EP0057505B1 - Verfahren und Vorrichtung zur Behandlung elektrisch leitender Materialien, dazu verwendete Lösungen und auf diese Weise erzeugte Produkte - Google Patents
Verfahren und Vorrichtung zur Behandlung elektrisch leitender Materialien, dazu verwendete Lösungen und auf diese Weise erzeugte Produkte Download PDFInfo
- Publication number
- EP0057505B1 EP0057505B1 EP82300139A EP82300139A EP0057505B1 EP 0057505 B1 EP0057505 B1 EP 0057505B1 EP 82300139 A EP82300139 A EP 82300139A EP 82300139 A EP82300139 A EP 82300139A EP 0057505 B1 EP0057505 B1 EP 0057505B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- solution
- matrix
- sem
- conductive element
- fusion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000000034 method Methods 0.000 title claims description 64
- 239000000243 solution Substances 0.000 claims description 69
- 239000011159 matrix material Substances 0.000 claims description 67
- 230000004927 fusion Effects 0.000 claims description 43
- 238000006243 chemical reaction Methods 0.000 claims description 23
- 239000000203 mixture Substances 0.000 claims description 20
- 239000007864 aqueous solution Substances 0.000 claims description 19
- 229910052751 metal Inorganic materials 0.000 claims description 19
- 239000002184 metal Substances 0.000 claims description 19
- CWYNVVGOOAEACU-UHFFFAOYSA-N Fe2+ Chemical compound [Fe+2] CWYNVVGOOAEACU-UHFFFAOYSA-N 0.000 claims description 18
- 239000000956 alloy Substances 0.000 claims description 9
- 229910045601 alloy Inorganic materials 0.000 claims description 9
- -1 ferrous metals Chemical class 0.000 claims description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 5
- 150000001875 compounds Chemical class 0.000 claims description 4
- 239000008139 complexing agent Substances 0.000 claims description 3
- 239000003960 organic solvent Substances 0.000 claims description 2
- 230000001737 promoting effect Effects 0.000 claims description 2
- 239000002904 solvent Substances 0.000 claims description 2
- 230000003019 stabilising effect Effects 0.000 claims 1
- 238000004453 electron probe microanalysis Methods 0.000 description 42
- 239000000523 sample Substances 0.000 description 32
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 27
- 229910052802 copper Inorganic materials 0.000 description 27
- 239000010949 copper Substances 0.000 description 27
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 25
- 229910052804 chromium Inorganic materials 0.000 description 25
- 239000011651 chromium Substances 0.000 description 25
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 24
- 229910000831 Steel Inorganic materials 0.000 description 21
- 239000010959 steel Substances 0.000 description 21
- 239000011135 tin Substances 0.000 description 20
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 18
- 229910052718 tin Inorganic materials 0.000 description 18
- 239000002131 composite material Substances 0.000 description 17
- 238000009472 formulation Methods 0.000 description 17
- 230000003287 optical effect Effects 0.000 description 17
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 16
- 229910052709 silver Inorganic materials 0.000 description 16
- 239000004332 silver Substances 0.000 description 16
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 15
- 238000000151 deposition Methods 0.000 description 15
- 230000008021 deposition Effects 0.000 description 15
- 229910052750 molybdenum Inorganic materials 0.000 description 15
- 239000011733 molybdenum Substances 0.000 description 15
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 13
- 229910052793 cadmium Inorganic materials 0.000 description 12
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 12
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 12
- 239000010931 gold Substances 0.000 description 12
- 229910052737 gold Inorganic materials 0.000 description 12
- 229910052759 nickel Inorganic materials 0.000 description 12
- 229910052721 tungsten Inorganic materials 0.000 description 12
- 239000010937 tungsten Substances 0.000 description 12
- 239000010410 layer Substances 0.000 description 11
- 239000000463 material Substances 0.000 description 11
- 229910052738 indium Inorganic materials 0.000 description 9
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 9
- 150000002500 ions Chemical class 0.000 description 9
- 239000000758 substrate Substances 0.000 description 9
- 229910017052 cobalt Inorganic materials 0.000 description 7
- 239000010941 cobalt Substances 0.000 description 7
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 7
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 239000007787 solid Substances 0.000 description 6
- 238000005260 corrosion Methods 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 5
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 239000003990 capacitor Substances 0.000 description 4
- 239000003795 chemical substances by application Substances 0.000 description 4
- 238000002149 energy-dispersive X-ray emission spectroscopy Methods 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000009713 electroplating Methods 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 3
- 230000001788 irregular Effects 0.000 description 3
- 238000005507 spraying Methods 0.000 description 3
- 238000011282 treatment Methods 0.000 description 3
- QGJOPFRUJISHPQ-UHFFFAOYSA-N Carbon disulfide Chemical compound S=C=S QGJOPFRUJISHPQ-UHFFFAOYSA-N 0.000 description 2
- 229920000742 Cotton Polymers 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
