DE7914951U1 - Spring contact device for measuring and testing purposes - Google Patents
Spring contact device for measuring and testing purposesInfo
- Publication number
- DE7914951U1 DE7914951U1 DE19797914951 DE7914951U DE7914951U1 DE 7914951 U1 DE7914951 U1 DE 7914951U1 DE 19797914951 DE19797914951 DE 19797914951 DE 7914951 U DE7914951 U DE 7914951U DE 7914951 U1 DE7914951 U1 DE 7914951U1
- Authority
- DE
- Germany
- Prior art keywords
- sleeves
- contact device
- contact
- measuring
- spring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005476 soldering Methods 0.000 description 2
- 244000309464 bull Species 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000003763 resistance to breakage Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Description
■ Die Erfindung betrifft eine federnde Kontakteinrichtung für MeB- und Prüf zwecke einer im. Oberbegriff des Anspruchs 1 bezeichneten■ The invention relates to a resilient contact device for measuring and testing purposes of a device as defined in the preamble of claim 1.
Bauart.
Jt/ 6l&tr Design type.
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in'in'
Bei ■Ausbildung der kontakteinrichtung 64 sind die HCQ.se und das in ihr befestigte AnschluBcleatcnt getrennte Bauteile, zwischen denen jeweils stirnseitig an den fcnschluBei ementen anliegende Schraubenfedern angeordnet sind. Die Xontaktbausteine sind deshalb ziealich lang, vodurch sich ein hoher Pertigungsaufwand ergibt und die $e£ahr besteht« daß sie bei Kontaktierung ausknicken.When the contact device 64 is designed, the HCQ.se and the connection terminal attached to it are separate components, between which helical springs are arranged which rest on the front of the connection elements. The contact modules are therefore quite long, which results in a high manufacturing cost and there is a risk that they will buckle when contact is made.
Die Aufgabe der Erfindung besteht darin, diese Mangel zu beseitigen /- «ad eine kürzere Baulange der Kontakteinrichtung zu erzielen. (*The object of the invention is to eliminate these deficiencies and to achieve a shorter length of the contact device. (*
Zur LOsung dieser Aufgabe wird erfindungsgeaXS vorgesagen, die AnschlnBeletfente einstöckig mit den KHlsen als Äohrkörper auszubilden und die Schraubenfedern an SinbSrdelungen der Anzchlueeleaente abzustützen.To solve this problem, the invention proposes to form the connection elements in one piece with the sleeves as a tube body and to support the coil springs on the flanges of the connection elements.
Solche Kontakteinrichtungen kttanen bei gleicher PederlHnge und damit gleicher Federkennlinie wesentlich kurzer ausgeführt werden; sie sied daher auch für herk&mliche Adapterplatten einsetzbar. In atm iu&ea glattwandigen Rohrkörper IkBt sich eine lange Schraubenfeder unterbringen, die bei gleicher Federkraft eine erhöhte Bruchsicherheit und eine erwünschte flachere Federkennlinie aufweist. Außerdem steht für den Kontaktkolben eine lange Führungsbahn zur Verfügung, wodurch &ngr; / günstige Eeibungs- und Strovleitangs-Verhaltnisse gcv^lirleietet sied.Such contact devices can be made significantly shorter with the same spring length and thus the same spring characteristic; they can therefore also be used for conventional adapter plates. A long helical spring can be accommodated in the smooth-walled tubular body, which has an increased resistance to breakage and a desired flatter spring characteristic with the same spring force. In addition, a long guideway is available for the contact piston, which creates favorable friction and current conduction conditions.
Ein Ausführungsbeispiel der Erfindung ist in der Zeichnung dargestellt und wird ia folgenden erläutert.An embodiment of the invention is shown in the drawing and is explained below.
