EP0112334A4 - Rotating polarizer angle sensing system. - Google Patents

Rotating polarizer angle sensing system.

Info

Publication number
EP0112334A4
EP0112334A4 EP19820902840 EP82902840A EP0112334A4 EP 0112334 A4 EP0112334 A4 EP 0112334A4 EP 19820902840 EP19820902840 EP 19820902840 EP 82902840 A EP82902840 A EP 82902840A EP 0112334 A4 EP0112334 A4 EP 0112334A4
Authority
EP
European Patent Office
Prior art keywords
providing
responsive
light
signal
polarized light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP19820902840
Other languages
German (de)
French (fr)
Other versions
EP0112334A1 (en
Inventor
Larry Trumbull Clark
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Boeing Co
Original Assignee
Boeing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boeing Co filed Critical Boeing Co
Publication of EP0112334A1 publication Critical patent/EP0112334A1/en
Publication of EP0112334A4 publication Critical patent/EP0112334A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/168—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of polarisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light

Definitions

  • This invention relates to systems for measuring aeroelastic deformation of aircraft structure in flight or in wind tunnels and, more particularly, to a rotating polarizer angle sensor system for measuring aeroelastic deformation of an aircraft structure in flight or in a wind tunnel.
  • accelerometers have been utilized for measurement of aeroelastic deformation of aircraft structure in flight but have proved unsuitable because of sensitivity to acceleration as well as angle.
  • Other optical methods have been utilized in wind tunnel test ⁇ ing but, however, have been deficient in terms of accuracy of the systems.
  • Photogrammetric methods have also been utilized for flight testing, but have a] so been awkward to deploy and deficient in the measure of accuracy.
  • a preferred embodiment of the present invention utilizes the physical principle upon which linearly polarized light which passes through a linear polarizer relates the intensity of the transmitted light as a simple function' of the angle between the axis of polarization of the incoming light and the axis of the polarizer.
  • any effect which changes the intensity of the transmitted light would result in a change in the angle reading.
  • an incident beam of light in which the axis of polarization is a function of time is utilized wherein the phase angle between a reference signal and. a test signal as a measure of the angle between the axis of the reference polarizer and the axis of the test polarizer is utilized.
  • the present rotating polarizer angle sensor system embodiment while having remote angle measurement applicability in general, includes applica ⁇ tions wherein deformation and vibration of structures, such as in a tilt eter for geotechnical applications, are required, and wherein the operating range of the system is required to be from centimeters to e.g. kilometers.
  • FIGURE 1 is a schematic diagram utilized in explaining the principles of. operation of the present rotating polarizer angle sensor system embodiment
  • FIGURE 2 is a hardware system optical embodiment utilizing the principles shown in FIGURE 1;
  • CMPI FIGURE 2A is illustrative of an alternative light input arrangement which may be utilized in the system of FIGURE 2;
  • FIGURE 3 is a block diagram showing signal pro- cessing of reference and test signals from the optical system of FIGURE 2;
  • FIGURE 4 is a typical response curve for the rotating polarizer angle sensing system of FIGURES 2 and 3 over the angle range of from zero to 90° of the present system embodiment.
  • FIGURE 1 illustrative of the prin ⁇ ciples of operation of the present system in which an incident beam of light in which the axis of polarization is a function of time and in which the phase angle beween a reference signal and a test signal is utilized as a measure of the angle between the axis of the refer ⁇ ence ⁇ polarizer and the axis of the test polarizer, it can be seen that circularly polarized light 10 from a laser source (not shown) is passed through a rotating linear polarizer 20, thereby providing rotating linearly polarized light 30 with the axis of polarization rotat ⁇ ing at twice the speed of polarizer rotation.
  • Light beam 30 is divided downstream by beam splitter 40 into a reference beam and a test beam, each of which beams is coupled through linear polarizer elements 50 and 60 and, subsequently, collected by photo-detectors (not shown) which measure the time dependent intensity.
