DE8621220U1 - - Google Patents

Info

Publication number
DE8621220U1
DE8621220U1 DE19868621220 DE8621220U DE8621220U1 DE 8621220 U1 DE8621220 U1 DE 8621220U1 DE 19868621220 DE19868621220 DE 19868621220 DE 8621220 U DE8621220 U DE 8621220U DE 8621220 U1 DE8621220 U1 DE 8621220U1
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19868621220
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE19868621220 priority Critical patent/DE8621220U1/de
Publication of DE8621220U1 publication Critical patent/DE8621220U1/de
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07321Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support the probes being of different lengths

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
DE19868621220 1986-08-07 1986-08-07 Expired DE8621220U1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19868621220 DE8621220U1 (de) 1986-08-07 1986-08-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19868621220 DE8621220U1 (de) 1986-08-07 1986-08-07

Publications (1)

Publication Number Publication Date
DE8621220U1 true DE8621220U1 (de) 1988-01-07

Family

ID=6797246

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19868621220 Expired DE8621220U1 (de) 1986-08-07 1986-08-07

Country Status (1)

Country Link
DE (1) DE8621220U1 (de)

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