22 and 23 is interrogated or sampled, or in other words, when the outputs of the sensor circuits 21, 22 and 23 will be fed to the counter 55.
- microprocessor 35 produces a high (logic "1") signal on lines 38 and 39 and a low signal (logic "0") on line 37
- sensor circuit 21 is interrogated, and each time the output of the NOR gate 61 goes low, the NOR gate 62 produces a high output which is fed through NOR gate 65 to the counting input of and counted by the counter 55.
- Counter 55 produces an output count signal and this output of counter 55 is connected by line 57 to the microprocessor 35.
- Microprocessor 35 determines whether the output count signal from the counter 55 and the digital amplitude information from A/D converter circuit 40 are indicative of a coin of acceptable diameter or not by determining whether the outputs of counter 55 and A/D converter circuit: 40 or a value or values computed therefrom are within stored acceptance limits. When sensor circuit 22 is interrogated, microprocessor 35 determines whether the counter output is indicative of a coin of acceptable thickness. Finally, when sensor circuit 23 is interrogated, microprocessor 35 determines whether the counter output is indicative of coin presence or absence. When both the diameter and thickness tests are satisfied, a high degree of accuracy in discrimination between genuine and false coins is achieved.
- Fig. 2 is a detailed schematic diagram of circuitry suitable for the embodiment of Fig. 1 including the following components: Resistors R 1 820 k R 2 330 k R 3 43 k R 4 ,R 9 ,R 12 3.9 k R 5 ,R 13 ,R 28 ,R 36 1 k R 6 ,R 14 ,R 18 ,R 21 R 27 ,R 29 ,R 30 , R 31 ,R 34 ,R 38 100 k R 7 510 k R 8 680 k R 10 470 k R 11 620 k R 15 ,R 26 47 k R 16 180 k R 17 10 k R 20 390 k R 22 ,R 23 150 k R 24 ,R 37 6.8 k R 25 ,R 39 ,R 40 1 M R 35 1.5 k Inductive Sensors 24 3.5 mH 25 400 uH 26 240 uH Capacitors C 1 ,C 2 ,C 3 ,C 4 ,C 15 C 16 ,C 17 ,C 22
- Sensor circuit 21 is a low power oscillator circuit having an inductive sensor 24 comprising two coils connected in series and located on the opposing sidewalls 36 and 38 shown in Fig. 3.
- the two coils of sensor 24 have a combined inductance of approximately 3.5mH and the sensor circuit 21 oscillates at an idling frequency of approximately 170kHz.
- An oscillating output signal from sensor circuit 21 is taken from point A and connected through shaping circuit 45 to A/D converter 41 and comparator circuit 50.
- the signal at point B is the envelope of the oscillation output signal of sensor circuit 21.
- the amplitude of the signal at the point B is approximately 3.5 volts.
- the comparator circuit 50 produces an output on line 36 which is fed through a NOR gate and a diode to the interrupt port of microprocessor 35 and wakes up microprocessor 35. Amplitude and frequency information for diameter testing are then generated and evaluated as discussed above.
- Sensor circuit 22 shown in detail in Fig. 2 is also an oscillator circuit and it produces frequency test information relating to the width of a coin passing sensor 25.
- the oscillator shown in Fig. 2 has an inductive sensor 25 comprising two coils connected in series and located on the opposing side walls 36 and 38 shown in Fig. 3.
- the two coils of sensor 25 have a combined inductance of approximately 400uH and the oscillator circuit has an idling frequency of approximately 750kHz.
- the sensor circuit 23, the strobe sensor has its inductive sensor 26 located after a coin routing gate 71 as shown in Fig. 3.
- the single coil of inductive sensor 26 has an inductance of approximately 240uH and sensor circuit 23 has an idling frequency of approximately 850kHz.
- the strobe sensor is used to detect coin passage, to prevent coin jamming and customer fraud.
- the microprocessor 35 is a CMOS device with its RAM power supply 80 backed up by a 3 volt lithium battery LB. This power arrangement provides for nonvolatile memory. Other devices including EEPROM and NOVRAM devices can be used to achieve the same result. As shown in Fig. 2, the three chips labeled 58, 59 and 60 constitute the external program memory. Where a microprocessor 35 is used which has sufficient internal memory, such as an Intel 80C49, the chips 58, 59 and 60 may be eliminated.
- the electronic coin testing apparatus 10 is incorporated into a coin operated telephone.
- the apparatus 10 is only powered up when the phone is off-the-hook.
- each of the sensor circuits begins to oscillate.
- the microprocessor 35 samples and stores idling or no coin amplitude (A o ) and frequency (f o ) values for sensor circuit 21 and frequency values for sensor circuits 22 and 23. Then, the microprocessor "goes to sleep” or enters a rest or standby mode. In this mode, it consumes very little power until an interrupt signal is produced on line 36 thereby indicating that a coin has been inserted and waking up microprocessor 35.
- Microprocessor 35 upon being awakened is fully powered and it evaluates the information from the sensor circuits 21 and 22 and determines whether or not the detected coin is an acceptable coin.
- a dimensionless quantity F ⁇ f/f o is then computed and compared with stored acceptance limits to see if this value of F for the coin being tested lies within the acceptability range for a valid coin.
- this type of measurement technique also applies to parameters of a sensor output signal other than frequency, for example, amplitude.
- the present invention is specifically applied to the setting of coin acceptance limits for particular sensors providing amplitude and frequency outputs, it applies in general to the setting of coin acceptance limits derived from a statistical function for a number of previously accepted coins of the parameter or parameters measured by any sensor.
- the F value is stored and added to the store of information used by microprocessor 35 for computing new acceptance limits. For example, a running average of stored F values is computed for a predetermined number of previously accepted coins and the acceptance limits are established as the running average plus or minus a stored constant or a stored percentage of the running average. Both wide and narrow acceptance limits are stored in the microprocessor 35. Alternatively these limits might be stored in RAM or ROM. In the embodiment shown, whether the new acceptance limits are set to wide or narrow values is controlled by external information supplied to the microprocessor through its data communication bus. Alternatively, a selection switch connected to one input of the microprocessor 35 might be used.
- microprocessor 35 tests for the state of the switch, that is, whether it is open or closed and adjusts the limits depending on the state of the switch.
- the narrow range achieves very good protection against the acceptance of slugs; however, the tradeoff is that acceptable coins which are worn or damaged may be rejected.
- the ability to select between wide and narrow acceptance limits allows the owner of the apparatus to adjust the acceptance limits in accordance with his operational experience.
- a relay control circuit 70 for controlling the gate 71 shown in Fig. 3, a clock 75, a power supply circuit 80, interface lines 81, 82, 83 and 84, and debug line 85.
- the microprocessor 35 can be readily programmed to control relay circuit 70 which operates a gate to separate acceptable from unacceptable coins or perform other coin routing tasks.
- the particular details of controlling such a gate do not form a part of the present invention.
- U.S. Patent No. 4,106,610 See also, Plesko, "Low Power Coin Routing Gate", U.S. patent No. 4534459 (corresponding to EP-A-0154525 for details of a preferred gate suitable for use in conjunction with this invention.
- the clock 75 and power supply 80 supply clock and power inputs required by the microprocessor 35.
- the interface lines 81, 82, 83 and 84 provide a means for connecting the electronic coin testing apparatus 10 to other apparatus or circuitry which may be included in a coin operated vending mechanism which includes the electronic coin testing apparatus 10. The details of such further apparatus and the connection thereto do not form part of the present invention.
- Debug line 85 provides a test connection for monitoring operation and debugging purposes.
- Fig. 3 illustrates the mechanical portion of the coin testing apparatus 10 and one way in which sensors 24, 25 and 26 may be suitably positioned adjacent a coin passageway defined by two spaced side walls 36, 38 and a coin track 33, 33a.
- the coin handling apparatus 11 includes a conventional coin receiving cup 31, two spaced sidewalls 36 and 38, connected by a conventional hinge and spring assembly 34, and coin track 33, 33a.
- the coin track 33, 33a and sidewalls 36, 38 form a coin passageway from the coin entry cup 31 past the coin sensors 24, 25.
- Fig. 3 also shows the sensor 26 located after the gate 71, which in Fig. 3 is shown for separating acceptable from unacceptable coins.
- Fig. 4 is a flowchart of the operation of the embodiment of Figs. 1-3.
- initial acceptance limits for each test are stored in the microprocessor 35 of the electronic coin testing apparatus 10. These initial limits are set quite wide guaranteeing almost 100% acceptance of acceptable coins. These acceptance limits are used only in the original tuning.
- a predetermined number of known acceptable coins of each denomination are inserted. For example, eight acceptable 5-cent coins are inserted. The inserted coins are detected by the sensor circuit 21, microprocessor 35 is awakened, amplitude and frequency tests are conducted for each coin using sensor circuit 21, and a second frequency test is conducted using sensor circuit 22.
- new acceptance limits are computed based on the test information for the eight acceptable coins. These new limits are used for testing additional coins which are inserted.
- the frequency test using sensor circuit 21 will be further discussed, but it should be understood that similar processing is performed for each test undertaken in the coin validation process.
- Fig. 4 illustrates the process involved in the coin telephone context. It will be understood that the method and apparatus of the present invention can be used in other contexts.
- the general method of Fig. 4 may be understood by taking all f variables as representing any function which might be tested, such as frequency, amplitude and the like, for any coin test. The specific discussion which follows will be in terms of frequency testing for United States 5-cent coins.
