DE69832102D1 - Inspektion von leiterplatten unter verwendung von farbe - Google Patents

Inspektion von leiterplatten unter verwendung von farbe

Info

Publication number
DE69832102D1
DE69832102D1 DE69832102T DE69832102T DE69832102D1 DE 69832102 D1 DE69832102 D1 DE 69832102D1 DE 69832102 T DE69832102 T DE 69832102T DE 69832102 T DE69832102 T DE 69832102T DE 69832102 D1 DE69832102 D1 DE 69832102D1
Authority
DE
Germany
Prior art keywords
pcb
inspection
color
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69832102T
Other languages
English (en)
Other versions
DE69832102T2 (de
Inventor
F Kaminsky
Peter Grobgeld
Yuval Spector
Eliezer Lipman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Orbotech Ltd
Original Assignee
Orbotech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orbotech Ltd filed Critical Orbotech Ltd
Publication of DE69832102D1 publication Critical patent/DE69832102D1/de
Application granted granted Critical
Publication of DE69832102T2 publication Critical patent/DE69832102T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302Contactless testing
    • G01R31/308Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95684Patterns showing highly reflecting parts, e.g. metallic elements
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0269Marks, test patterns or identification means for visual or optical inspection
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30141Printed circuit board [PCB]
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/03Metal processing
    • H05K2203/0315Oxidising metal
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16Inspection; Monitoring; Aligning
    • H05K2203/161Using chemical substances, e.g. colored or fluorescent, for facilitating optical or visual inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Biochemistry (AREA)
  • Electromagnetism (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
DE69832102T 1998-08-18 1998-08-18 Inspektion von leiterplatten unter verwendung von farbe Expired - Fee Related DE69832102T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IL1998/000393 WO2000011454A1 (en) 1998-08-18 1998-08-18 Inspection of printed circuit boards using color

Publications (2)

Publication Number Publication Date
DE69832102D1 true DE69832102D1 (de) 2005-12-01
DE69832102T2 DE69832102T2 (de) 2006-07-20

Family

ID=11062350

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69832102T Expired - Fee Related DE69832102T2 (de) 1998-08-18 1998-08-18 Inspektion von leiterplatten unter verwendung von farbe

Country Status (6)

Country Link
EP (1) EP1105716B1 (de)
CN (1) CN1188693C (de)
AU (1) AU8819998A (de)
DE (1) DE69832102T2 (de)
IL (1) IL141185A (de)
WO (1) WO2000011454A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE38559E1 (en) 1984-12-20 2004-07-27 Orbotech Ltd Automatic visual inspection system
USRE38716E1 (en) 1984-12-20 2005-03-22 Orbotech, Ltd. Automatic visual inspection system
IL131092A (en) 1999-07-25 2006-08-01 Orbotech Ltd Optical inspection system
IL131282A (en) 1999-08-05 2009-02-11 Orbotech Ltd Apparatus and methods for inspection of objects
IL133696A (en) 1999-12-23 2006-04-10 Orbotech Ltd Cam reference inspection of multi-color and contour images
CN1955717B (zh) 2000-09-10 2011-04-20 奥博泰克有限公司 Pcb检测中错误报警的减少
US7231080B2 (en) * 2001-02-13 2007-06-12 Orbotech Ltd. Multiple optical input inspection system
WO2002088688A1 (en) * 2001-05-02 2002-11-07 Teradyne, Inc. Inspection system using dynamically obtained values and related techniques
KR100557526B1 (ko) * 2003-05-19 2006-03-03 삼성전기주식회사 Rgb 컬러를 이용한 인쇄회로기판의 표면 상태 분석시스템 및 방법
JP2006024116A (ja) * 2004-07-09 2006-01-26 Dainippon Screen Mfg Co Ltd カラー画像の領域分割
CN103063167B (zh) * 2012-12-28 2015-11-18 江苏大学 一种自动判断激光清洗效果的方法
JP6348289B2 (ja) * 2014-01-31 2018-06-27 株式会社Screenホールディングス 検査装置および検査方法
WO2015200824A1 (en) * 2014-06-27 2015-12-30 Gu Chaokang Optical detection of electrolyte concentrations
CN107367465A (zh) * 2017-06-23 2017-11-21 华南理工大学 一种fpc柔性板铜箔氧化检测方法
CN108346148B (zh) * 2017-09-21 2022-03-25 华南理工大学 一种高密度柔性ic基板氧化区域检测系统及方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4650333A (en) * 1984-04-12 1987-03-17 International Business Machines Corporation System for measuring and detecting printed circuit wiring defects
US5085517A (en) * 1989-10-31 1992-02-04 Chadwick Curt H Automatic high speed optical inspection system
DE69331433T2 (de) * 1992-10-22 2002-10-02 Advanced Interconnection Tech Einrichtung zur automatischen optischen Prüfung von Leiterplatten mit darin verlegten Drähten

Also Published As

Publication number Publication date
EP1105716B1 (de) 2005-10-26
AU8819998A (en) 2000-03-14
CN1304488A (zh) 2001-07-18
IL141185A0 (en) 2002-02-10
WO2000011454A1 (en) 2000-03-02
IL141185A (en) 2005-05-17
CN1188693C (zh) 2005-02-09
EP1105716A1 (de) 2001-06-13
DE69832102T2 (de) 2006-07-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee