DE962868C - Crucibles for the production of the purest semiconductor material, especially silicon and its use - Google Patents

Crucibles for the production of the purest semiconductor material, especially silicon and its use

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Publication number
DE962868C
DE962868C DES32979A DES0032979A DE962868C DE 962868 C DE962868 C DE 962868C DE S32979 A DES32979 A DE S32979A DE S0032979 A DES0032979 A DE S0032979A DE 962868 C DE962868 C DE 962868C
Authority
DE
Germany
Prior art keywords
purest
crucible
silicon
crucibles
production
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DES32979A
Other languages
German (de)
Inventor
Dr Karl Seiler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Standard Elektrik AG
Original Assignee
Standard Elektrik AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Standard Elektrik AG filed Critical Standard Elektrik AG
Priority to DES32979A priority Critical patent/DE962868C/en
Application granted granted Critical
Publication of DE962868C publication Critical patent/DE962868C/en
Expired legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/10Crucibles or containers for supporting the melt

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

Tiegel zum Herstellen reinsten Halbleitermaterials, insbesondere von Silizium und dessen Verwendung Die Erfindung geht von der Erfahrung aus, daß für die Herstellung von Dioden, Transistoren usw. die Reindanstellung von einkristallinen Halbleitern, insbesondere Silizium, eine erhebliche Rolle spielt.Crucibles for the production of the purest semiconductor material, in particular of Silicon and its use The invention is based on experience that for the manufacture of diodes, transistors, etc. the purification of monocrystalline Semiconductors, especially silicon, plays a significant role.

Es wurde nun gefunden, daß man, aus technischem Silizium von nur etwa 99,70/a Reinheit nach der Czochralskimethode einen Einkristall ziehen kann, der eventuell unter Wiederholung dieses Prozesses sehr rein ist. Um dieses Ergebnis zu erreichen und die Oualität des Kristalls noch zu steigern, ist es aber nach den gemachten Erfahrungen notwendig, den Schmelzprozeß in einem Tiegelmaterial vorzunehmen, das kaum oder keine Störstoffe abgibt. Die bereits bekannten Tiegel aus sehr reinen Siliziumverbindungen, die z. B. zum Schmelzen von optischem Glas verwendet werden können, genügen den bei der Herstellung von Halbleiterstoffen zu stellenden ungewöhnlich hohen Anforderungen an den Reinheitsgrad des Tiegelmaterials bei weitem nicht, da die Verunreinigungen dabei so gering sein müssen, daß sie nicht einmal spektralanalytisch nachgewiesen werden können. Auch Tiegel aus Siliziumdioxyd, die unter Umwandlung einer hydrolisierbarenSiliziumverbindung, wie z. B. Siliziumtetrachlorid, hergestellt werden, konnten wegen der Verunreinigungen nicht verwendet werden. Aus demselben Grund erwiesen sich auch mehrschichtige Tiegel mit Ausfütterungen von Graphit als ungeeignet für das Schmelzen von Halbleiterstoffen.It has now been found that, from technical silicon of only about 99.70 / a purity according to the Czochralski method can pull a single crystal that possibly very pure by repeating this process. To this result to achieve and to increase the quality of the crystal, but it is after the experience necessary to carry out the melting process in a crucible material, that emits hardly any or no disruptive substances. The already known crucibles made of very pure Silicon compounds z. B. used to melt optical glass can, suffice the unusual to be provided in the manufacture of semiconductor materials the high demands on the degree of purity of the crucible material are by no means there the impurities have to be so low that they cannot even be analyzed by spectral analysis can be proven. Also crucibles made of silicon dioxide, which are under transformation a hydrolyzable silicon compound, e.g. B. silicon tetrachloride produced could not be used because of the impurities. From the same The reason also turned out to be multilayered Crucible with linings of graphite as unsuitable for melting semiconductor materials.

