EE05164B1 - Calibration method for surface thickness standards - Google Patents

Calibration method for surface thickness standards

Info

Publication number
EE05164B1
EE05164B1 EEP200600042A EEP200600042A EE05164B1 EE 05164 B1 EE05164 B1 EE 05164B1 EE P200600042 A EEP200600042 A EE P200600042A EE P200600042 A EEP200600042 A EE P200600042A EE 05164 B1 EE05164 B1 EE 05164B1
Authority
EE
Estonia
Prior art keywords
calibration method
surface thickness
thickness standards
standards
calibration
Prior art date
Application number
EEP200600042A
Other languages
Estonian (et)
Inventor
Laaneots Rein
Abiline Indrek
Nanits Mats-Maidu
Riim Jürgen
Original Assignee
Tallinna Tehnikaülikool
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tallinna Tehnikaülikool filed Critical Tallinna Tehnikaülikool
Priority to EEP200600042A priority Critical patent/EE05164B1/en
Priority to DE102007062966A priority patent/DE102007062966A1/en
Publication of EE200600042A publication Critical patent/EE200600042A/en
Publication of EE05164B1 publication Critical patent/EE05164B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
EEP200600042A 2006-12-22 2006-12-22 Calibration method for surface thickness standards EE05164B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EEP200600042A EE05164B1 (en) 2006-12-22 2006-12-22 Calibration method for surface thickness standards
DE102007062966A DE102007062966A1 (en) 2006-12-22 2007-12-21 Method for calibrating normal coating thickness, involves measuring topography of part of substrate without coating and coated part of surface of normal coating thickness

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EEP200600042A EE05164B1 (en) 2006-12-22 2006-12-22 Calibration method for surface thickness standards

Publications (2)

Publication Number Publication Date
EE200600042A EE200600042A (en) 2008-08-15
EE05164B1 true EE05164B1 (en) 2009-04-15

Family

ID=39432117

Family Applications (1)

Application Number Title Priority Date Filing Date
EEP200600042A EE05164B1 (en) 2006-12-22 2006-12-22 Calibration method for surface thickness standards

Country Status (2)

Country Link
DE (1) DE102007062966A1 (en)
EE (1) EE05164B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102010020116A1 (en) * 2010-05-10 2011-11-10 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Method and device for measuring the thickness of thin layers on large-area measuring surfaces

Also Published As

Publication number Publication date
DE102007062966A1 (en) 2008-06-26
EE200600042A (en) 2008-08-15

Similar Documents

Publication Publication Date Title
DK2047098T3 (en) calibration process
PL2620214T3 (en) Method for manufacturing isobutene
EP2074445A4 (en) Method for manufacturing adjustable lens
CR10831A (en) ESPIRO KETONA ACETIL-CoA CARBOXILASA INHIBITORS
GB2461588B (en) Surface characteristic determining apparatus
SE0701325L (en) Method
GB2442851B (en) Stress component measurement method
DE602007007219D1 (en) SELEMENTS FOR TIME MEASUREMENT
GB0624462D0 (en) Method for determining gentoxicity
FI20065363A0 (en) Difference method
BRPI0816914A2 (en) Elevation Compensation Method
FI20060178A0 (en) coating method
GB0610148D0 (en) Glazing inspection method
GB2442852B (en) Stress measurement method
EP2306771A4 (en) Method for measuring adjacent areas
EP2039801A4 (en) Method for forming thin film
BRPI0810416A2 (en) HYDROFORMATION METHOD
EP2085764A4 (en) Method for determining agglutination
DK1826164T3 (en) layer press
EP2003447A4 (en) Method for measuring protein
EP2116611A4 (en) Measurement method for hba1c
EP2180643A4 (en) Inspection method
EE200600042A (en) Calibration method for surface thickness standards
FR2905881B1 (en) DESAMIANTING METHOD
FI20061136A0 (en) screening method

Legal Events

Date Code Title Description
KB4A Valid patent at the end of a year

Effective date: 20101231

MM4A Lapsed by not paying the annual fees

Effective date: 20131222