  • the phase difference between the two signals from the detectors (as processed by the system of FIGURES 2 and 3) is directy proportional to the difference between the polarization axes of the two polarizers.
  • FIGURES 2 and 3 A system embodiment of the present rotating polar-— izer angle sensor system is shown in FIGURES 2 and 3.
  • a light source 101 comprising a low power laser with a linearly polarized output beam is utilized.
  • the beam is coupled through a one-fourth wave retarda ⁇ tion plate 102 to generate the required circularly polarized light.
  • the beam is then coupled through a rotating linear polarizer system 104 which comprises a constant speed motor 103 driving a linear polarizer 100.
  • the frequency of rotation of the axis of polarization of the output beam from rotating linear polarizer 104 is twice that of constant speed motor 103.
  • downstream the beam is coupled through expansion lens 105 and then coupled through beam splitter 106 wherein the reference and test beams separation is provided.
  • Retro- reflector element 111 may comprise retro-reflective tape or e.g. a corner cube reflector depending upon system application.
  • the transmission beam striking target 700 is reflected back through linear polarizer 110 in the present system embodiment of FIGURE 2 to be collected by objective lens 109.
  • the collected beam is subsequently directed downstream by mirror element 106 through lens 112 and interference filter element 113 (set for the wavelengths of the laser light) and then is incident upon photo-detector 114.
  • Photo-detector 114 comprises a photo-voltaic cell for ranges up to thirty meters and may comprise a photo-multiplier tube for longer range applications.
  • Photo-voltaic detectors 108 and 114 are current sources and current to voltage converters 300 and 301, as seen in FIGURE 3, are utilized to condition reference signal 208 and test signal 209 further down ⁇ stream for analysis.
  • the gain of current to voltage converters 300 and 301 should be adjuste to yield a predetermined voltage e.g. typically two to five volts peak to peak.
  • the respective signals from current to voltage converter 300 and current to voltage conver- ter 301 are then A.C. coupled to fixed gain amplifiers 305 and 306, respectively, with the output therefrom being clipped fifteen volt signals which are then transmitted through respective phase locked loops 310 and 3.12 for providing additional noise rejection.
  • Voltage controlled oscillators 314 and 316 in the respective phase locked loops 310 and 312, are utilized for phase measurement with the respective signals from phase locked loops 310 and 312 being coupled to the input of exclusive OR gate 320, the output of exclusive OR gate 320 being provided with low pass filtering in 12 pole Butterworth type filter 321 to provide a voltage output from digital voltmeter 322 which is proportional to angle with a dynamic range equal to one-half the carrier frequency.
  • FIGURE 4 it can be seen in the graph showing E from the system ' of FIGURE 3 as a function of target angle that the angle range of the system of FIGURES 2 and 3 over 90° as provided ' , a typical response curve being shown in FIGURE 4.
  • Accuracy at 95 percent confidence at a range of four meters is .025°.
  • the present system in bright sun ⁇ light, has been shown to provide, at a range of thirty meters, a similar accuracy.
  • an input light source 402 using a high intensity lamp coupled through a lens, stop, and further lens may be utilized in place of laser 101 and one-fourth wave plate 102 in the system of FIGURE 2.

Abstract

A system for measuring aeroelastic deformation of an aircraft wing in flight or in a wind tunnel utilizing light from a linearly polarized light source (101). The light is transmitted through modulating elements (104, 105) to provide a carrier beam, and a small portion of the beam is reflected through a linear polarizer (107) into a photo-detector (108) for utilization as a reference electrical signal (208). The remainder of the beam is reflected back from a retro-reflector target (700) located on the wing into another photo-detector (114) to provide the target electrical signal (209). The two amplified electrical signals are compared in a phase detector (Fig. 3) for providing an angle measurement output signal EO.

