DK0938682T3 - Anordning til måling af impedans af impedans af en resonant struktur - Google Patents

Anordning til måling af impedans af impedans af en resonant struktur

Info

Publication number
DK0938682T3
DK0938682T3 DK97945933T DK97945933T DK0938682T3 DK 0938682 T3 DK0938682 T3 DK 0938682T3 DK 97945933 T DK97945933 T DK 97945933T DK 97945933 T DK97945933 T DK 97945933T DK 0938682 T3 DK0938682 T3 DK 0938682T3
Authority
DK
Denmark
Prior art keywords
resonant structure
impedance
source
measuring
physical quantity
Prior art date
Application number
DK97945933T
Other languages
English (en)
Inventor
Anthony Lonsdale
Bryan Lonsdale
Original Assignee
Anthony Lonsdale
Bryan Lonsdale
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anthony Lonsdale, Bryan Lonsdale filed Critical Anthony Lonsdale
Application granted granted Critical
Publication of DK0938682T3 publication Critical patent/DK0938682T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S73/00—Measuring and testing
    • Y10S73/04—Piezoelectric

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
DK97945933T 1996-11-13 1997-11-13 Anordning til måling af impedans af impedans af en resonant struktur DK0938682T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AUPO3589A AUPO358996A0 (en) 1996-11-13 1996-11-13 Apparatus for measuring impedance of a resonant structure
PCT/GB1997/003027 WO1998021598A1 (en) 1996-11-13 1997-11-13 Apparatus for measuring impedance of a resonant structure

Publications (1)

Publication Number Publication Date
DK0938682T3 true DK0938682T3 (da) 2002-11-04

Family

ID=3797900

Family Applications (1)

Application Number Title Priority Date Filing Date
DK97945933T DK0938682T3 (da) 1996-11-13 1997-11-13 Anordning til måling af impedans af impedans af en resonant struktur

Country Status (14)

Country Link
US (1) US6237417B1 (da)
EP (1) EP0938682B1 (da)
JP (1) JP3883211B2 (da)
KR (1) KR100532355B1 (da)
CN (1) CN1204406C (da)
AT (1) ATE220461T1 (da)
AU (1) AUPO358996A0 (da)
BR (1) BR9715005A (da)
CA (1) CA2272079A1 (da)
DE (1) DE69713897T2 (da)
DK (1) DK0938682T3 (da)
ES (1) ES2180067T3 (da)
PT (1) PT938682E (da)
WO (1) WO1998021598A1 (da)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100385072B1 (ko) * 2000-12-21 2003-05-22 삼성전기주식회사 다기능 액츄에이터용 공진주파수 검출시스템
US6854322B2 (en) * 2002-06-10 2005-02-15 The Procter & Gamble Company Directional coupler sensor
DE10239303B4 (de) * 2002-08-27 2006-08-03 Siemens Ag Energieautark modulierter Backscatter-Transponder
MXPA06012441A (es) * 2004-04-26 2007-01-17 Procter & Gamble Metodos para evaluar las caracteristicas de sustratos fibrosos y para tratar esos sustratos fibrosos.
GB0509113D0 (en) * 2005-05-04 2005-06-08 Sensor Technology Ltd Measuring physical quantities resonant structures
CN101484797A (zh) * 2006-06-30 2009-07-15 宝洁公司 用于测量微带定向耦合器的覆盖层（例如毛发）中的水分的装置
EP1923674A1 (en) * 2006-11-14 2008-05-21 Infineon Technologies SensoNor AS Backscatter sensor
US7855564B2 (en) * 2008-02-14 2010-12-21 Delaware Capital Formation, Inc. Acoustic wave device physical parameter sensor
US8150314B2 (en) * 2008-12-09 2012-04-03 Keng Kuei Su Remote antijamming transmission device and method for the same
US8085156B2 (en) * 2009-04-08 2011-12-27 Rosemount Inc. RF cavity-based process fluid sensor
KR101143645B1 (ko) * 2009-07-29 2012-05-09 주세은 경두개 저강도 초음파 전달장치 및 이를 이용한 비침습적 뇌기능 조절방법
CN101957403B (zh) * 2010-09-10 2012-08-15 浙江大学 石英晶体振荡器激励的非接触电导测量装置和方法
US8409875B2 (en) 2010-10-20 2013-04-02 Rapid Diagnostek, Inc. Measurement of binding kinetics with a resonating sensor
US9506953B2 (en) * 2012-01-18 2016-11-29 Ut-Battelle, Llc High speed high dynamic range high accuracy measurement system
WO2014190240A1 (en) 2013-05-23 2014-11-27 Rapid Diagnostek Interconnect device and module using same
US10451618B2 (en) 2013-05-23 2019-10-22 Qorvo Us, Inc. Resonator sensor module system and method
US9274075B2 (en) * 2014-01-30 2016-03-01 Mitsubishi Electric Research Laboratories, Inc. Proximity sensor detecting metallic and non-metallic objects
JP6614786B2 (ja) 2015-04-01 2019-12-04 キヤノン株式会社 共振器
NO338884B1 (en) * 2015-06-15 2016-10-31 Roxar Flow Measurement As Fluid measuring system
CN107983666A (zh) * 2017-11-22 2018-05-04 铜陵日兴电子有限公司 一种基于多次检测的石英谐振器合格筛选装置
WO2019198162A1 (ja) * 2018-04-10 2019-10-17 日本たばこ産業株式会社 霧化ユニット
US11573205B2 (en) * 2019-04-12 2023-02-07 Awe Technologies Llc Multimodal characterization of a fluid using a single droplet