- 239000004677 Nylon Substances 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 238000007743 anodising Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000921 elemental analysis Methods 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 239000010439 graphite Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229920001778 nylon Polymers 0.000 description 2
- 230000035515 penetration Effects 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 239000012925 reference material Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 239000001117 sulphuric acid Substances 0.000 description 2
- 235000011149 sulphuric acid Nutrition 0.000 description 2
- 238000007738 vacuum evaporation Methods 0.000 description 2
- 244000215068 Acacia senegal Species 0.000 description 1
- 235000006491 Acacia senegal Nutrition 0.000 description 1
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 1
- 229920001353 Dextrin Polymers 0.000 description 1
- 239000004375 Dextrin Substances 0.000 description 1
- 241000196324 Embryophyta Species 0.000 description 1
- VTLYFUHAOXGGBS-UHFFFAOYSA-N Fe3+ Chemical compound [Fe+3] VTLYFUHAOXGGBS-UHFFFAOYSA-N 0.000 description 1
- 240000004670 Glycyrrhiza echinata Species 0.000 description 1
- 235000001453 Glycyrrhiza echinata Nutrition 0.000 description 1
- 235000006200 Glycyrrhiza glabra Nutrition 0.000 description 1
- 235000017382 Glycyrrhiza lepidota Nutrition 0.000 description 1
- 229920000084 Gum arabic Polymers 0.000 description 1
- 241001465754 Metazoa Species 0.000 description 1
- 102000057297 Pepsin A Human genes 0.000 description 1
- 108090000284 Pepsin A Proteins 0.000 description 1
- DBMJMQXJHONAFJ-UHFFFAOYSA-M Sodium laurylsulphate Chemical compound [Na+].CCCCCCCCCCCCOS([O-])(=O)=O DBMJMQXJHONAFJ-UHFFFAOYSA-M 0.000 description 1
- 239000004141 Sodium laurylsulphate Substances 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 235000010489 acacia gum Nutrition 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 239000000908 ammonium hydroxide Substances 0.000 description 1
- APUPEJJSWDHEBO-UHFFFAOYSA-P ammonium molybdate Chemical compound [NH4+].[NH4+].[O-][Mo]([O-])(=O)=O APUPEJJSWDHEBO-UHFFFAOYSA-P 0.000 description 1
- 229940010552 ammonium molybdate Drugs 0.000 description 1
- 235000018660 ammonium molybdate Nutrition 0.000 description 1
- 239000011609 ammonium molybdate Substances 0.000 description 1
- 239000002519 antifouling agent Substances 0.000 description 1
- SWXQKHHHCFXQJF-UHFFFAOYSA-N azane;hydrogen peroxide Chemical compound [NH4+].[O-]O SWXQKHHHCFXQJF-UHFFFAOYSA-N 0.000 description 1
- 244000309464 bull Species 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 238000005234 chemical deposition Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 235000019425 dextrin Nutrition 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 229910001447 ferric ion Inorganic materials 0.000 description 1
- 229910001448 ferrous ion Inorganic materials 0.000 description 1
- 238000007499 fusion processing Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 150000004679 hydroxides Chemical class 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 229940010454 licorice Drugs 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 150000001455 metallic ions Chemical class 0.000 description 1
- WSFSSNUMVMOOMR-NJFSPNSNSA-N methanone Chemical compound O=[14CH2] WSFSSNUMVMOOMR-NJFSPNSNSA-N 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229940111202 pepsin Drugs 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 238000012764 semi-quantitative analysis Methods 0.000 description 1
- FQENQNTWSFEDLI-UHFFFAOYSA-J sodium diphosphate Chemical compound [Na+].[Na+].[Na+].[Na+].[O-]P([O-])(=O)OP([O-])([O-])=O FQENQNTWSFEDLI-UHFFFAOYSA-J 0.000 description 1
- 235000019333 sodium laurylsulphate Nutrition 0.000 description 1
- 229940048086 sodium pyrophosphate Drugs 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- BDHFUVZGWQCTTF-UHFFFAOYSA-N sulfonic acid Chemical compound OS(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-N 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 235000019818 tetrasodium diphosphate Nutrition 0.000 description 1
- 239000001577 tetrasodium phosphonato phosphate Substances 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000004506 ultrasonic cleaning Methods 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
- 239000000080 wetting agent Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C20/00—Chemical coating by decomposition of either solid compounds or suspensions of the coating forming compounds, without leaving reaction products of surface material in the coating
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
- C25D17/10—Electrodes, e.g. composition, counter electrode
- C25D17/14—Electrodes, e.g. composition, counter electrode for pad-plating
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/18—Electroplating using modulated, pulsed or reversing current
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/605—Surface topography of the layers, e.g. rough, dendritic or nodular layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/623—Porosity of the layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/627—Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
Definitions
- the present invention relates to fusion processes, apparatus for carrying out such processes and the products of such processes, and solutions for use in the process.