Bs zeigen:Bs show:
Fig. 1 Schenatische Darstellung einer Kontakteinrichtung an einer elektronischen Leiterplatte;Fig. 1 Schematic representation of a contact device on an electronic circuit board;
Bei der Kontakteinrichtung nach Fig. 1 sind viele» parallel nebeneinander liegende Hülsen 1 in eine Adapterplatte 2 eingepreßt. Bei praktisch ausgeführten Kontakteinrichtung«! enthält die Adapterplatte 2 etwa 10 000 Hülsen ait eines AuBendurchaesser von ca. 1 ■«. An den einen Enden 3 ragen ans den Hülsen 1 die Eontaktkolben 4 heraus und kontaktieren »it ihren Spitzen 5 eine elektronische Leiterplatte 6. An den anderen Hülsenenden 7 sind Anschlußelemente 8 als konzentrische Kohreangebracht, so daß sie zusamen mix den Hülsen 1 einstöckige Eohrkörper mit glatter Innenwand bilden. Die Anschlußeloaente 8 liegen an einer Mit der Adapterplatte 2 verschr<rfbteu Anschlagplatte 9 an. Jedes .Inschlußeleaent weist eine Lötstelle 10 auf, an der ein (der Übersichtlichkeit halber nicht gezeichneter) Sfaht sssr 9eiterleits2<* des PrOfstrones £u eine« Meßgerät angelötet ist. Die Lötstellen 10 sind längs der Anschlußel^mente 8 jeweils um einige Milliaeter gegeneinander versetzt angeordnet.In the contact device according to Fig. 1, many sleeves 1 lying parallel to one another are pressed into an adapter plate 2. In a practically designed contact device, the adapter plate 2 contains about 10,000 sleeves with an external diameter of about 1 μm. At one end 3, the contact pistons 4 protrude from the sleeves 1 and contact an electronic circuit board 6 with their tips 5. At the other sleeve ends 7, connection elements 8 are attached as concentric joints, so that together with the sleeves 1 they form one-piece tube bodies with a smooth inner wall. The connection elements 8 rest on a stop plate 9 which is screwed to the adapter plate 2. Each connection element has a soldering point 10 to which a conductor line (not shown for the sake of clarity) from the probe to a measuring device is soldered. The soldering points 10 are arranged along the connection elements 8, each offset from one another by a few millimeters.
lach Fig. 2 sind in die Hülsen 1 und Anschlußeleaente 8 Schraubenledern 11 eingesetzt, di& einerseits an den Kontaktkolben 4» andererseits an EinbÖrdeluaees 12 der Anschlaßelemente 8 anliegen.As shown in Fig. 2, screw bolts 11 are inserted into the sleeves 1 and connecting elements 8, which on the one hand rest against the contact piston 4 and on the other hand against the flanged holes 12 of the connecting elements 8.
• *t· · «ff»·• *t· · «ff»·
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19797914951 DE7914951U1 (en) | 1979-05-23 | 1979-05-23 | Spring contact device for measuring and testing purposes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19797914951 DE7914951U1 (en) | 1979-05-23 | 1979-05-23 | Spring contact device for measuring and testing purposes |
Publications (1)
Publication Number | Publication Date |
---|---|
DE7914951U1 true DE7914951U1 (en) | 1989-07-13 |
Family
ID=6704280
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19797914951 Expired DE7914951U1 (en) | 1979-05-23 | 1979-05-23 | Spring contact device for measuring and testing purposes |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE7914951U1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1992003741A1 (en) * | 1990-08-13 | 1992-03-05 | Mania Gmbh & Co. | Spring contact field component for wiring/printed circuit board testing device |
WO2005096441A1 (en) * | 2004-03-05 | 2005-10-13 | The Ludlow Company Lp | Cable terminal with air-enhanced contact pins |
US7364474B2 (en) | 2003-10-14 | 2008-04-29 | Precision Interconnect, Inc. | Cable terminal with contact pins including electrical component |
-
1979
- 1979-05-23 DE DE19797914951 patent/DE7914951U1/en not_active Expired
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1992003741A1 (en) * | 1990-08-13 | 1992-03-05 | Mania Gmbh & Co. | Spring contact field component for wiring/printed circuit board testing device |
US7364474B2 (en) | 2003-10-14 | 2008-04-29 | Precision Interconnect, Inc. | Cable terminal with contact pins including electrical component |
US7371128B2 (en) | 2003-10-14 | 2008-05-13 | Precision Interconnect, Inc. | Cable terminal with air-enhanced contact pins |
WO2005096441A1 (en) * | 2004-03-05 | 2005-10-13 | The Ludlow Company Lp | Cable terminal with air-enhanced contact pins |
CN1930737B (en) * | 2004-03-05 | 2010-09-29 | 勒德洛有限合伙人公司 | Cable terminal with air-enhanced contact pins |
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