- a dimensionless quantity, F is calculated by dividing ⁇ f by f o .
- F
- the computed F for the first 5-cent coin is compared with the stored acceptance limits to see if it lies within those limits. Since the first 5-cent coin is an acceptable 5-cent coin, its F value is within the limits.
- the first 5-cent coin is accepted and microprocessor 35 obtains a coin count C for that coin.
- F AVE NEW and new acceptance limits are continually recomputed. If a coin other than an acceptable 5-cent coin is inserted, its F value will not be within the acceptance limits and that coin will be rejected. After that occurs, a new idling frequency, f o , is measured and then microprocessor 35 returns to a rest state to await coin arrival.
- the method of the present invention is not limited to frequency based testing. Neither is the statistical function limited solely to a running average.
- the specific example of the flowchart discussed above uses the numbers 8, 16 and 32 in the computation process, other predetermined numbers may be used without departing from the present invention.
- the values 8, 16 and 32 were selected because: a) F AVE NEW is fairly well determined after eight coins have been accepted; b) F AVE NEW becomes heavily weighted after 32 coins have been inserted so that the insertion of additional acceptable coins has little effect; and c) the number 16 is between 8 and 32.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Coins (AREA)
- Inspection Of Paper Currency And Valuable Securities (AREA)
- Small-Scale Networks (AREA)
- Noodles (AREA)
- Control And Other Processes For Unpacking Of Materials (AREA)
- Control Of Vending Devices And Auxiliary Devices For Vending Devices (AREA)
- Devices For Checking Fares Or Tickets At Control Points (AREA)
- Refuge Islands, Traffic Blockers, Or Guard Fence (AREA)
Abstract
Description
Resistors | |
R1 | 820 k |
R2 | 330 k |
R3 | 43 k |
R4,R9,R12 | 3.9 k |
R5,R13,R28,R36 | 1 k |
R6,R14,R18,R21 | |
R27,R29,R30, | |
R31,R34,R38 | 100 k |
R7 | 510 k |
R8 | 680 k |
R10 | 470 k |
R11 | 620 k |
R15,R26 | 47 k |
R16 | 180 k |
R17 | 10 k |
R20 | 390 k |
R22,R23 | 150 k |
R24,R37 | 6.8 k |
R25,R39,R40 | 1 M |
R35 | 1.5 k |
Inductive Sensors | |
24 | 3.5 mH |
25 | 400 uH |
26 | 240 uH |
Capacitors | |
C1,C2,C3,C4,C15 C16,C17,C22,C23, C34 | .luf |
C5 | 250 pf |
C6,C33 | 510 pf |
C7,C8 | 180 pf |
C9,C10 | 100 pf |
C11,C12,C13,C18 | .01 uf |
C14,C21, | 10 uf |
C19,C20 | 30 pf |
Diodes | |
D1,D2,D3,D4,D5 | |
D6,D7,D8,D9 | |
D11,D12,D13,D14, | |
D17,D18,D20,D21, | |
D22,D23, | 1N4148 |
D15,D16 | HSCH 1001 |
Zener Diode | |
Z | 4.7V |
Transistors | |
T1,T2,T3 | 2N5089 |
T4 | 2N3392 |
T5,T6 | 2N4356 |
Battery | |
LB | Saft LB2425 3 V Lithium |
Oscillator | |
O | Murata 2MHz Ceramic Resonator |
Comparators | |
Comp1, Comp2 | LM2903 |
NOR Gates | |
61,62,63,64 | National Semiconductor 4001 |
65 | National Semiconductor 4025 |
Counter | |
55 | National Semiconductor CD 4520B |
Enternal Memory | |
58 | 74C244 |
59 | 27C16 |
60 | 74C373 |
Microprocessor | |
35 | Intel 80C39. |
Claims (30)
- A method of operating a coin testing apparatus (10) comprising testing a coin and determining from the results of the test whether the coin is acceptable and, if so, the denomination of the coin, the testing step comprising deriving a measurement of the coin and the determining step comprising using respective predetermined acceptance criteria for determining whether the measurement is indicative of an acceptable coin of a respective denomination, the method including the further step, if the coin is determined to be acceptable, of modifying the respective acceptance criterion for the coin denomination to an extent dependent upon said measurement so that the modified acceptance criterion can be used with a subsequently tested coin, wherein the method also includes the step of additionally changing the respective modified acceptance criterion for the coin denomination to select between relatively wide acceptance limits and relatively narrow acceptance limits, the latter reducing the likelihood that slugs will be accepted and thus cause modification of the respective acceptance criterion.
- A method as claimed in claim 1, wherein the testing step comprises deriving a plurality of coin measurements and the determining step comprises using respective predetermined acceptance criteria to determine whether each measurement is indicative of an acceptable coin, the method including the step of modifying each acceptance criterion to an extent dependent upon the respective measurement if the coin is determined to be acceptable.
