DE7914951U1 - Spring contact device for measuring and testing purposes - Google Patents

Spring contact device for measuring and testing purposes

Info

Publication number
DE7914951U1
DE7914951U1 DE19797914951 DE7914951U DE7914951U1 DE 7914951 U1 DE7914951 U1 DE 7914951U1 DE 19797914951 DE19797914951 DE 19797914951 DE 7914951 U DE7914951 U DE 7914951U DE 7914951 U1 DE7914951 U1 DE 7914951U1
Authority
DE
Germany
Prior art keywords
sleeves
contact device
contact
measuring
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19797914951
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Feinmetall GmbH
Original Assignee
Feinmetall GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetall GmbH filed Critical Feinmetall GmbH
Priority to DE19797914951 priority Critical patent/DE7914951U1/en
Publication of DE7914951U1 publication Critical patent/DE7914951U1/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18End pieces terminating in a probe

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Description

■ Die Erfindung betrifft eine federnde Kontakteinrichtung für MeB- und Prüf zwecke einer im. Oberbegriff des Anspruchs 1 bezeichneten■ The invention relates to a resilient contact device for measuring and testing purposes of a device as defined in the preamble of claim 1.

Bauart.
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Design type.
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Bei ■Ausbildung der kontakteinrichtung 64 sind die HCQ.se und das in ihr befestigte AnschluBcleatcnt getrennte Bauteile, zwischen denen jeweils stirnseitig an den fcnschluBei ementen anliegende Schraubenfedern angeordnet sind. Die Xontaktbausteine sind deshalb ziealich lang, vodurch sich ein hoher Pertigungsaufwand ergibt und die $e£ahr besteht« daß sie bei Kontaktierung ausknicken.When the contact device 64 is designed, the HCQ.se and the connection terminal attached to it are separate components, between which helical springs are arranged which rest on the front of the connection elements. The contact modules are therefore quite long, which results in a high manufacturing cost and there is a risk that they will buckle when contact is made.

Die Aufgabe der Erfindung besteht darin, diese Mangel zu beseitigen /- «ad eine kürzere Baulange der Kontakteinrichtung zu erzielen. (*The object of the invention is to eliminate these deficiencies and to achieve a shorter length of the contact device. (*

Zur LOsung dieser Aufgabe wird erfindungsgeaXS vorgesagen, die AnschlnBeletfente einstöckig mit den KHlsen als Äohrkörper auszubilden und die Schraubenfedern an SinbSrdelungen der Anzchlueeleaente abzustützen.To solve this problem, the invention proposes to form the connection elements in one piece with the sleeves as a tube body and to support the coil springs on the flanges of the connection elements.

Solche Kontakteinrichtungen kttanen bei gleicher PederlHnge und damit gleicher Federkennlinie wesentlich kurzer ausgeführt werden; sie sied daher auch für herk&mliche Adapterplatten einsetzbar. In atm iu&ea glattwandigen Rohrkörper IkBt sich eine lange Schraubenfeder unterbringen, die bei gleicher Federkraft eine erhöhte Bruchsicherheit und eine erwünschte flachere Federkennlinie aufweist. Außerdem steht für den Kontaktkolben eine lange Führungsbahn zur Verfügung, wodurch &ngr; / günstige Eeibungs- und Strovleitangs-Verhaltnisse gcv^lirleietet sied.Such contact devices can be made significantly shorter with the same spring length and thus the same spring characteristic; they can therefore also be used for conventional adapter plates. A long helical spring can be accommodated in the smooth-walled tubular body, which has an increased resistance to breakage and a desired flatter spring characteristic with the same spring force. In addition, a long guideway is available for the contact piston, which creates favorable friction and current conduction conditions.

Ein Ausführungsbeispiel der Erfindung ist in der Zeichnung dargestellt und wird ia folgenden erläutert.An embodiment of the invention is shown in the drawing and is explained below.

Bs zeigen:Bs show:

Fig. 1 Schenatische Darstellung einer Kontakteinrichtung an einer elektronischen Leiterplatte;Fig. 1 Schematic representation of a contact device on an electronic circuit board;

Fig. 2 Längsschnitt durch einen Kontaktbaustein.Fig. 2 Longitudinal section through a contact module.

Bei der Kontakteinrichtung nach Fig. 1 sind viele» parallel nebeneinander liegende Hülsen 1 in eine Adapterplatte 2 eingepreßt. Bei praktisch ausgeführten Kontakteinrichtung«! enthält die Adapterplatte 2 etwa 10 000 Hülsen ait eines AuBendurchaesser von ca. 1 ■«. An den einen Enden 3 ragen ans den Hülsen 1 die Eontaktkolben 4 heraus und kontaktieren »it ihren Spitzen 5 eine elektronische Leiterplatte 6. An den anderen Hülsenenden 7 sind Anschlußelemente 8 als konzentrische Kohreangebracht, so daß sie zusamen mix den Hülsen 1 einstöckige Eohrkörper mit glatter Innenwand bilden. Die Anschlußeloaente 8 liegen an einer Mit der Adapterplatte 2 verschr<rfbteu Anschlagplatte 9 an. Jedes .Inschlußeleaent weist eine Lötstelle 10 auf, an der ein (der Übersichtlichkeit halber nicht gezeichneter) Sfaht sssr 9eiterleits2<* des PrOfstrones £u eine« Meßgerät angelötet ist. Die Lötstellen 10 sind längs der Anschlußel^mente 8 jeweils um einige Milliaeter gegeneinander versetzt angeordnet.In the contact device according to Fig. 1, many sleeves 1 lying parallel to one another are pressed into an adapter plate 2. In a practically designed contact device, the adapter plate 2 contains about 10,000 sleeves with an external diameter of about 1 μm. At one end 3, the contact pistons 4 protrude from the sleeves 1 and contact an electronic circuit board 6 with their tips 5. At the other sleeve ends 7, connection elements 8 are attached as concentric joints, so that together with the sleeves 1 they form one-piece tube bodies with a smooth inner wall. The connection elements 8 rest on a stop plate 9 which is screwed to the adapter plate 2. Each connection element has a soldering point 10 to which a conductor line (not shown for the sake of clarity) from the probe to a measuring device is soldered. The soldering points 10 are arranged along the connection elements 8, each offset from one another by a few millimeters.

