DK1250577T3 - Analysestystem til fordelt spændingsbölge - Google Patents

Analysestystem til fordelt spændingsbölge

Info

Publication number
DK1250577T3
DK1250577T3 DK00984426T DK00984426T DK1250577T3 DK 1250577 T3 DK1250577 T3 DK 1250577T3 DK 00984426 T DK00984426 T DK 00984426T DK 00984426 T DK00984426 T DK 00984426T DK 1250577 T3 DK1250577 T3 DK 1250577T3
Authority
DK
Denmark
Prior art keywords
stress wave
processed
analysis system
distributed
voltage waves
Prior art date
Application number
DK00984426T
Other languages
Danish (da)
English (en)
Inventor
Sylvia Andrews
David B Board
Craig Hughes
Michael Caulfield
Original Assignee
Curtiss Wright Flow Control
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Curtiss Wright Flow Control filed Critical Curtiss Wright Flow Control
Application granted granted Critical
Publication of DK1250577T3 publication Critical patent/DK1250577T3/da

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M13/00—Testing of machine parts
    • G01M13/02—Gearings; Transmission mechanisms
    • G01M13/028—Acoustic or vibration analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/14—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object using acoustic emission techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4463—Signal correction, e.g. distance amplitude correction [DAC], distance gain size [DGS], noise filtering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4481—Neural networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/52—Processing the detected response signal, e.g. electronic circuits specially adapted therefor using inversion methods other that spectral analysis, e.g. conjugated gradient inversion
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • G05B23/0281—Quantitative, e.g. mathematical distance; Clustering; Neural networks; Statistical analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/015—Attenuation, scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/10—Number of transducers
    • G01N2291/106—Number of transducers one or more transducer arrays

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Artificial Intelligence (AREA)
  • Acoustics & Sound (AREA)
  • Evolutionary Computation (AREA)
  • Automation & Control Theory (AREA)
  • Mathematical Physics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Analysis (AREA)
  • Algebra (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Supply And Distribution Of Alternating Current (AREA)
  • Chemical And Physical Treatments For Wood And The Like (AREA)
  • Control Of Eletrric Generators (AREA)
  • Emergency Protection Circuit Devices (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
DK00984426T 1999-12-15 2000-12-15 Analysestystem til fordelt spændingsbölge DK1250577T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/464,018 US6351713B1 (en) 1999-12-15 1999-12-15 Distributed stress wave analysis system
PCT/US2000/034029 WO2001044769A1 (fr) 1999-12-15 2000-12-15 Systeme reparti d'analyse d'onde de contraintes

Publications (1)

Publication Number Publication Date
DK1250577T3 true DK1250577T3 (da) 2009-12-07

Family

ID=23842191

Family Applications (1)

Application Number Title Priority Date Filing Date
DK00984426T DK1250577T3 (da) 1999-12-15 2000-12-15 Analysestystem til fordelt spændingsbölge

Country Status (7)

Country Link
US (1) US6351713B1 (fr)
EP (1) EP1250577B1 (fr)
AT (1) ATE445831T1 (fr)
DE (1) DE60043159D1 (fr)
DK (1) DK1250577T3 (fr)
ES (1) ES2333402T3 (fr)
WO (1) WO2001044769A1 (fr)

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CN112144321A (zh) * 2020-09-18 2020-12-29 同济大学 一种用于无砟轨道板裂缝的无损监测方法

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US8223013B2 (en) * 2006-12-28 2012-07-17 Intel-Ge Care Innovations Llc Method and mechanism for assisted diagnosis and maintenance of health monitoring system
US8294572B2 (en) 2006-12-28 2012-10-23 Intel-Ge Care Innovations Llc Method and mechanism for assisted diagnosis and maintenance of health monitoring system
US7398184B1 (en) * 2007-04-09 2008-07-08 Honeywell International Inc. Analyzing equipment performance and optimizing operating costs
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ES2656404T3 (es) 2008-12-22 2018-02-27 Spm Instrument Ab Sistema de análisis
WO2010074643A1 (fr) 2008-12-22 2010-07-01 S.P.M. Instrument Ab Systeme d'analyse
EP2373971B1 (fr) 2008-12-22 2022-01-26 S.P.M. Instrument AB Système d'analyse
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Publication number Priority date Publication date Assignee Title
CN112144321A (zh) * 2020-09-18 2020-12-29 同济大学 一种用于无砟轨道板裂缝的无损监测方法

Also Published As

Publication number Publication date
DE60043159D1 (de) 2009-11-26
ATE445831T1 (de) 2009-10-15
US6351713B1 (en) 2002-02-26
EP1250577A1 (fr) 2002-10-23
WO2001044769A1 (fr) 2001-06-21
ES2333402T3 (es) 2010-02-22
EP1250577A4 (fr) 2006-05-10
EP1250577B1 (fr) 2009-10-14

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