- A method as claimed in claim 1 or 2, wherein the acceptance criterion is modified each time a tested coin has been determined to be acceptable.
- A method as claimed in any preceding claim, wherein the step of modifying the acceptance criterion comprises computing a statistical function value from the coin measurement.
- A method as claimed in claim 4, wherein the computing step involves calculating a running average of the measurements of coins determined to be acceptable.
- A method as claimed in claim 5, wherein the running average is weighted so as to reduce the effect of the measurements of the earlier-tested coins.
- A method as claimed in any preceding claim, wherein the step of modifying the acceptance criterion comprises computing acceptance limits for use with a subsequently tested coin, and storing the computed acceptance limits, whereby the measurement of the subsequently tested coin can be compared with the stored acceptance limits.
- A method as claimed in any preceding claim, including a setting-up operation involving testing a plurality of coins and determining whether they are acceptable using an initial acceptance criterion, computing a statistical function value from the measurements of the coins determined to be acceptable, and employing a new acceptance criterion derived from the computed statistical function value after a predetermined number of coins have been determined to be acceptable.
- A method as claimed in any one of claims 1 to 7, including a setting-up operation involving testing a predetermined number of coins of a known denomination to derive measurements of said coins, computing a statistical function value from said measurements and deriving an acceptance criterion from said statistical function value.
- A method as claimed in any one of claims 1 to 7, including a setting-up operation comprising testing a single coin of known denomination to derive a measurement thereof, and calculating an initial acceptance criterion from said measurement.
- Apparatus for testing coins, comprising:test means (20) for producing an output signal indicative of a characteristic of a tested coin;memory means for storing test limits associated with respective coin denominations;means (35, 40, 55) to derive a test value from the output signal;means to determine whether the tested coin is acceptable and, if so, the denomination of the coin, said determining means being operable to compare the test value with the stored test limits;means for recomputing the test limits associated with a coin denomination if the tested coin is determined to be an acceptable coin of that denomination so that the recomputed test limits can be used for a subsequent coin; andmeans for selecting between relatively wide and relatively narrow, recomputed test limits, the latter reducing the likelihood that slugs will be accepted and thus cause modification of the respective acceptance criterion.
- Apparatus as claimed in claim 11, wherein the test means (20) comprises a sensor circuit (21,22) having a sensor (24,25) located adjacent a coin path for producing an output signal indicative of a characteristic of a tested coin on the coin path adjacent the sensor (24,25).
- Apparatus according to claim 12 wherein the sensor circuit (21,22) is an oscillator circuit which produces an oscillating output signal.
- Apparatus according to claim 13 wherein the means (40,55) to derive a test value from the output signal comprises an analog-to-digital converter circuit (40) for producing a digital output signal related to the amplitude of the oscillating output signal.
- Apparatus according to claim 13 or 14 wherein the means (40,55) to derive a test value from the output signal comprises a counter circuit (55) for producing a digital output count related to the frequency of oscillation of the oscillating output signal.
- Apparatus according to any one of claims 11 to 15 wherein the means to determine and the means for recomputing comprise a programmed microprocessor (35).
- Apparatus according to claim 16 wherein the programmed microprocessor (35) stores the recomputed test limit each time a coin is found to be acceptable.
- Apparatus according to any one of claims 11 to 17 further comprising means to switch the apparatus into a test limit setting mode in which at least one known acceptable coin is inserted and the apparatus (10) for testing coins derives initial test limits therefrom.
- Apparatus according to any one of claims 11 to 18 wherein the recomputing means is operable repeatedly to recompute the coin test limits as coins are accepted so that subsequently inserted coins are tested based upon information from a plurality of recently previously inserted coins which have been accepted.
- Apparatus according to any one of claims 11 to 19 wherein the test means (20) includes an electro-magnetic sensor (24;25).
- Apparatus according to any one of claims 11 to 20 including a coin track (33,33a) along which coins roll edgewise past the test means (20).
- Apparatus as claimed in claim 11, said apparatus comprising:a coin receiving cup (31) for directing a coin which is inserted into said cup (31) to a coin passageway (33,33a,36,38);a coin sensor (24;25) of said test means (20) located adjacent a first position along said coin passageway (33,33a,36,38), said coin passageway serving to direct the coin from the coin receiving cup (31) to the first position and said coin sensor (24;25) producing an output signal when the coin is adjacent the coin sensor (24;25) indicative of whether or not the coin is an acceptable coin;a coin routing gate (71) located adjacent a second position along said coin passageway (33,33a,36,38) downstream of the first position, said coin routing gate (71) operating to direct the coin;means (70) for physically controlling the position of the coin routing gate (71); anda processing means (35) comprising said determining means, said recomputing means and said memory means, said processing means (35) being connected to the coin sensor (24;25) and the means (70) for physically controlling the position of the coin routing gate (71), for receiving the output signal from the coin sensor (24;25), for retrieving the coin test limitsfrom the memory means, for computing a coin test value based on the output signal of the coin sensor (24;25) when the coin is adjacent the coin sensor (24;25), for determining if the coin has a first characteristic of an acceptable coin based on a comparison of the coin test value with the coin test limits, and for automatically using the coin test value to change the coin test limits stored in the memory means if the coin is an acceptable coin.