- fusion is employed as meaning a process whereby diverse elements are chemically or physically bonded.
- the workpiece or matrix may be of a certain form which does not lend itself to the subjection of a particular characteristic-enhancing process; the process may be destructive of the already desirable characteristics of the work-piece; or the treated work-piece while having certain enhanced characteristics may exhibit other reduced characteristics.
- the process employed depends upon the work-piece or matrix to be treated and the characteristics desired.
- coating techniques heat treatment, anodizing, arc spraying, vacuum evaporation, chemical deposition, sputtering, and ion plating are all common processes.
- Non-ferrous metals may be hardened by aging, heat treatment or anodizing.
- Spray coating techniques have not improved corrosion resistance or the physical properties of ferrous materials.
- the other techniques arc-spraying, vacuum evaporation and sputtering have their shortcomings in that the coating deposited is usually thin, the interfacial bond strength is poor, or can only be used to treat small surface areas.
- first conductive element shall refer to the matrix with which fusion is to be accomplished; and the term element” shall refer to such an element or an alloy thereof; the term “second conductive element or an alloy thereof” shall refer to the element which is to be fused with the matrix.
- fusion means a penetration by the atoms or molecules of a second element within the solid matrix of a first element or alloy thereof.
- a process for the fusion at ambient temperature of about 20°C of at least one second conductive element comprising ferrous and non-ferrous metals or an alloy thereof, present in a dissociable form as part of a solution, into a matrix of a first conductive element comprising the steps of:
- the invention provides a process for fusing a wide variety of conductive elements in either ferrous and non-ferrous matrices.
- the process creates high bond strength without distortion or loss of work piece or matrix properties.
- the process does not require gas-air operation and does not involve safety hazards.
- the solution comprises .a process as claimed in Claim 1 characterized in that said solution comprises:
- FIG. 1 illustrated, in general perspective view, an apparatus in accordance with the invention in which one output of an oscillator 11, powered by a power supply 10, is connected to an electrode 19 through an insulated handle 20.
- the other output of oscillator 11 is connected, via line 16 and clamp 15, in the matrix or substrate 14 which is to be treated by the process of the invention.
- the electrode is positively charged and the matrix is negatively charged when the signal is applied.
- Electrode 19 is in the form of a plate incorporating a main channel 21 into which one side of the oscillator 11 output is led.
- Channel 21 has a series of side channels 22 which open onto the undersurface of electrode 19.
- the flow from reservoir 17 is by gravity or by a pump and may be controlled by a valve such as 23 on the handle 20.
- a permeable membrane such as cotton or nylon.
- the operator passes the electrode 19 in contact with the upper surface of the matrix over the matrix surface at a predetermined speed to apply the electrode material to the matrix and fuse it therewith.
- both the matrix and the material to be applied have specific resistance characteristics. Thus with each change in either one or both of these materials there is a change in the resistivity of the circuit.
- a signal having an amplitude of 3 amps is believed to be the preferred amplitude. If the amplitude is greater decarbonizing or burning of the matrix takes place and below this amplitude hydroxides are formed in the interface.
- Fig. 3 is a schematic diagram of an oscillator circuit used in apparatus in accordance with the present invention.
- a power supply 30 is connected across the input, and across the input a capacitor 31 is connected.
- One side of the capacitor 31 is connected through the LC circuit 32 which comprises a variable inductance coil 33 and capacitor 34 connected in parallel.
- LC circuit 32 is connected to one side of a crystal oscillator circuit comprising crystal 35, inductance 36, NPN transistor 37 and the RC circuit comprised of variable resistance 38 and capacitance 39.