lach Fig. 2 sind in die Hülsen 1 und Anschlußeleaente 8 Schraubenledern 11 eingesetzt, di& einerseits an den Kontaktkolben 4» andererseits an EinbÖrdeluaees 12 der Anschlaßelemente 8 anliegen.As shown in Fig. 2, screw bolts 11 are inserted into the sleeves 1 and connecting elements 8, which on the one hand rest against the contact piston 4 and on the other hand against the flanged holes 12 of the connecting elements 8.

&bull; *t· · «ff»·&bull; *t· · «ff»·

Claims (3)

eprtteheeprttehe Federnde Kontakteinrichtung fttr MeS- und Prüf zwecke, mit ■ebreren in einer Adapterplatte parallel nebeneinander liegenden Hülsen, in deren einen Buden Kontaktkolben l&ngsbeweglich eingepaflt sind, die wir Kontaktierung «it elektronischen Leiterplatten dienen und dabei in den Httlsen angeordnete tehraubettfedern verspannen, wobei «ich die Schraubenfeder» an Anschlugelementen abstüteen, die as den anderen Hülsenenden konsentrisca angebracht sind und an die OrXhte sur Veiterleitong des Prttfstromes auBen angeUtet »HA, 4utdt^'dwirtMimeMhBiF*V*-«&9H%i$&mdash;&uacgr;4$&ngr;&Ogr;&Uacgr; dadurch daS die An«*h1iiftel*mrnte (8) einstflckig mit den Hülsen (1) ausgebildet sind.Spring-loaded contact device for measuring and testing purposes, with two sleeves lying parallel to one another in an adapter plate, in one of whose sleeves contact pistons are fitted so as to be longitudinally movable, which serve to make contact with electronic circuit boards and in doing so brace springs arranged in the sleeves , whereby the helical spring is supported on stop elements which are attached concentrically to the other sleeve ends and are externally indicated at the locations for conducting the test current. 2. Kontakteinrichtung nach Anspruch 1, dadurch gekennzeichnet, daft die Hülsen (i) und Anschlueelemente (ft) als Kohrkttrper mit glctt iwiHip*f *r»«**y Znnenwand gestaltet sind«2. Contact device according to claim 1, characterized in that the sleeves (i) and connecting elements ( ft ) are designed as a coaxial body with smooth inner wall . 3. Kontakteinrichtung nach Anspruch 1, dadurch gekennzeichnet, OaB die Schraubenfedern (ii) in den Sohrkurpem (i, 8) gegen Ausknicken geführt sind und an SinbF>-delungen (i2) der Anschlueelemente (8) anliegen.3. Contact device according to claim 1, characterized in that the helical springs (ii) are guided in the head tubes (i, 8) to prevent them from buckling and rest against the spring guides (i2) of the connecting elements (8).
DE19797914951 1979-05-23 1979-05-23 Spring contact device for measuring and testing purposes Expired DE7914951U1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19797914951 DE7914951U1 (en) 1979-05-23 1979-05-23 Spring contact device for measuring and testing purposes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19797914951 DE7914951U1 (en) 1979-05-23 1979-05-23 Spring contact device for measuring and testing purposes

Publications (1)

Publication Number Publication Date
DE7914951U1 true DE7914951U1 (en) 1989-07-13

Family

ID=6704280

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19797914951 Expired DE7914951U1 (en) 1979-05-23 1979-05-23 Spring contact device for measuring and testing purposes

Country Status (1)

Country Link
DE (1) DE7914951U1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992003741A1 (en) * 1990-08-13 1992-03-05 Mania Gmbh & Co. Spring contact field component for wiring/printed circuit board testing device
WO2005096441A1 (en) * 2004-03-05 2005-10-13 The Ludlow Company Lp Cable terminal with air-enhanced contact pins
US7364474B2 (en) 2003-10-14 2008-04-29 Precision Interconnect, Inc. Cable terminal with contact pins including electrical component

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992003741A1 (en) * 1990-08-13 1992-03-05 Mania Gmbh & Co. Spring contact field component for wiring/printed circuit board testing device
US7364474B2 (en) 2003-10-14 2008-04-29 Precision Interconnect, Inc. Cable terminal with contact pins including electrical component
US7371128B2 (en) 2003-10-14 2008-05-13 Precision Interconnect, Inc. Cable terminal with air-enhanced contact pins
WO2005096441A1 (en) * 2004-03-05 2005-10-13 The Ludlow Company Lp Cable terminal with air-enhanced contact pins
CN1930737B (en) * 2004-03-05 2010-09-29 勒德洛有限合伙人公司 Cable terminal with air-enhanced contact pins

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