- Apparatus according to claim 22, wherein the coin sensor (24) comprises an inductive sensor for sensing coin diameter and material.
- Apparatus according to claim 23, wherein the inductive sensor (24) comprises two coils connected in series having a combined inductance of approximately 3.5 mH and forming part of a high frequency low power oscillator circuit (21) having an idling frequency of approximately 170 kHz.
- Apparatus according to claim 23 or 24 wherein the processing means (35) is responsive to changes in both the amplitude and frequency of the output signal of the coin sensor (24) for purposes of determining whether the coin has two characteristics of an acceptable coin.
- Apparatus according to claim 25 wherein the processing means (35) is further responsive to a change in the amplitude of said output signal exceeding a predetermined amount to switch itself from a low power idling state to a fully powered testing state.
- Apparatus according to claim 22 wherein the coin sensor (25) comprises an inductive sensor for sensing coin thickness.
- Apparatus according to claim 27 wherein the inductive sensor (25) comprises two coils connected in series having a combined inductance of approximately 400 µH and forming part of a high frequency low power oscillator circuit (22) having an idling frequency of approximately 750 kHz.
- Apparatus according to any ode of claims 22 to 26 further comprising a second coin sensor (25) connected to the processing means (35) and located adjacent the coin passageway (33,33a,36,38) between the aforementioned coin sensor (24) and the coin routing gate (71).
- Apparatus according to claim 29 further comprising an additional coin sensor (26) connected to the processing means (35) and located downstream of the coin routing gate (71).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT85301409T ATE61136T1 (en) | 1984-03-01 | 1985-03-01 | SELF-TUNING COIN RECOGNITION SYSTEM. |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US58525384A | 1984-03-01 | 1984-03-01 | |
US585253 | 1984-03-01 |
Publications (4)
Publication Number | Publication Date |
---|---|
EP0155126A2 EP0155126A2 (en) | 1985-09-18 |
EP0155126A3 EP0155126A3 (en) | 1987-01-07 |
EP0155126B1 EP0155126B1 (en) | 1991-02-27 |
EP0155126B2 true EP0155126B2 (en) | 2001-07-11 |
Family
ID=24340677
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP85301409A Expired - Lifetime EP0155126B2 (en) | 1984-03-01 | 1985-03-01 | Self tuning coin recognition system |
Country Status (16)
Country | Link |
---|---|
EP (1) | EP0155126B2 (en) |
JP (2) | JPH0727585B2 (en) |
KR (1) | KR930007271B1 (en) |
AT (1) | ATE61136T1 (en) |
AU (1) | AU584330B2 (en) |
BR (1) | BR8505538A (en) |
CA (1) | CA1228921A (en) |
DE (1) | DE3581817D1 (en) |
DK (1) | DK502785A (en) |
ES (1) | ES8700886A1 (en) |
GR (1) | GR850518B (en) |
HK (1) | HK36396A (en) |
IE (1) | IE56794B1 (en) |
MX (1) | MX160403A (en) |
WO (1) | WO1985004037A1 (en) |
ZA (1) | ZA851248B (en) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4705154A (en) * | 1985-05-17 | 1987-11-10 | Matsushita Electric Industrial Co. Ltd. | Coin selection apparatus |
JPH0546127Y2 (en) * | 1986-12-29 | 1993-12-01 | ||
GB2199978A (en) * | 1987-01-16 | 1988-07-20 | Mars Inc | Coin validators |
US4951799A (en) * | 1988-02-10 | 1990-08-28 | Tamura Electric Works, Ltd. | Method of correcting coin data and apparatus for inspecting coins |
JPH0654509B2 (en) * | 1988-08-11 | 1994-07-20 | 株式会社日本コンラックス | Coin sorting accuracy setting device |
CH676162A5 (en) * | 1988-11-07 | 1990-12-14 | Ascom Autelca Ag | |
JPH0731324Y2 (en) * | 1989-04-21 | 1995-07-19 | サンデン株式会社 | Coin discriminator |
GB2238152B (en) | 1989-10-18 | 1994-07-27 | Mars Inc | Method and apparatus for validating coins |
US5404987A (en) * | 1989-10-18 | 1995-04-11 | Mars Incorporated | Method and apparatus for validating money |
US5167313A (en) * | 1990-10-10 | 1992-12-01 | Mars Incorporated | Method and apparatus for improved coin, bill and other currency acceptance and slug or counterfeit rejection |
GB2250621B (en) * | 1990-12-07 | 1995-04-19 | Mars Inc | Money validators |