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3031615A (en) * 1959-11-18 1962-04-24 Walter M Chase Direct voltage standing wave ratio measurement
US4524620A (en) * 1983-02-07 1985-06-25 Hughes Helicopters, Inc. In-flight monitoring of composite structural components such as helicopter rotor blades
GB2143326B (en) * 1983-07-14 1986-08-13 Standard Telephones Cables Ltd Surface acoustic wave accelerometer
US4668909A (en) * 1984-05-04 1987-05-26 The United States Of America As Represented By The Secretary Of The Air Force Piezoelectric material testing method and apparatus
US4691714A (en) * 1984-10-15 1987-09-08 Adamtek Corporation Rheological testing apparatus and method
US4932255A (en) * 1988-12-16 1990-06-12 Johnson Service Company Flow sensing using surface acoustic waves

Also Published As

Publication number Publication date
EP0938682A1 (en) 1999-09-01
US6237417B1 (en) 2001-05-29
CN1204406C (zh) 2005-06-01
PT938682E (pt) 2002-11-29
CA2272079A1 (en) 1998-05-22
ATE220461T1 (de) 2002-07-15
KR20000053214A (ko) 2000-08-25
JP3883211B2 (ja) 2007-02-21
JP2001504223A (ja) 2001-03-27
WO1998021598A1 (en) 1998-05-22
BR9715005A (pt) 2002-03-05
ES2180067T3 (es) 2003-02-01
KR100532355B1 (ko) 2005-12-02
EP0938682B1 (en) 2002-07-10
AUPO358996A0 (en) 1996-12-05
DE69713897D1 (de) 2002-08-14
DE69713897T2 (de) 2003-03-13
CN1244922A (zh) 2000-02-16

Similar Documents

Publication Publication Date Title
DK0938682T3 (da) Anordning til måling af impedans af impedans af en resonant struktur
US6606904B2 (en) Filling level gage
AU7062798A (en) Assessing the composition of liquids
KR890012409A (ko) 휴대용 무선기 및 안테나 시스템
US20090278552A1 (en) Method and Measuring Device for Radio Wave Measuring
DE69715651D1 (de) Einrichtung zum nachführen einer resonanzfrequenz
ATE364169T1 (de) Gerät zur kapazitiven elektrischen detektion
JPS55161403A (en) High frequency oscillating circuit
AU1405102A (en) System for testing an electric high frequency signal and level measuring device provided with said system
KR850002387A (ko) 피부등의 수분측정장치
EP0921404A3 (en) High frequency characteristics measurement method for dielectric materials and high frequency circuit design method
EP0207860A3 (en) Method and device for the rapid reflectometric testing of passive components in the vhf range
KR940006061A (ko) 부정 카드 사용 시도 검출 장치 및 검출 방법
SU1636796A2 (ru) Устройство дл измерени характеристик диэлектрических материалов
RU2178152C2 (ru) Ультразвуковой сигнализатор уровня
SU1415062A1 (ru) Устройство дл измерени толщины
JPS5761960A (en) Measuring device for directivity of antenna
WO2001027640A1 (en) Method to control the apparatus for measurement of electrical quantities through measurement cable
TW245840B (en) Tester for radio frequency matching
JPS56111471A (en) Measuring device for resistance value of coil
SE9604658L (sv) Antennkopplingsanordning
AU5125998A (en) Apparatus for measuring impedance of a resonant structure
PL147574B1 (en) Ultrasonic level detector
SE9700729D0 (sv) Antennkopplingsanordning
JPS5499677A (en) Input end reflecting wave measuring apparatus