Erfindungsgemäß wird deshalb ein Tiegel aus einer sehr reinen Siliziumverbindung auf seiner Infenseite mit einer Schicht aus besonders reinem Siliziumdioxyd überzogen, das durch Rektifikation von Siliziumtetrachlorid und anschließender Hydrolyse mit reinstem Wasser gewonnen wird.-Bei diesem Prozeß entsteht eine gelarti.ge Masse, die auf die Innenseite des Tiegels aufgebracht und dort bei etwa i2oo bis 1400° C eingesintert wird.According to the invention, therefore, a crucible is made from a very pure silicon compound coated on its inf side with a layer of particularly pure silicon dioxide, that by rectification of silicon tetrachloride and subsequent hydrolysis with purest water is obtained.-During this process a gel-like mass is created which is applied to the inside of the crucible and there at about i2oo to 1400 ° C is sintered in.

Der erfindungsgemäße Tiegel aus Quarz mit dem besonders reinen Innenüberzug aus Siliziurndioxyd wird dann zum Schmelzen von Silizium zweckmäßig in einen härteren Tiegel aus reinem Aluminiumoxyd oder reinem Graphit hineingestellt, um dadurch unerwünschte Formänderungen des Quarztiegels zu vermeiden.The crucible according to the invention made of quartz with the particularly pure inner coating Silicon dioxide is then expediently used for melting silicon into a harder one Crucibles made of pure aluminum oxide or pure graphite are placed in them to avoid unwanted effects Avoid changes in shape of the quartz crucible.

Im Sinne der Erfindung liegt es auch, als TiegelmateTial Siliziumkarbid zu verwenden, das aus reinstem Silizium und ebenso reinem Kohlenstoff durch Reaktion bei etwa r2oo° C hergestellt wird. Zum Formen und Sintern eines solchen Tiegels können -die üblichen Mittel und Methoden herangezogen werden.It is also within the meaning of the invention to use silicon carbide as the crucible material to use the one made of the purest silicon and just as pure carbon by reaction is produced at around r2oo ° C. For forming and sintering such a crucible the usual means and methods can be used.

Ein aus Siliziumkarbid bestehender Tiegel ist sowohl zur direkten Aufnahme des Schmelzgutes als auch als Mantel zum Hineinstellen eines Quarztiegels der oben näher angegebenen Art geeignet. Bei direkter Benutzung des Tiegels zum Schmelzen des Halbleitermaterials wird man ebenso wie bei dem Tiegel aus Quarz zweckmäßig einen Innenüberzug aus der gelartigen Masse verwenden, die wie oben beschrieben erzeugt und auf die Tiegelwandung aufgebracht werden kann.A crucible made of silicon carbide can be used both for direct Holds the material to be melted as well as a jacket for placing a quartz crucible of the type specified above are suitable. When using the crucible directly for Melting the semiconductor material becomes expedient just as with the quartz crucible Use an inner coating of the gel-like mass, as described above can be generated and applied to the crucible wall.

Claims (1)

PATENTANSPRÜCHE: i. Tiegel zur Herstellung von reinsten Halbieiterstoffen, insbesondere reinstem Silizium, vorzugsweise für Dioden, Transistoren und spektralanalytische Untersuchungen, dadurch gekennzeichnet, daß ein Tiegel aus reinstem Quarz oder reinstem Siliziumkarbid auf seiner Innenseite mit .einem Überzug aus Siliziumdioxyd versehen ist, das durch Rektifikation von Siliziumtetrachlorid und anschließende Hydrolyse mit reinstem Wasser gewonnen wird. z. Tiegel nach Anspruch i, dadurch gekennzeichnet, daß der Überzug auf der Innenseite aufgesintert ist. 3. Tiegel nach Anspruch i und z, dadurch gekennzeichnet, daß dieser von einem zweiten härteren Tiegel als Mantel umgeben ist.. In Betracht gezogene Druckschriften: Französische Patentschrift Nr. 712 36a; deutsche Patentschriften Nr. 484 386, 638 955.PATENT CLAIMS: i. Crucibles for the production of the purest semi-conductor materials, in particular purest silicon, preferably for diodes, transistors and spectral analysis Investigations, characterized in that a crucible made of the purest quartz or the purest Silicon carbide provided with a coating of silicon dioxide on its inside is that by rectification of silicon tetrachloride and subsequent hydrolysis is obtained with the purest water. z. Crucible according to claim i, characterized in that that the coating is sintered on the inside. 3. Crucible according to claim i and z, characterized in that this is from a second, harder crucible as a jacket is surrounded .. Publications under consideration: French patent specification No. 712 36a; German patents Nos. 484 386, 638 955.
DES32979A 1953-04-09 1953-04-09 Crucibles for the production of the purest semiconductor material, especially silicon and its use Expired DE962868C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DES32979A DE962868C (en) 1953-04-09 1953-04-09 Crucibles for the production of the purest semiconductor material, especially silicon and its use