US5353906A (en) * | 1991-02-28 | 1994-10-11 | Takamisawa Cybernetics Co. Ltd. | Metal body discriminating apparatus |
DE4121034C1 (en) * | 1991-06-26 | 1992-09-10 | National Rejectors Inc. Gmbh, 2150 Buxtehude, De | |
US5191957A (en) * | 1991-06-28 | 1993-03-09 | Protel, Inc. | Coin discrimination method |
GB9117849D0 (en) * | 1991-08-19 | 1991-10-09 | Coin Controls | Coin discrimination apparatus |
US5293979A (en) * | 1991-12-10 | 1994-03-15 | Coin Acceptors, Inc. | Coin detection and validation means |
GB2279796B (en) * | 1993-06-28 | 1996-09-25 | Mars Inc | Validating value carriers |
GB2284293B (en) * | 1993-11-30 | 1998-06-03 | Mars Inc | Article classifying method and apparatus |
GB9419912D0 (en) * | 1994-10-03 | 1994-11-16 | Coin Controls | Optical coin sensing station |
GB9507257D0 (en) * | 1995-04-07 | 1995-05-31 | Coin Controls | Coin validation apparatus and method |
GB2300746B (en) * | 1995-05-09 | 1999-04-07 | Mars Inc | Validation |
DE19524963A1 (en) * | 1995-07-08 | 1997-01-09 | Bosch Gmbh Robert | Switching power supply with B control |
JPH11509350A (en) | 1995-07-14 | 1999-08-17 | コイン コントロールズ リミテッド | Coin identification machine |
AU1696697A (en) * | 1996-01-11 | 1997-08-01 | Brandt Inc. | Coin sorter with coin recognition |
GB9601335D0 (en) | 1996-01-23 | 1996-03-27 | Coin Controls | Coin validator |
GB9611659D0 (en) | 1996-06-05 | 1996-08-07 | Coin Controls | Coin validator calibration |
WO1998005008A1 (en) * | 1996-07-29 | 1998-02-05 | Quadrum Telecommunications, Inc. | Coin validation apparatus |
GB2326964B (en) | 1998-03-23 | 1999-06-16 | Coin Controls | Coin changer |
GB2341263B (en) | 1998-08-14 | 2002-12-18 | Mars Inc | Method and apparatus for validating currency |
GB2345372B (en) | 1998-12-30 | 2003-04-16 | Mars Inc | Method and apparatus for validating coins |
GB2348729A (en) | 1999-04-07 | 2000-10-11 | Mars Inc | A money validator reprogrammable using externally recieved data |
US7381126B2 (en) | 2003-11-03 | 2008-06-03 | Coin Acceptors, Inc. | Coin payout device |
ITRM20080625A1 (en) * | 2008-11-25 | 2010-05-26 | Int Currency Tech | MACHINE FOR AUTOMATIC SALE WITH FUNCTION OF RECOGNITION OF THE USER IDENTITY. |
DE102009024872A1 (en) * | 2009-06-09 | 2010-12-16 | Beb Industrie-Elektronik Ag | A method for rejecting worn banknotes from a number of banknotes in banknote processing machines |
JP6842177B2 (en) * | 2018-04-06 | 2021-03-17 | 旭精工株式会社 | Coin identification method, coin identification system and coin identification program |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3956692A (en) * | 1974-12-23 | 1976-05-11 | Wein Products, Inc. | Metal object comparator utilizing a ramp having a V-shaped slot for mounting the object accurately within the test coil |
JPS5375998A (en) * | 1976-12-16 | 1978-07-05 | Sanyo Jido Hanbaiki Kk | Coin selecting device |
JPS5567607A (en) * | 1978-11-17 | 1980-05-21 | Hajime Sangyo Kk | Pattern discrimination method |
US4353453A (en) * | 1980-04-10 | 1982-10-12 | Atn Research & Development Corporation | Valid coin acceptor for coin actuated apparatus |
JPS5769480A (en) * | 1980-10-15 | 1982-04-28 | Omron Tateisi Electronics Co | Seal-impression collation system |
DE3103371A1 (en) * | 1981-01-27 | 1982-08-05 | Günter Wulff-Apparatebau GmbH, 1000 Berlin | Method for fixing the limit values for identifying coins which are good or bad |
EP0072189B1 (en) * | 1981-08-10 | 1986-12-30 | LANDIS & GYR COMMUNICATIONS (U.K.) LTD. | A method and apparatus for calibrating a coin validation apparatus |
US4416365A (en) * | 1981-08-21 | 1983-11-22 | Mars, Inc. | Coin examination apparatus employing an RL relaxation oscillator |
JPS5860390A (en) * | 1981-10-06 | 1983-04-09 | 三洋電機株式会社 | Selection of coin |
JPS5872290A (en) * | 1981-10-23 | 1983-04-30 | オムロン株式会社 | Discrimination system for paper money or the like |
JPS58214990A (en) * | 1982-06-09 | 1983-12-14 | 富士電機株式会社 | Discrimination system |
JPS5927383A (en) * | 1982-08-06 | 1984-02-13 | 株式会社ユニバ−サル | Selector for learning coin or the like |
-
1985
- 1985-02-19 ZA ZA851248A patent/ZA851248B/en unknown
- 1985-02-26 IE IE477/85A patent/IE56794B1/en not_active IP Right Cessation
