DE929745C - More than a two-stage electron microscope - Google Patents

More than a two-stage electron microscope

Info

Publication number
DE929745C
DE929745C DES10386D DES0010386D DE929745C DE 929745 C DE929745 C DE 929745C DE S10386 D DES10386 D DE S10386D DE S0010386 D DES0010386 D DE S0010386D DE 929745 C DE929745 C DE 929745C
Authority
DE
Germany
Prior art keywords
lens
electron microscope
assigned
stage electron
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DES10386D
Other languages
German (de)
Inventor
Ernst Dr-Ing Ruska
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DES10386D priority Critical patent/DE929745C/en
Application granted granted Critical
Publication of DE929745C publication Critical patent/DE929745C/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/15External mechanical adjustment of electron or ion optical components

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)

Description

Mehr als zweistufiges Elektronenmikroskop Zusatz zum Patent 90:,3 61,6 Das Patent 923 616 betrifft einen Korpuskularstrahlapparat, insbesondere ein Elektronenmikroskop, mit magnetischen Polschuhlinsen, wobei einer Linse zwei oder mehr im Vakuumraum des Mikroskops angeordnete Polschuhpaare zugeordnet sind, die durch von außen her zu bedienende Antriebsmittel auszuwechseln .sind. Diese Anordnung bringt den Vorteil, daß der @übergang von einer Vergrößerung zu einer anderen in kürzester Zeit ohne Betriebsunterbrechung durchführbar ist, weil das Auswechseln von Polschuhpaaren stattfinden kann, ohne den Vakuumraum öffnen zu müssen.More than two-stage electron microscope Addendum to patent 90:, 3 61.6 Patent 923 616 relates to a corpuscular beam apparatus, in particular an electron microscope, with magnetic pole piece lenses, with one lens being assigned to two or more pairs of pole pieces, which are arranged in the vacuum space of the microscope and which are connected from the outside the drive means to be operated are to be replaced. This arrangement has the advantage that the transition from one enlargement to another can be carried out in a very short time without interrupting operation, because pole shoe pairs can be changed without having to open the vacuum space.

Eine solche Polschuhwechseleinrichtung hat den weiteren Vorteil, daß man rasch von elektronenmikroskopischen zu Beugungsaufnahmen desselben Objekts übergehen kann, indem man einen Polschuh oder einen entsprechenden unmagnetischen Ring von besonders großem lichtem Durchmesser in die Mikroskopachse bringt, so daß der Kegel der abgebeugten Strahlen ungehindert bis auf die Endbildebene gelangt, wo er beobachtet oder aufgenommen werden kann.Such a pole shoe changing device has the further advantage that you can quickly switch from electron microscopic to diffraction images of the same object can by using a pole piece or a corresponding non-magnetic ring of brings particularly large clear diameter into the microscope axis, so that the cone of the diffracted rays reaches the final image plane unhindered, where he observes or can be included.

Durch die Erfindung wird eine derartige Polschuhwechseleinrichtung in besonders vorteilhafter Weisse für ein mehr als zweistufiges Elektronenmikroskop verwendet. Erfindungsgemäß sind bei einem mehr als zweistufigen Elektronenmikroskop die auswechselbaren Polschuhe einer Linse zugeordnet, die zwischen dem Objektiv und dem das Endbild -erzeugenden letzten Projektiv liegt. Hierdurch ergibt :sich der Vorteil, daß die mit den aus;-wechselbaren Polschuhen versehene und dadurch in ihrer Brennweite in groben Stufen regelbare Linse nur für einen kleineren freien Durchmesser zum Durchtritt der Beugungsbilder zu bemessen ist. Auch die gesamte Konstruktion der mit den auswechselbaren Polschuhen versehenen Linse benötigt bei dieser Anordnung weniger Raum und Material, als wenn man die letzte Abbildungslinse des. drei-oder mehrstufigen Mikroskops mit auswechselbaren Polschuheinsätzen versieht.Such a pole shoe changing device is provided by the invention in particularly advantageous white for a more than two-stage electron microscope used. According to the invention in a more than two-stage electron microscope the exchangeable pole pieces assigned to a lens, the between the lens and the final projective generating the final image. Through this results: there is the advantage that the pole pieces provided with the pole pieces that can be changed from and thus the focal length of the lens, which can be adjusted in coarse steps, is only possible for a smaller one free diameter is to be measured for the passage of the diffraction patterns. Also the whole Construction of the lens provided with the interchangeable pole pieces is required this arrangement takes up less space and material than if you had the last imaging lens Des. Provides three-stage or multi-stage microscope with exchangeable pole shoe inserts.

Würde man die auswechselbaren Polschuhe dem Objektiv zuordnen, so ist die Auflösung der geringer vergrößerten Bilder schlechter infolge der größeren Brennweite, mit denen im Objektiv gearbeitet wird. Ebenso verlangt die geringe Verzeichnung des Endbildes ein Arbeiten mit möglichst kleiner Brennweite im letzten Projektiv. Größere Brennweiten in der mittleren Linse verschlechtern dagegen weder die Auflösung noch die Verzeichnung des Endbildes, da die in die mittlere Linse einfallenden Strahlen :schon eine sehr geringe Apertur haben und der Bildwechsel für das von der mittleren Linse gezeichnete, vor der dritten Linse liegende und weiter im Endbild abgebildete Bildfeld noch sehr klein ist.If you were to assign the interchangeable pole pieces to the lens, so the resolution of the less magnified images is poorer because of the larger ones Focal length that is used in the lens. The low distortion is also a requirement of the final image working with the smallest possible focal length in the last projective. On the other hand, larger focal lengths in the central lens do not degrade the resolution nor the distortion of the final image, since the rays entering the central lens : already have a very small aperture and the image change for that of the middle one Lens drawn, located in front of the third lens and further depicted in the final image Field of view is still very small.

Claims (1)

PATENTANSPRUCH: Mehr als zweistufiges Elektronenmikroskop mit einer magnetischen Linse zugeordneten, unter Vakuum während des Betriebes gegeneinander austauschbaren Polschuheinsätzen, denen verschiedene Brennweiten zugeordnet sind, nach Patent 923 616, dadurch gekennzeichnet, daß die auswechselbaren Polschuhe einer Linse zugeordnet :sind, die zwischen dem Objektiv und dem das Endbild erzeugenden letzten Projektiv liegt.PATENT CLAIM: More than a two-stage electron microscope with a magnetic lens assigned, pole piece inserts which are interchangeable under vacuum during operation and to which different focal lengths are assigned, according to patent 923 616, characterized in that the interchangeable pole pieces are assigned to a lens: which are located between the objective and the last projection lens that produces the final image.
DES10386D 1943-01-29 1943-01-29 More than a two-stage electron microscope Expired DE929745C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DES10386D DE929745C (en) 1943-01-29 1943-01-29 More than a two-stage electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES10386D DE929745C (en) 1943-01-29 1943-01-29 More than a two-stage electron microscope

Publications (1)

Publication Number Publication Date
DE929745C true DE929745C (en) 1955-07-04

Family

ID=7473301

Family Applications (1)

Application Number Title Priority Date Filing Date
DES10386D Expired DE929745C (en) 1943-01-29 1943-01-29 More than a two-stage electron microscope

Country Status (1)

Country Link
DE (1) DE929745C (en)

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