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES32979A DE962868C (en) 1953-04-09 1953-04-09 Crucibles for the production of the purest semiconductor material, especially silicon and its use

Publications (1)

Publication Number Publication Date
DE962868C true DE962868C (en) 1957-04-25

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Application Number Title Priority Date Filing Date
DES32979A Expired DE962868C (en) 1953-04-09 1953-04-09 Crucibles for the production of the purest semiconductor material, especially silicon and its use

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DE (1) DE962868C (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1222482B (en) * 1958-07-25 1966-08-11 Gen Electric Process for the production of a high purity silicon body
DE2928089A1 (en) * 1979-07-12 1981-01-15 Heraeus Schott Quarzschmelze POT FOR SEMICONDUCTOR TECHNOLOGICAL PURPOSES AND METHOD FOR PRODUCING THE POT
US5009863A (en) * 1988-11-11 1991-04-23 Nkk Corporation Apparatus for manufacturing silicon single crystals
WO2005106084A1 (en) * 2004-04-29 2005-11-10 Vesuvius Crucible Company Crucible for the crystallization of silicon
WO2007080120A1 (en) * 2006-01-12 2007-07-19 Vesuvius Crucible Company Crucible for the treatment of molten silicon

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE484386C (en) * 1927-06-04 1929-10-22 Siemens Schuckertwerke Akt Ges Crucible made up of two or more layers of different materials
FR712362A (en) * 1930-03-01 1931-10-01 Jenaer Glaswerk Schott & Gen Shaft furnace for melting glass and other similar materials
DE638955C (en) * 1934-08-27 1936-11-25 Corning Glass Works Process for the production of transparent objects from silica

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE484386C (en) * 1927-06-04 1929-10-22 Siemens Schuckertwerke Akt Ges Crucible made up of two or more layers of different materials
FR712362A (en) * 1930-03-01 1931-10-01 Jenaer Glaswerk Schott & Gen Shaft furnace for melting glass and other similar materials
DE638955C (en) * 1934-08-27 1936-11-25 Corning Glass Works Process for the production of transparent objects from silica

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1222482B (en) * 1958-07-25 1966-08-11 Gen Electric Process for the production of a high purity silicon body
DE2928089A1 (en) * 1979-07-12 1981-01-15 Heraeus Schott Quarzschmelze POT FOR SEMICONDUCTOR TECHNOLOGICAL PURPOSES AND METHOD FOR PRODUCING THE POT
US4528163A (en) * 1979-07-12 1985-07-09 Heraeus Quarzschmelze Gmbh Crucible for semiconductor manufacturing purposes and a process for manufacturing the crucible
US5009863A (en) * 1988-11-11 1991-04-23 Nkk Corporation Apparatus for manufacturing silicon single crystals
WO2005106084A1 (en) * 2004-04-29 2005-11-10 Vesuvius Crucible Company Crucible for the crystallization of silicon
US7378128B2 (en) 2004-04-29 2008-05-27 Vesuvius Crucible Company Crucible for the crystallization of silicon
WO2007080120A1 (en) * 2006-01-12 2007-07-19 Vesuvius Crucible Company Crucible for the treatment of molten silicon
EP1811064A1 (en) * 2006-01-12 2007-07-25 Vesuvius Crucible Company Crucible for treating molten silicon
US7833490B2 (en) 2006-01-12 2010-11-16 Vesuvius Crucible Company Crucible for the treatment of molten silicon

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