- 1985-02-28 CA CA000475454A patent/CA1228921A/en not_active Expired
- 1985-02-28 MX MX204470A patent/MX160403A/en unknown
- 1985-02-28 GR GR850518A patent/GR850518B/el unknown
- 1985-03-01 ES ES540860A patent/ES8700886A1/en not_active Expired
- 1985-03-01 KR KR1019850700280A patent/KR930007271B1/en not_active IP Right Cessation
- 1985-03-01 JP JP60501328A patent/JPH0727585B2/en not_active Expired - Lifetime
- 1985-03-01 DE DE8585301409T patent/DE3581817D1/en not_active Expired - Lifetime
- 1985-03-01 AT AT85301409T patent/ATE61136T1/en not_active IP Right Cessation
- 1985-03-01 AU AU41102/85A patent/AU584330B2/en not_active Expired
- 1985-03-01 EP EP85301409A patent/EP0155126B2/en not_active Expired - Lifetime
- 1985-03-01 WO PCT/US1985/000369 patent/WO1985004037A1/en unknown
- 1985-03-01 BR BR8505538A patent/BR8505538A/en not_active IP Right Cessation
- 1985-10-31 DK DK502785A patent/DK502785A/en not_active Application Discontinuation
-
1991
- 1991-02-21 JP JP3027053A patent/JPH0785277B2/en not_active Expired - Lifetime
-
1996
- 1996-02-29 HK HK36396A patent/HK36396A/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
ES540860A0 (en) | 1986-11-16 |
JPH0727585B2 (en) | 1995-03-29 |
AU584330B2 (en) | 1989-05-25 |
WO1985004037A1 (en) | 1985-09-12 |
ZA851248B (en) | 1985-11-27 |
JPS61501349A (en) | 1986-07-03 |
JPH04211888A (en) | 1992-08-03 |
HK36396A (en) | 1996-03-08 |
EP0155126B1 (en) | 1991-02-27 |
KR930007271B1 (en) | 1993-08-04 |
AU4110285A (en) | 1985-09-24 |
ATE61136T1 (en) | 1991-03-15 |
ES8700886A1 (en) | 1986-11-16 |
DK502785A (en) | 1986-01-02 |
IE850477L (en) | 1985-09-01 |
BR8505538A (en) | 1986-02-18 |
JPH0785277B2 (en) | 1995-09-13 |
MX160403A (en) | 1990-02-16 |
CA1228921A (en) | 1987-11-03 |
IE56794B1 (en) | 1991-12-18 |
EP0155126A3 (en) | 1987-01-07 |
DK502785D0 (en) | 1985-10-31 |
KR850700280A (en) | 1985-12-26 |
GR850518B (en) | 1985-07-01 |
EP0155126A2 (en) | 1985-09-18 |
DE3581817D1 (en) | 1991-04-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0155126B2 (en) | Self tuning coin recognition system | |
EP0685826B1 (en) | Method and apparatus for improved coin, bill or other currency acceptance and slug or counterfeit rejection | |
EP0399694B1 (en) | Coin discrimination apparatus with compensation for external ambient conditions | |
US5984074A (en) | Method and apparatus for validating money | |
US5007520A (en) | Microprocessor-controlled apparatus adaptable to environmental changes | |
JP4226315B2 (en) | Calibration of money inspection machines | |
EP0146251B1 (en) | Coin validators | |
EP1012796B1 (en) | Method and apparatus for validating coins | |
EP0110510A2 (en) | Self-tuning low frequency phase shift coin examination method and apparatus | |
CA2194711C (en) | Method and apparatus for improved coin, bill and other currency acceptance and slug or counterfeit rejection | |
JPH05242332A (en) | Coin selecting device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Designated state(s): AT BE CH DE FR GB IT LI LU NL SE |
|
PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
|
AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): AT BE CH DE FR GB IT LI LU NL SE |
|
17P | Request for examination filed |
Effective date: 19870609 |
|
17Q | First examination report despatched |
Effective date: 19890822 |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): AT BE CH DE FR GB IT LI LU NL SE |
|
REF | Corresponds to: |
Ref document number: 61136 Country of ref document: AT Date of ref document: 19910315 Kind code of ref document: T |
|
ITF | It: translation for a ep patent filed |
Owner name: FUMERO BREVETTI S.N.C. |
|
REF | Corresponds to: |
Ref document number: 3581817 Country of ref document: DE Date of ref document: 19910404 |
|
ET | Fr: translation filed | ||
PLBI | Opposition filed |
Free format text: ORIGINAL CODE: 0009260 |
|
PLBI | Opposition filed |
Free format text: ORIGINAL CODE: 0009260 |
|
26 | Opposition filed |
Opponent name: LANDIS & GYR BETRIEBS AG Effective date: 19911112 |
|
26 | Opposition filed |
Opponent name: NATIONAL REJECTORS, INC. GMBH Effective date: 19911122 Opponent name: LANDIS & GYR BETRIEBS AG Effective date: 19911112 |