- This oscillator circuit is connected to output 50 through, on one side capacitor 40, and on the other side diode 41, to produce a halfwave signal across output 50.
- resistance 38 is varied; to vary the frequency inductance 33 is varied.
- the travel speed may be determined by the following formula:
- resistances R, and R 2 may be measured by any known means.
- the matrix 14 metal was connected into the circuit as previously described.
- the frequency was determined in accordance with the formula previously set forth and the solution in reservoir 17 applied by movement of the electrode over one surface of the first metal for varying periods of time as determined by Form 11.
- the electrode was covered with cotton gauze or nylon. It will be apparent that other materials may be employed. This arrangement also served to limit contamination of the solution when graphite electrodes were employed. They had a tendency to release graphite particles in the course of movement.
- sample was etched using Nital for steel, the ferrous, substrate, and Ammonium Hydrogen Peroxide on the copper, the non-ferrous substrate.
- a semiquantitative electron probe microanalysis of fused interfaces were performed using an Energy Dispersive X-Ray Spectroscopy (EDX) and a Scanning Electron Microscope (SEM).
- EDX Energy Dispersive X-Ray Spectroscopy
- SEM Scanning Electron Microscope
- the surface of the embedding plastic was rendered conductive by evaporating on it approximately 20 ⁇ m layer of carbon in a vacuum evaporator. This procedure was used to prevent buildup of electrical charges on an otherwise nonconductive material and a consequent instability of the SEM image. Carbon, which does not produce a radiation detectable by the EDX, was used in preference to a more conventional metallic coating to avoid interference of such a coating with the elemental analysis.
- the second conductive element that is the element to be diffused into the matrix
- small quantities of metallic ions of a third metal are also provided.
- the presence of these metal ions is believed to be required as complex forming agents to facilitate fusion.
- Small quantities of organic catalysts such as gum acacia, hydroquinone, animal glue, pepsin, dextrin, licorice, or their equivalents may also be present.
- wetting agents such as sodium lauryl sulphate or its equivalent are usually provided.
- pH varying agents such as ammonium hydroxide or sulphuric acid are usually added to reach an operating pH.
- second conductive element complexing agents which preclude precipitation of the second element. These agents were by way of example citric acid, or sodium pyrophosphate, or ethyldiaminetetracetic acid or their equivalents.
- a suitable buffer is also provided in certain solutions, where required.
- the water is always demineralized.
- Atlas A151 1020 steel was connected in the apparatus of Fig. 1 as the matrix 14 and a 10% solution of ammonium molybdate in water was placed in reservoir 17.
- Example I The sample of Example I was subject to a thermal corrosion test. 25% sulphuric acid was applied to the surface for 20 minutes at 325°C without any surface penetration.
- the Mo +6 concentration may be varied from 1.5% to 2.5% by weight: the pH from 7.2 to 8.2 and the resistivity from 17-25 ohms cm.
- the photomicrograph Fig. 6 shows the deposition of a substantially uniform layer of molybdenum 1 micron thick of uniform density.
- an SEM/EPMA scan across the interface between the substrate and the applied metal shows molybdenum was present to a depth of at least 10 microns and a molybdenum gradient as set out below in Table.
- the solution had the following characteristics:
- the W +6 concentration may vary from 1.6% to 2.5%; the pH may vary from 7.5 to 8.5; and the resistivity may vary from 18 ohms cm to 24 ohms cm.
- the sample showed a uniform deposit of tungsten approximately 1 micron thick.
- An SEM/EPMA scan showed fusion of tungsten on copper to a depth of at least 5.0 microns, as can be seen in the Table below and Fig. 10.
- the solution had the following characteristics: The concentration of tungsten may be varied from 1.6% to 2.5% by wt.; the pH from 7.5 to 8.5; and the conductivity from 18.8 ohms cm to 22.8 ohms cm.
- the solution had the following characteristics: The Indium concentration may vary from 0.2% to 2.2%; the pH from 1.60 to 1.68; and the resistivity from 48.8 ohms cm to 54.8 ohms cm.
- Example VI The solution of Example VI was employed and applied to a steel matrix:
- Fig. 17 shows a solid deposit of nickel of uniform density approximately 1.5 ⁇ m thick. As shown in the following Table and Fig. 18 an SEM/EPMA scan across the interface between the matrix and the nickel layer shows nickel to be fused to a depth of at least 4 ⁇ m.
- the solution had the following characteristics: The nickel concentration may vary form 2% to 10%, pH from 3.10 to 3.50; and resistivity from 17 ohms cm to 26 ohms cm.
