DE9112049U1 - - Google Patents

Info

Publication number
DE9112049U1
DE9112049U1 DE9112049U DE9112049U DE9112049U1 DE 9112049 U1 DE9112049 U1 DE 9112049U1 DE 9112049 U DE9112049 U DE 9112049U DE 9112049 U DE9112049 U DE 9112049U DE 9112049 U1 DE9112049 U1 DE 9112049U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9112049U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE9112049U priority Critical patent/DE9112049U1/de
Publication of DE9112049U1 publication Critical patent/DE9112049U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
DE9112049U 1991-09-26 1991-09-26 Expired - Lifetime DE9112049U1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE9112049U DE9112049U1 (ja) 1991-09-26 1991-09-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE9112049U DE9112049U1 (ja) 1991-09-26 1991-09-26

Publications (1)

Publication Number Publication Date
DE9112049U1 true DE9112049U1 (ja) 1991-11-28

Family

ID=6871705

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9112049U Expired - Lifetime DE9112049U1 (ja) 1991-09-26 1991-09-26

Country Status (1)

Country Link
DE (1) DE9112049U1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1010105C2 (nl) * 1997-11-18 1999-05-19 Samsung Electronics Co Ltd Sondekaart voor het testen van een chip met een geïntegreerde schakeling.
DE10219144A1 (de) * 2002-04-29 2003-11-13 Infineon Technologies Ag Nadelkarte und Messnadeleinsatz für eine Nadelkarte

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1010105C2 (nl) * 1997-11-18 1999-05-19 Samsung Electronics Co Ltd Sondekaart voor het testen van een chip met een geïntegreerde schakeling.
FR2771180A1 (fr) * 1997-11-18 1999-05-21 Samsung Electronics Co Ltd Carte de controle pour tester une puce de circuit integre
DE10219144A1 (de) * 2002-04-29 2003-11-13 Infineon Technologies Ag Nadelkarte und Messnadeleinsatz für eine Nadelkarte

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