DK2095068T3 - Indretning og fremgangsmåde til forøgelse af målenøjagtigheden af digitale 3D-geometrimålesystemer - Google Patents

Indretning og fremgangsmåde til forøgelse af målenøjagtigheden af digitale 3D-geometrimålesystemer

Info

Publication number
DK2095068T3
DK2095068T3 DK07856647.8T DK07856647T DK2095068T3 DK 2095068 T3 DK2095068 T3 DK 2095068T3 DK 07856647 T DK07856647 T DK 07856647T DK 2095068 T3 DK2095068 T3 DK 2095068T3
Authority
DK
Denmark
Prior art keywords
digital
increasing
measurement
geometry
measurement accuracy
Prior art date
Application number
DK07856647.8T
Other languages
English (en)
Inventor
Guenther Kostka
Peter Schmitt
Original Assignee
Fraunhofer Ges Forschung
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Ges Forschung filed Critical Fraunhofer Ges Forschung
Application granted granted Critical
Publication of DK2095068T3 publication Critical patent/DK2095068T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DK07856647.8T 2006-12-15 2007-12-12 Indretning og fremgangsmåde til forøgelse af målenøjagtigheden af digitale 3D-geometrimålesystemer DK2095068T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102006059416A DE102006059416B4 (de) 2006-12-15 2006-12-15 Vorrichtung und Verfahren zur Steigerung der Messgenauigkeit digitaler 3D-Geometriemesssysteme
PCT/EP2007/010900 WO2008071414A1 (de) 2006-12-15 2007-12-12 Vorrichtung und verfahren zur steigerung der mess-genauigkeit digitaler 3d-geometriemessysteme

Publications (1)

Publication Number Publication Date
DK2095068T3 true DK2095068T3 (da) 2013-05-06

Family

ID=39148281

Family Applications (1)

Application Number Title Priority Date Filing Date
DK07856647.8T DK2095068T3 (da) 2006-12-15 2007-12-12 Indretning og fremgangsmåde til forøgelse af målenøjagtigheden af digitale 3D-geometrimålesystemer

Country Status (5)

Country Link
US (1) US8218153B2 (da)
EP (1) EP2095068B1 (da)
DE (1) DE102006059416B4 (da)
DK (1) DK2095068T3 (da)
WO (1) WO2008071414A1 (da)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101282687B (zh) 2005-10-14 2011-11-16 应用研究联盟新西兰有限公司 监测表面特征的方法和装置
CA2788753C (en) * 2010-02-08 2016-01-26 Fpinnovations Measurement of the surface shape map of flat and curved objects, independent of relative motions
US8704890B2 (en) * 2010-08-19 2014-04-22 Olympus Corporation Inspection apparatus and measuring method
JP4821934B1 (ja) * 2011-04-14 2011-11-24 株式会社安川電機 ３次元形状計測装置およびロボットシステム
JP5443435B2 (ja) * 2011-05-17 2014-03-19 シャープ株式会社 タイヤの欠陥検出方法
US9182221B2 (en) * 2011-06-13 2015-11-10 Canon Kabushiki Kaisha Information processing apparatus and information processing method
US9179844B2 (en) 2011-11-28 2015-11-10 Aranz Healthcare Limited Handheld skin measuring or monitoring device
EP2865988B1 (de) * 2013-10-22 2018-09-19 Baumer Electric Ag Lichtschnittsensor
DE102014220149A1 (de) 2014-10-06 2016-05-25 Continental Reifen Deutschland Gmbh Verfahren zum Anpassen der Länge von Materialbahnen
US10013527B2 (en) 2016-05-02 2018-07-03 Aranz Healthcare Limited Automatically assessing an anatomical surface feature and securely managing information related to the same
US11116407B2 (en) 2016-11-17 2021-09-14 Aranz Healthcare Limited Anatomical surface assessment methods, devices and systems
WO2018185560A2 (en) 2017-04-04 2018-10-11 Aranz Healthcare Limited Anatomical surface assessment methods, devices and systems
CA3075415A1 (en) * 2017-09-18 2019-03-21 Apollo Medical Optics, Ltd. Interference imaging device and its application

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04117578A (ja) * 1990-06-13 1992-04-17 Yaskawa Electric Corp ライン検出方法
US5248876A (en) * 1992-04-21 1993-09-28 International Business Machines Corporation Tandem linear scanning confocal imaging system with focal volumes at different heights
DE19721688B4 (de) * 1997-03-06 2012-12-27 Institut Straumann Ag Oberflächenerfassungseinrichtung und Verfahren zur Oberflächenerfassung
US6449048B1 (en) * 2000-05-11 2002-09-10 Veeco Instruments, Inc. Lateral-scanning interferometer with tilted optical axis
US6992290B2 (en) * 2001-01-10 2006-01-31 Ebara Corporation Electron beam inspection system and inspection method and method of manufacturing devices using the system
JP3892838B2 (ja) * 2003-10-16 2007-03-14 ファナック株式会社 ３次元測定装置
CA2573077A1 (en) * 2004-07-16 2006-01-26 Dofasco Inc. Flatness monitor

Also Published As

Publication number Publication date
DE102006059416A1 (de) 2008-06-26
EP2095068A1 (de) 2009-09-02
WO2008071414A1 (de) 2008-06-19
DE102006059416B4 (de) 2009-05-20
US20100085577A1 (en) 2010-04-08
US8218153B2 (en) 2012-07-10
EP2095068B1 (de) 2013-01-23

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