|
NLR1 | Nl: opposition has been filed with the epo |
Opponent name: LANDIS & GYR BETRIEBS AG |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: AT Payment date: 19920311 Year of fee payment: 8 |
|
NLR1 | Nl: opposition has been filed with the epo |
Opponent name: NATIONAL REJECTORS, INC. GMBH. |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: SE Payment date: 19920319 Year of fee payment: 8 Ref country code: LU Payment date: 19920319 Year of fee payment: 8 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: NL Payment date: 19920331 Year of fee payment: 8 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: BE Payment date: 19920512 Year of fee payment: 8 |
|
EPTA | Lu: last paid annual fee | ||
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: LU Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 19930301 Ref country code: AT Effective date: 19930301 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: SE Effective date: 19930302 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: BE Effective date: 19930331 |
|
BERE | Be: lapsed |
Owner name: MARS INC. Effective date: 19930331 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: NL Effective date: 19931001 |
|
NLV4 | Nl: lapsed or anulled due to non-payment of the annual fee | ||
EUG | Se: european patent has lapsed |
Ref document number: 85301409.0 Effective date: 19931008 |
|
PLAW | Interlocutory decision in opposition |
Free format text: ORIGINAL CODE: EPIDOS IDOP |
|
APAA | Appeal reference recorded |
Free format text: ORIGINAL CODE: EPIDOS REFN |
|
APAC | Appeal dossier modified |
Free format text: ORIGINAL CODE: EPIDOS NOAPO |
|
APAC | Appeal dossier modified |
Free format text: ORIGINAL CODE: EPIDOS NOAPO |
|
APAC | Appeal dossier modified |
Free format text: ORIGINAL CODE: EPIDOS NOAPO |
|
PLAW | Interlocutory decision in opposition |
Free format text: ORIGINAL CODE: EPIDOS IDOP |
|
RIC2 | Information provided on ipc code assigned after grant |
Free format text: 7G 07D 5/08 A |
|
PUAH | Patent maintained in amended form |
Free format text: ORIGINAL CODE: 0009272 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: PATENT MAINTAINED AS AMENDED |
|
27A | Patent maintained in amended form |
Effective date: 20010711 |
|
AK | Designated contracting states |
Kind code of ref document: B2 Designated state(s): AT BE CH DE FR GB IT LI LU NL SE |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: AEN Free format text: MAINTIEN DU BREVET DONT L'ETENDUE A ETE MODIFIEE |
|
ITF | It: translation for a ep patent filed |
Owner name: FUMERO BREVETTI S.N.C. |
|
ET3 | Fr: translation filed ** decision concerning opposition | ||
REG | Reference to a national code |
Ref country code: GB Ref legal event code: IF02 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 20030310 Year of fee payment: 19 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: GB Payment date: 20040225 Year of fee payment: 20 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: CH Payment date: 20040227 Year of fee payment: 20 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 20040311 Year of fee payment: 20 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20041130 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: LI Free format text: LAPSE BECAUSE OF EXPIRATION OF PROTECTION Effective date: 20050228 Ref country code: GB Free format text: LAPSE BECAUSE OF EXPIRATION OF PROTECTION Effective date: 20050228 Ref country code: CH Free format text: LAPSE BECAUSE OF EXPIRATION OF PROTECTION Effective date: 20050228 |
|
REG | Reference to a national code |
Ref country code: GB Ref legal event code: PE20 |
|
REG | Reference to a national code |
Ref country code: CH Ref legal event code: PL |
|
APAH | Appeal reference modified |
Free format text: ORIGINAL CODE: EPIDOSCREFNO |
|
PLAB | Opposition data, opponent's data or that of the opponent's representative modified |
Free format text: ORIGINAL CODE: 0009299OPPO |
|
PLAB | Opposition data, opponent's data or that of the opponent's representative modified |
Free format text: ORIGINAL CODE: 0009299OPPO |