Description

ROTATING POLARIZER ANGLE SENSING SYSTEM
This invention relates to systems for measuring aeroelastic deformation of aircraft structure in flight or in wind tunnels and, more particularly, to a rotating polarizer angle sensor system for measuring aeroelastic deformation of an aircraft structure in flight or in a wind tunnel.
Heretofore, accelerometers have been utilized for measurement of aeroelastic deformation of aircraft structure in flight but have proved unsuitable because of sensitivity to acceleration as well as angle. Other optical methods have been utilized in wind tunnel test¬ ing but, however, have been deficient in terms of accuracy of the systems. Photogrammetric methods have also been utilized for flight testing, but have a] so been awkward to deploy and deficient in the measure of accuracy.
Heretofore, the patent literature, including U.S. Patents 4,179,217 and 3,992,104, "have utilized polarized light type systems and phase detector arrangements for comparing different parameters including inclination angles.
In contrast to the systems in the patent literature and the aforementioned prior measurement techniques, a preferred embodiment of the present invention utilizes the physical principle upon which linearly polarized light which passes through a linear polarizer relates the intensity of the transmitted light as a simple function' of the angle between the axis of polarization of the incoming light and the axis of the polarizer. In a simple measurement of the intensity of the transmitted light providing an angle measurement, any effect which changes the intensity of the transmitted light (fog, smoke, refraction, etc.) would result in a change in the angle reading. As a consequence, the direct application of a system utilizing intensity would be difficult to deploy and, therefore, in accordance with the present preferred embodiment which avoids the aforementioned problem, an incident beam of light in which the axis of polarization is a function of time is utilized wherein the phase angle between a reference signal and. a test signal as a measure of the angle between the axis of the reference polarizer and the axis of the test polarizer is utilized. The present rotating polarizer angle sensor system embodiment, while having remote angle measurement applicability in general, includes applica¬ tions wherein deformation and vibration of structures, such as in a tilt eter for geotechnical applications, are required, and wherein the operating range of the system is required to be from centimeters to e.g. kilometers.
Other objects, features and advantages of the present invention will become apparent from the following description read on the accompanying drawings, wherein:
FIGURE 1 is a schematic diagram utilized in explaining the principles of. operation of the present rotating polarizer angle sensor system embodiment;
FIGURE 2 is a hardware system optical embodiment utilizing the principles shown in FIGURE 1;
CMPI FIGURE 2A is illustrative of an alternative light input arrangement which may be utilized in the system of FIGURE 2;
FIGURE 3 is a block diagram showing signal pro- cessing of reference and test signals from the optical system of FIGURE 2; and
FIGURE 4 is a typical response curve for the rotating polarizer angle sensing system of FIGURES 2 and 3 over the angle range of from zero to 90° of the present system embodiment.
Turning now to FIGURE 1, illustrative of the prin¬ ciples of operation of the present system in which an incident beam of light in which the axis of polarization is a function of time and in which the phase angle beween a reference signal and a test signal is utilized as a measure of the angle between the axis of the refer¬ ence <polarizer and the axis of the test polarizer, it can be seen that circularly polarized light 10 from a laser source (not shown) is passed through a rotating linear polarizer 20, thereby providing rotating linearly polarized light 30 with the axis of polarization rotat¬ ing at twice the speed of polarizer rotation. Light beam 30 is divided downstream by beam splitter 40 into a reference beam and a test beam, each of which beams is coupled through linear polarizer elements 50 and 60 and, subsequently, collected by photo-detectors (not shown) which measure the time dependent intensity. The phase difference between the two signals from the detectors (as processed by the system of FIGURES 2 and 3) is directy proportional to the difference between the polarization axes of the two polarizers.
