DE69923212D1 - Ionenpumpeschaltersteuerung - Google Patents
IonenpumpeschaltersteuerungInfo
- Publication number
- DE69923212D1 DE69923212D1 DE69923212T DE69923212T DE69923212D1 DE 69923212 D1 DE69923212 D1 DE 69923212D1 DE 69923212 T DE69923212 T DE 69923212T DE 69923212 T DE69923212 T DE 69923212T DE 69923212 D1 DE69923212 D1 DE 69923212D1
- Authority
- DE
- Germany
- Prior art keywords
- switch control
- ion pump
- pump switch
- ion
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/36—Radio frequency spectrometers, e.g. Bennett-type spectrometers, Redhead-type spectrometers
- H01J49/38—Omegatrons ; using ion cyclotron resonance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J41/00—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
- H01J41/12—Discharge tubes for evacuating by diffusion of ions, e.g. ion pumps, getter ion pumps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0495—Vacuum locks; Valves
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US173944 | 1998-10-16 | ||
US09/173,944 US6232599B1 (en) | 1998-10-16 | 1998-10-16 | Ion pump relay control |
PCT/US1999/021624 WO2000024033A1 (en) | 1998-10-16 | 1999-10-13 | Ion pump relay control |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69923212D1 true DE69923212D1 (de) | 2005-02-17 |
DE69923212T2 DE69923212T2 (de) | 2005-12-29 |
Family
ID=22634161
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69923212T Expired - Lifetime DE69923212T2 (de) | 1998-10-16 | 1999-10-13 | Ionenpumpeschaltersteuerung |
Country Status (5)
Country | Link |
---|---|
US (1) | US6232599B1 (de) |
EP (1) | EP1129468B1 (de) |
CA (1) | CA2345383A1 (de) |
DE (1) | DE69923212T2 (de) |
WO (1) | WO2000024033A1 (de) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3904322B2 (ja) * | 1998-04-20 | 2007-04-11 | 株式会社日立製作所 | 分析装置 |
JP4475646B2 (ja) * | 2004-08-27 | 2010-06-09 | キヤノン株式会社 | 画像表示装置 |
DE102007017053B4 (de) * | 2006-04-27 | 2011-06-16 | Bruker Daltonik Gmbh | Messzelle für Ionenzyklotronresonanz-Massenspektrometer |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3937955A (en) | 1974-10-15 | 1976-02-10 | Nicolet Technology Corporation | Fourier transform ion cyclotron resonance spectroscopy method and apparatus |
US4201913A (en) * | 1978-10-06 | 1980-05-06 | Honeywell Inc. | Sampling system for mass spectrometer |
US4683749A (en) * | 1986-05-22 | 1987-08-04 | Westinghouse Electric Corp. | Process and system for detecting and measuring a tritium gas leak |
US4945234A (en) * | 1989-05-19 | 1990-07-31 | Extrel Ftms, Inc. | Method and apparatus for producing an arbitrary excitation spectrum for Fourier transform mass spectrometry |
US5313061A (en) | 1989-06-06 | 1994-05-17 | Viking Instrument | Miniaturized mass spectrometer system |
JP2952894B2 (ja) * | 1989-07-03 | 1999-09-27 | 富士通株式会社 | 真空装置およびプロセスチャンバ内のガス分析方法 |
US5155357A (en) * | 1990-07-23 | 1992-10-13 | Massachusetts Institute Of Technology | Portable mass spectrometer |
US6121609A (en) * | 1998-10-16 | 2000-09-19 | Siemens Aktiengesellschaft | Pulsed mass spectrometer leak valve with controlled energy closure |
-
1998
- 1998-10-16 US US09/173,944 patent/US6232599B1/en not_active Expired - Lifetime
-
1999
- 1999-10-13 CA CA002345383A patent/CA2345383A1/en not_active Abandoned
- 1999-10-13 DE DE69923212T patent/DE69923212T2/de not_active Expired - Lifetime
- 1999-10-13 EP EP99951507A patent/EP1129468B1/de not_active Expired - Lifetime
- 1999-10-13 WO PCT/US1999/021624 patent/WO2000024033A1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
EP1129468B1 (de) | 2005-01-12 |
US6232599B1 (en) | 2001-05-15 |
DE69923212T2 (de) | 2005-12-29 |
WO2000024033A1 (en) | 2000-04-27 |
CA2345383A1 (en) | 2000-04-27 |
EP1129468A1 (de) | 2001-09-05 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: SIEMENS INDUSTRY, INC. (N.D.GES.D. STAATES DEL, US |