- Example VIII The same solution as was formulated for Example VIII was prepared and applied to a steel matrix:
- the nickel layer is continuous and substantially uniform in thickness being about 1.5 ⁇ m thick.
- nickel is shown to be fused to a depth of at least 3 um.
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 3.70 to 11; the concentration of Au +3 ions may vary from 0.1% to 0.5% by weight: and the resistivity from 40 ohms cm to 72 ohms cm.
- An SEM/EPMA scan across the interface indicated fusion of gold to a depth of at least 3 ⁇ m as shown on the Table below and Fig. 22.
- An SEM/EPMA scan across the interface indicated fusion of gold to a depth of at least 4.0 ⁇ m as shown on the table below and Fig. 24.
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 0.6 to 1.0; the concentration of Cr +6 ions may vary from 3% to 20% by weight; and the resistivity from 11 ohms cm to 14 ohms cm.
- An SEM/EPMA scan across the interface indicated fusion of chromium to a depth of at least 3.0 ⁇ m as shown on the table below and Fig. 26.
- An SEM/EPMA scan across the interface indicated fusion of chromium to a depth of at least 5.0 11 m as shown on the table below and Fig. 28.
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 2.5 to 3.5; the concentration of Cr +3 ions may vary from 1.8% to 5% by weight; and the resistivity from 16 ohms cm to 20 ohms cm.
- An SEM/EPMA scan across the interface indicated fusion of chromium to a depth of at least 3.0 ⁇ m as shown on the Table below and Fig. 30.
- An SEM/EPMA scan across the interface indicated fusion of chromium to a depth of at least 3.0 ⁇ m as shown on the table below and Fig. 32.
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 10 to 10.2; the concentration of Cd +2 ions may vary from 0.2% to 0.5% by weight; and the resistivity from 28 ohms cm to 35 ohms cm.
- Example XVII Example XVII
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 3.2 to 3.5; the concentration of Cd +2 ions may vary from 1 % to 4% by weight; and the resistivity from 45 ohms cm to 55 ohms cm.
- An SEM/EPMA scan across the interface indicated fusion of cadmium to a depth of at least 4 11 m as shown on the Table below and Fig. 36.
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 11.2 to 12.7; the concentration of Sn +2 ions may vary from 2% to 5% by weight; and the resistivity from 6.2 ohms cm to 10.3 ohms cm.
- An SEM/EPMA scan across the interface indicated fusion of tin to a depth of at least 4 ⁇ m as shown on the table below and Fig. 38.
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 9 to 9.7; the concentration of Sn +2 ions may vary from 0.4% to 1% by weight; and the resistivity from 30 ohms cm to 36 ohms cm.
- An SEM/EPMA scan across the interface indicated fusion of tin to a depth of at least 5 ⁇ m as shown on the Table below and Fig. 40.
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 4.5 to 6.5; the concentration of Co+2 ions may vary from 2% to 6% by weight; and the resistivity from 25 ohms cm to 30 ohms cm.
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 11.2 to 11.7; the concentration of Ag +1 ions may vary from 1% to 3% by weight; and the resistivity from 8 ohms cm to 13 ohms cm.
- An SEM/EPMA scan across the interface indicated fusion of silver to a depth of at least 3 ⁇ m as shown on the Table below and Fig. 46.
- aqueous solution of the following formulation was prepared: This solution had the following characteristics: The pH may be varied from 1.5 to 2; the concentration of Ag +1 ions may vary from 0.5% to 2.5% by weight; and the resistivity from 6 ohms cm to 12 ohms cm.
- An SEM/EPMA scan across the interface indicated fusion of silver to a depth of at least 2.00 11m as shown on the Table below and Fig. 48.
- tin, gold and silver with their inherent excellent conductivity characteristics may be employed in electrical applications and circuits may be fused on other substrates.
- the anti-corrosion characteristics of tin, gold, silver, nickel, chromium, cadmium, molybdenum and tungsten are also useful. And the application of those metals to ferrous or non-ferrous substrates will enhance their anti-corrosion behaviour.
- Chromium, nickel, silver, gold or tin have the capability of imparting an elegant appearance to the matrix. Chromium, molybdenum, tungsten, titanium and cobalt impart a surface hardness to the matrix.
- Indium imparts strength to the matrix, and also serves as anti-galling agent.
- a molybdenum treated ferrous or non-ferrous matrix has improved friction-wear and high temperature resistance characteristics. It is also useful as a dielectric coating.
