DE9000825U1 - Integrierter Schaltkreis - Google Patents
Integrierter SchaltkreisInfo
- Publication number
- DE9000825U1 DE9000825U1 DE9000825U DE9000825U DE9000825U1 DE 9000825 U1 DE9000825 U1 DE 9000825U1 DE 9000825 U DE9000825 U DE 9000825U DE 9000825 U DE9000825 U DE 9000825U DE 9000825 U1 DE9000825 U1 DE 9000825U1
- Authority
- DE
- Germany
- Prior art keywords
- external
- line system
- arrangement
- controlled
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000002457 bidirectional effect Effects 0.000 claims description 8
- 230000005540 biological transmission Effects 0.000 claims description 7
- 244000309464 bull Species 0.000 claims description 4
- 238000000034 method Methods 0.000 description 2
- 101150067539 AMBP gene Proteins 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE9000825U DE9000825U1 (de) | 1990-01-25 | 1990-01-25 | Integrierter Schaltkreis |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE9000825U DE9000825U1 (de) | 1990-01-25 | 1990-01-25 | Integrierter Schaltkreis |
Publications (1)
Publication Number | Publication Date |
---|---|
DE9000825U1 true DE9000825U1 (de) | 1990-03-29 |
Family
ID=6850351
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE9000825U Expired - Lifetime DE9000825U1 (de) | 1990-01-25 | 1990-01-25 | Integrierter Schaltkreis |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE9000825U1 (fr) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0594478A1 (fr) * | 1992-10-22 | 1994-04-27 | Societe D'applications Generales D'electricite Et De Mecanique Sagem | Circuit intégré à la demande à microprocesseur incorporant des moyens pour le test |
US5432464A (en) * | 1993-09-29 | 1995-07-11 | Societe D'applications Generales D'electricite Et De Mecanique Sagem | Application specific integrated circuit including a microprocessor for customized functions as defined by the user |
DE19842208A1 (de) * | 1998-09-15 | 2000-04-06 | Siemens Ag | Integrierter Schaltkreis mit zwei Betriebszuständen |
-
1990
- 1990-01-25 DE DE9000825U patent/DE9000825U1/de not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0594478A1 (fr) * | 1992-10-22 | 1994-04-27 | Societe D'applications Generales D'electricite Et De Mecanique Sagem | Circuit intégré à la demande à microprocesseur incorporant des moyens pour le test |
FR2697356A1 (fr) * | 1992-10-22 | 1994-04-29 | Sagem | Circuit intégré à la demande à microprocesseur. |
US5432464A (en) * | 1993-09-29 | 1995-07-11 | Societe D'applications Generales D'electricite Et De Mecanique Sagem | Application specific integrated circuit including a microprocessor for customized functions as defined by the user |
DE19842208A1 (de) * | 1998-09-15 | 2000-04-06 | Siemens Ag | Integrierter Schaltkreis mit zwei Betriebszuständen |
US6229343B1 (en) | 1998-09-15 | 2001-05-08 | Siemens Aktiengesellschaft | Integrated circuit with two operating states |
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