DE9000825U1 - Integrierter Schaltkreis - Google Patents

Integrierter Schaltkreis

Info

Publication number
DE9000825U1
DE9000825U1 DE9000825U DE9000825U DE9000825U1 DE 9000825 U1 DE9000825 U1 DE 9000825U1 DE 9000825 U DE9000825 U DE 9000825U DE 9000825 U DE9000825 U DE 9000825U DE 9000825 U1 DE9000825 U1 DE 9000825U1
Authority
DE
Germany
Prior art keywords
external
line system
arrangement
controlled
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE9000825U
Other languages
German (de)
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE9000825U priority Critical patent/DE9000825U1/de
Publication of DE9000825U1 publication Critical patent/DE9000825U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE9000825U 1990-01-25 1990-01-25 Integrierter Schaltkreis Expired - Lifetime DE9000825U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE9000825U DE9000825U1 (de) 1990-01-25 1990-01-25 Integrierter Schaltkreis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE9000825U DE9000825U1 (de) 1990-01-25 1990-01-25 Integrierter Schaltkreis

Publications (1)

Publication Number Publication Date
DE9000825U1 true DE9000825U1 (de) 1990-03-29

Family

ID=6850351

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9000825U Expired - Lifetime DE9000825U1 (de) 1990-01-25 1990-01-25 Integrierter Schaltkreis

Country Status (1)

Country Link
DE (1) DE9000825U1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0594478A1 (fr) * 1992-10-22 1994-04-27 Societe D'applications Generales D'electricite Et De Mecanique Sagem Circuit intégré à la demande à microprocesseur incorporant des moyens pour le test
US5432464A (en) * 1993-09-29 1995-07-11 Societe D'applications Generales D'electricite Et De Mecanique Sagem Application specific integrated circuit including a microprocessor for customized functions as defined by the user
DE19842208A1 (de) * 1998-09-15 2000-04-06 Siemens Ag Integrierter Schaltkreis mit zwei Betriebszuständen

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0594478A1 (fr) * 1992-10-22 1994-04-27 Societe D'applications Generales D'electricite Et De Mecanique Sagem Circuit intégré à la demande à microprocesseur incorporant des moyens pour le test
FR2697356A1 (fr) * 1992-10-22 1994-04-29 Sagem Circuit intégré à la demande à microprocesseur.
US5432464A (en) * 1993-09-29 1995-07-11 Societe D'applications Generales D'electricite Et De Mecanique Sagem Application specific integrated circuit including a microprocessor for customized functions as defined by the user
DE19842208A1 (de) * 1998-09-15 2000-04-06 Siemens Ag Integrierter Schaltkreis mit zwei Betriebszuständen
US6229343B1 (en) 1998-09-15 2001-05-08 Siemens Aktiengesellschaft Integrated circuit with two operating states

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