DE69722000D1 - Verfahren zur Verbesserung des Kontrasts von Bildern, welche durch Addition von gepulsten Teilbildern in ESPI-Technik erzeugt werden - Google Patents

Verfahren zur Verbesserung des Kontrasts von Bildern, welche durch Addition von gepulsten Teilbildern in ESPI-Technik erzeugt werden

Info

Publication number
DE69722000D1
DE69722000D1 DE69722000T DE69722000T DE69722000D1 DE 69722000 D1 DE69722000 D1 DE 69722000D1 DE 69722000 T DE69722000 T DE 69722000T DE 69722000 T DE69722000 T DE 69722000T DE 69722000 D1 DE69722000 D1 DE 69722000D1
Authority
DE
Germany
Prior art keywords
images
contrast
image
improving
generated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69722000T
Other languages
English (en)
Other versions
DE69722000T2 (de
Inventor
Massimo Facchini
Alfredo Carlo Lucia
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EUROP COMMUNITY BRUESSEL BRUXE
Original Assignee
EUROP COMMUNITY BRUESSEL BRUXE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EUROP COMMUNITY BRUESSEL BRUXE filed Critical EUROP COMMUNITY BRUESSEL BRUXE
Application granted granted Critical
Publication of DE69722000D1 publication Critical patent/DE69722000D1/de
Publication of DE69722000T2 publication Critical patent/DE69722000T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02022—Interferometers characterised by the beam path configuration contacting one object by grazing incidence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02012—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation
    • G01B9/02014—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation by using pulsed light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G01B9/02069—Synchronization of light source or manipulator and detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern
    • G01B9/02095—Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
DE69722000T 1997-11-04 1997-11-04 Verfahren zur Verbesserung des Kontrasts von Bildern, welche durch Addition von gepulsten Teilbildern in ESPI-Technik erzeugt werden Expired - Fee Related DE69722000T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP97830569A EP0915317B1 (de) 1997-11-04 1997-11-04 Verfahren zur Verbesserung des Kontrasts von Bildern, welche durch Addition von gepulsten Teilbildern in ESPI-Technik erzeugt werden

Publications (2)

Publication Number Publication Date
DE69722000D1 true DE69722000D1 (de) 2003-06-18
DE69722000T2 DE69722000T2 (de) 2004-02-26

Family

ID=8230841

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69722000T Expired - Fee Related DE69722000T2 (de) 1997-11-04 1997-11-04 Verfahren zur Verbesserung des Kontrasts von Bildern, welche durch Addition von gepulsten Teilbildern in ESPI-Technik erzeugt werden

Country Status (10)

Country Link
US (1) US6362873B1 (de)
EP (1) EP0915317B1 (de)
AT (1) ATE240502T1 (de)
CA (1) CA2306162A1 (de)
DE (1) DE69722000T2 (de)
DK (1) DK0915317T3 (de)
ES (1) ES2199337T3 (de)
NO (1) NO315535B1 (de)
PT (1) PT915317E (de)
WO (1) WO1999023446A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030075968A (ko) * 2002-03-22 2003-09-26 대우전자주식회사 이에스피아이장치에서 회전체 변형이나 진동을 측정하는장치
US7436504B2 (en) * 2003-09-10 2008-10-14 Shear Graphics, Llc Non-destructive testing and imaging
US7187437B2 (en) * 2003-09-10 2007-03-06 Shearographics, Llc Plurality of light sources for inspection apparatus and method
US6934018B2 (en) * 2003-09-10 2005-08-23 Shearographics, Llc Tire inspection apparatus and method
US8969969B2 (en) * 2009-03-20 2015-03-03 International Business Machines Corporation High threshold voltage NMOS transistors for low power IC technology
KR101853018B1 (ko) 2011-08-04 2018-05-02 한국전자통신연구원 폐루프 타입의 위상 보정기능을 갖는 광 위상 추출 시스템 및 그에 따른 3차원 이미지 추출 방법
US10206576B2 (en) * 2014-09-10 2019-02-19 Samsung Electronics Co., Ltd. Laser speckle interferometric system and method for mobile devices
DE102021129555A1 (de) 2021-11-12 2023-05-17 Carl Zeiss Ag Weitfeld-Swept-Source-OCT und -Verfahren für bewegte Objekte

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6076604A (ja) * 1983-10-03 1985-05-01 Rikagaku Kenkyusho 位相変調スペックル干渉計による粗面物体の変形測定法および測定装置
GB8820761D0 (en) * 1988-09-02 1988-10-05 Tyrer J R Interferometry
US5481356A (en) * 1994-04-25 1996-01-02 Northwestern University Apparatus and method for nondestructive testing using additive-subtractive phase-modulated interferometry

Also Published As

Publication number Publication date
ATE240502T1 (de) 2003-05-15
EP0915317B1 (de) 2003-05-14
DE69722000T2 (de) 2004-02-26
NO315535B1 (no) 2003-09-15
CA2306162A1 (en) 1999-05-14
ES2199337T3 (es) 2004-02-16
EP0915317A1 (de) 1999-05-12
PT915317E (pt) 2003-09-30
US6362873B1 (en) 2002-03-26
WO1999023446A1 (en) 1999-05-14
NO20002305D0 (no) 2000-04-28
DK0915317T3 (da) 2003-09-15
NO20002305L (no) 2000-07-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee