DE8816587U1 - - Google Patents

Info

Publication number
DE8816587U1
DE8816587U1 DE8816587U DE8816587U DE8816587U1 DE 8816587 U1 DE8816587 U1 DE 8816587U1 DE 8816587 U DE8816587 U DE 8816587U DE 8816587 U DE8816587 U DE 8816587U DE 8816587 U1 DE8816587 U1 DE 8816587U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8816587U
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bergwerksverband GmbH
RAG AG
Original Assignee
Ruhrkohle AG
Bergwerksverband GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ruhrkohle AG, Bergwerksverband GmbH filed Critical Ruhrkohle AG
Priority to DE8816587U priority Critical patent/DE8816587U1/de
Publication of DE8816587U1 publication Critical patent/DE8816587U1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
DE8816587U 1988-08-31 1988-08-31 Expired - Lifetime DE8816587U1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8816587U DE8816587U1 (en) 1988-08-31 1988-08-31

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3829482 1988-08-31
DE8816587U DE8816587U1 (en) 1988-08-31 1988-08-31

Publications (1)

Publication Number Publication Date
DE8816587U1 true DE8816587U1 (en) 1989-12-28

Family

ID=25871672

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8816587U Expired - Lifetime DE8816587U1 (en) 1988-08-31 1988-08-31

Country Status (1)

Country Link
DE (1) DE8816587U1 (en)

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