- a cadmium fused matrix as well as having enhanced corrosion resistance characteristics can also serve as an anti-fouling agent for ship bull treatment.
- Silver fused matrices are all useful as a reflecting medium.
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- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Electrochemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
- Electroplating Methods And Accessories (AREA)
- Chemically Coating (AREA)
- Electroplating And Plating Baths Therefor (AREA)
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT82300139T ATE36014T1 (de) | 1981-01-13 | 1982-01-12 | Verfahren und vorrichtung zur behandlung elektrisch leitender materialien, dazu verwendete loesungen und auf diese weise erzeugte produkte. |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US22476281A | 1981-01-13 | 1981-01-13 | |
US31967281A | 1981-11-09 | 1981-11-09 | |
US224762 | 1994-04-08 | ||
US319672 | 1994-10-12 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0057505A2 EP0057505A2 (de) | 1982-08-11 |
EP0057505A3 EP0057505A3 (en) | 1982-09-22 |
EP0057505B1 true EP0057505B1 (de) | 1988-07-27 |
Family
ID=26918998
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP82300139A Expired EP0057505B1 (de) | 1981-01-13 | 1982-01-12 | Verfahren und Vorrichtung zur Behandlung elektrisch leitender Materialien, dazu verwendete Lösungen und auf diese Weise erzeugte Produkte |
Country Status (14)
Country | Link |
---|---|
EP (1) | EP0057505B1 (de) |
KR (1) | KR830009257A (de) |
AU (1) | AU7944882A (de) |
BR (1) | BR8200154A (de) |
CA (1) | CA1187035A (de) |
DD (1) | DD202312A5 (de) |
DE (1) | DE3278814D1 (de) |
DK (1) | DK11082A (de) |
FI (1) | FI820063L (de) |
GR (1) | GR75834B (de) |
IL (1) | IL64706A0 (de) |
NO (1) | NO820075L (de) |
PL (1) | PL234879A1 (de) |
PT (1) | PT74270B (de) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3802854A (en) * | 1973-03-19 | 1974-04-09 | Akad Wissenschaften Ddr | Process for forming magnetic metal deposits on a flexible base for use as information data carrier product thereof |
-
1982
- 1982-01-04 IL IL64706A patent/IL64706A0/xx unknown
- 1982-01-08 FI FI820063A patent/FI820063L/fi not_active Application Discontinuation
- 1982-01-11 CA CA000393920A patent/CA1187035A/en not_active Expired
- 1982-01-12 NO NO820075A patent/NO820075L/no unknown
- 1982-01-12 EP EP82300139A patent/EP0057505B1/de not_active Expired
- 1982-01-12 GR GR66993A patent/GR75834B/el unknown
- 1982-01-12 PT PT74270A patent/PT74270B/pt unknown
- 1982-01-12 DE DE8282300139T patent/DE3278814D1/de not_active Expired
- 1982-01-12 AU AU79448/82A patent/AU7944882A/en not_active Abandoned
- 1982-01-13 DD DD82236711A patent/DD202312A5/de unknown
- 1982-01-13 BR BR8200154A patent/BR8200154A/pt unknown
- 1982-01-13 KR KR1019820000119A patent/KR830009257A/ko unknown
- 1982-01-13 DK DK11082A patent/DK11082A/da not_active Application Discontinuation
- 1982-01-29 PL PL23487982A patent/PL234879A1/xx unknown
Non-Patent Citations (1)
Title |
---|
A. GUY: Metallkunde für Ingenieure, Akad. Verlagsgem. Ffm. (1970), p.355 * |
Also Published As
Publication number | Publication date |
---|---|
PL234879A1 (en) | 1983-05-09 |
CA1187035A (en) | 1985-05-14 |
EP0057505A3 (en) | 1982-09-22 |
AU7944882A (en) | 1982-07-22 |
FI820063L (fi) | 1982-07-14 |
NO820075L (no) | 1982-07-14 |
EP0057505A2 (de) | 1982-08-11 |
BR8200154A (pt) | 1982-11-03 |
PT74270B (en) | 1986-01-10 |
PT74270A (en) | 1982-02-01 |
IL64706A0 (en) | 1982-03-31 |
KR830009257A (ko) | 1983-12-19 |
GR75834B (de) | 1984-08-02 |
DD202312A5 (de) | 1983-09-07 |
DE3278814D1 (en) | 1988-09-01 |
DK11082A (da) | 1982-07-14 |
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