A system embodiment of the present rotating polar-— izer angle sensor system is shown in FIGURES 2 and 3. In FIGURE 2, a light source 101 comprising a low power laser with a linearly polarized output beam is utilized. The beam is coupled through a one-fourth wave retarda¬ tion plate 102 to generate the required circularly polarized light. The beam is then coupled through a rotating linear polarizer system 104 which comprises a constant speed motor 103 driving a linear polarizer 100. The frequency of rotation of the axis of polarization of the output beam from rotating linear polarizer 104 is twice that of constant speed motor 103. Subsequently, downstream the beam is coupled through expansion lens 105 and then coupled through beam splitter 106 wherein the reference and test beams separation is provided. Approximately five percent of the light is reflected from the glass surface on the back of beam splitter 106 comprising a mirror, with the rest of the light passing through a small aperture in the front surface of the mirror where the mirror coating has been removed, there¬ by providing the test beam. The reference beam is coupled through linear polarizer element 107 to photo- detector element 108, thereby providing reference signal 208, representative of intensity variation. The test beam is collimated by objective lens 109 to form the transmission beam projected to target 700. Target 700 comprises linear polarizer surface 110 facing the trans¬ mission beam, which linear polarizer surface 110 is sandwiched to retro-reflector element 111. Retro- reflector element 111 may comprise retro-reflective tape or e.g. a corner cube reflector depending upon system application. The transmission beam striking target 700 is reflected back through linear polarizer 110 in the present system embodiment of FIGURE 2 to be collected by objective lens 109. The collected beam is subsequently directed downstream by mirror element 106 through lens 112 and interference filter element 113 (set for the wavelengths of the laser light) and then is incident upon photo-detector 114. Photo-detector 114 comprises a photo-voltaic cell for ranges up to thirty meters and may comprise a photo-multiplier tube for longer range applications. Photo-voltaic detectors 108 and 114 are current sources and current to voltage converters 300 and 301, as seen in FIGURE 3, are utilized to condition reference signal 208 and test signal 209 further down¬ stream for analysis.
It can be seen further in the signal processing portion of the preferred embodiment of this invention, as shown in FIGURE 3, that the gain of current to voltage converters 300 and 301 should be adjuste to yield a predetermined voltage e.g. typically two to five volts peak to peak. The respective signals from current to voltage converter 300 and current to voltage conver- ter 301 are then A.C. coupled to fixed gain amplifiers 305 and 306, respectively, with the output therefrom being clipped fifteen volt signals which are then transmitted through respective phase locked loops 310 and 3.12 for providing additional noise rejection. Voltage controlled oscillators 314 and 316, in the respective phase locked loops 310 and 312, are utilized for phase measurement with the respective signals from phase locked loops 310 and 312 being coupled to the input of exclusive OR gate 320, the output of exclusive OR gate 320 being provided with low pass filtering in 12 pole Butterworth type filter 321 to provide a voltage output from digital voltmeter 322 which is proportional to angle with a dynamic range equal to one-half the carrier frequency.
Turning to FIGURE 4, it can be seen in the graph showing E from the system' of FIGURE 3 as a function of target angle that the angle range of the system of FIGURES 2 and 3 over 90° as provided', a typical response curve being shown in FIGURE 4. Accuracy at 95 percent confidence at a range of four meters is .025°. In actual operation, the present system, in bright sun¬ light, has been shown to provide, at a range of thirty meters, a similar accuracy.
While a laser source input light source utilizing laser 101 and one-fourth wave plate 102 is shown in the system of FIGURE 2, in a non-laser source (incandescent) embodiment of the system of FIGURE 2A, an input light source 402 using a high intensity lamp coupled through a lens, stop, and further lens may be utilized in place of laser 101 and one-fourth wave plate 102 in the system of FIGURE 2.

Claims

What is claimed is:
1. A system for measuring aeroelastic deformation of an aircraft structure utilizing in combination:
light generating means including a linearly polarized light source;
light modulating means responsive to said linearly polarized light source for providing a carrier beam;
a linear polarizer responsive to said linearly polarized light source, said linear polarizer coupled- to a photo-detector for providing a refer¬ ence signal;
retro-reflector target means coupled down¬ stream from said light modulating means for .reflecting light into a photo-detector to provide a target signal; and,
means including a phase detector circuit for comparing said reference signal and said target signal to provide a further signal representative of angle measurement output.
2. A rotating polarizer angle sensing system comprising:
means for generating circularly polarized light;
CMPI a rotating linear polarizer responsive to said circularly polarized light for providing rotating linearly polarized light;
a beam splitter for dividing said rotating linearly polarized, light into first and second light beams;
a series coupled first linear polarizer and first photo-detector responsive to said first light beam for providing a first output signal;
a series coupled second linear polarizer and second photo-detector responsive to said second light beam for providing a second output signal; and,
phase difference comparator means responsive to said first and second output signals for pro- viding a signal representative of the difference between the polarization axes of said first and second linear polarizers.
3. A rotating polarizer angle sensor system comprising in combination:
means for generating circularly polarized light;
means, including a rotating linear polarizer, for providing rotating linearly polarized light;
means, including a beam splitter responsive to said rotating linearly, polarized light, for pro¬ viding a reference signal and a test signal; a series soupled first current to voltage converter, first A.C. coupled amplifier, and first phase locked loop responsive to said reference signal for providing a first output signal;
a series coupled second current to voltage converter, second A.C. coupled amplifier, and second phase locked loop responsive to said test signal for providing a second output signal; and,
a series coupled exclusive OR gate, 12 pole - filter, and digital voltmeter responsive to said first and second output signals for providing a voltage proportional to target angle.
QMP
EP19820902840 1982-06-30 1982-06-30 Rotating polarizer angle sensing system. Withdrawn EP0112334A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1982/000884 WO1984000209A1 (en) 1982-06-30 1982-06-30 Rotating polarizer angle sensing system

Publications (2)

Publication Number Publication Date
EP0112334A1 EP0112334A1 (en) 1984-07-04
EP0112334A4 true EP0112334A4 (en) 1984-11-23

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Family Applications (1)

Application Number Title Priority Date Filing Date
EP19820902840 Withdrawn EP0112334A4 (en) 1982-06-30 1982-06-30 Rotating polarizer angle sensing system.

Country Status (2)

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EP (1) EP0112334A4 (en)
WO (1) WO1984000209A1 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104748695B (en) * 2015-04-10 2017-06-30 清华大学 Based on large-section underground cavern's early deformation monitoring method that section is finely measured

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4129384A (en) * 1977-06-08 1978-12-12 Batelle Memorial Institute Optical extensometer

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Publication number Priority date Publication date Assignee Title
US3633212A (en) * 1970-10-15 1972-01-04 Guy F Cooper System for determining the orientation of an object by employing plane-polarized light
DE2241443A1 (en) * 1972-08-23 1974-03-07 Leitz Ernst Gmbh PROCESS FOR THE AUTOMATIC PHOTOELECTRIC CAPTURE OF LOCAL CHANGES IN OPTICALLY EFFECTIVE OBJECT STRUCTURES AND EQUIPMENT FOR ITS IMPLEMENTATION
JPS5246828B2 (en) * 1974-08-29 1977-11-28
SU522425A1 (en) * 1975-01-07 1976-07-25 Ленинградский Ордена Ленина Политехнический Институт Им.М.И.Калинина Photoelastic dynamometer
FR2365793A1 (en) * 1976-09-23 1978-04-21 France Etat ROTATING BIREFRINGENT ELLIPSOMETER IN ITS APPLICATION TO PHOTOELASTICIMETRY
FR2381300A1 (en) * 1977-02-21 1978-09-15 France Etat DYNAMIC PHOTO-ELASTICIMETER WITH ROTATING BIREFRINGENT
US4263810A (en) * 1978-03-08 1981-04-28 Chiu Hong Yee Angular deflection sensing apparatus for load, force, and other types of measurements

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4129384A (en) * 1977-06-08 1978-12-12 Batelle Memorial Institute Optical extensometer

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO8400209A1 *

Also Published As

Publication number Publication date
EP0112334A1 (en) 1984-07-04
WO1984000209A1 (en) 1984-01-19

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