PT915317E - Processo para melhorar o contraste de imagens obtidas com a utilizacao da tecnica espi com adicao de imagens obtidas por comando por impulsos - Google Patents

Processo para melhorar o contraste de imagens obtidas com a utilizacao da tecnica espi com adicao de imagens obtidas por comando por impulsos

Info

Publication number
PT915317E
PT915317E PT97830569T PT97830569T PT915317E PT 915317 E PT915317 E PT 915317E PT 97830569 T PT97830569 T PT 97830569T PT 97830569 T PT97830569 T PT 97830569T PT 915317 E PT915317 E PT 915317E
Authority
PT
Portugal
Prior art keywords
images obtained
contrast
image
impulses
command
Prior art date
Application number
PT97830569T
Other languages
English (en)
Inventor
Alfredo Carlo Lucia
Massimo Facchini
Original Assignee
Europ Economic Community
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Europ Economic Community filed Critical Europ Economic Community
Publication of PT915317E publication Critical patent/PT915317E/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02015Interferometers characterised by the beam path configuration
    • G01B9/02022Interferometers characterised by the beam path configuration contacting one object by grazing incidence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02001Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02012Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation
    • G01B9/02014Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation by using pulsed light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062Active error reduction, i.e. varying with time
    • G01B9/02067Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G01B9/02069Synchronization of light source or manipulator and detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02094Speckle interferometers, i.e. for detecting changes in speckle pattern
    • G01B9/02095Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Ultra Sonic Daignosis Equipment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
PT97830569T 1997-11-04 1997-11-04 Processo para melhorar o contraste de imagens obtidas com a utilizacao da tecnica espi com adicao de imagens obtidas por comando por impulsos PT915317E (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP97830569A EP0915317B1 (en) 1997-11-04 1997-11-04 Method of improving the contrast of images obtained using the pulsed image-addition ESPI technique

Publications (1)

Publication Number Publication Date
PT915317E true PT915317E (pt) 2003-09-30

Family

ID=8230841

Family Applications (1)

Application Number Title Priority Date Filing Date
PT97830569T PT915317E (pt) 1997-11-04 1997-11-04 Processo para melhorar o contraste de imagens obtidas com a utilizacao da tecnica espi com adicao de imagens obtidas por comando por impulsos

Country Status (10)

Country Link
US (1) US6362873B1 (pt)
EP (1) EP0915317B1 (pt)
AT (1) ATE240502T1 (pt)
CA (1) CA2306162A1 (pt)
DE (1) DE69722000T2 (pt)
DK (1) DK0915317T3 (pt)
ES (1) ES2199337T3 (pt)
NO (1) NO315535B1 (pt)
PT (1) PT915317E (pt)
WO (1) WO1999023446A1 (pt)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030075968A (ko) * 2002-03-22 2003-09-26 대우전자주식회사 이에스피아이장치에서 회전체 변형이나 진동을 측정하는장치
US7187437B2 (en) * 2003-09-10 2007-03-06 Shearographics, Llc Plurality of light sources for inspection apparatus and method
US7436504B2 (en) * 2003-09-10 2008-10-14 Shear Graphics, Llc Non-destructive testing and imaging
US6934018B2 (en) * 2003-09-10 2005-08-23 Shearographics, Llc Tire inspection apparatus and method
US8969969B2 (en) 2009-03-20 2015-03-03 International Business Machines Corporation High threshold voltage NMOS transistors for low power IC technology
KR101853018B1 (ko) 2011-08-04 2018-05-02 한국전자통신연구원 폐루프 타입의 위상 보정기능을 갖는 광 위상 추출 시스템 및 그에 따른 3차원 이미지 추출 방법
US10206576B2 (en) * 2014-09-10 2019-02-19 Samsung Electronics Co., Ltd. Laser speckle interferometric system and method for mobile devices
DE102021129555A1 (de) 2021-11-12 2023-05-17 Carl Zeiss Ag Weitfeld-Swept-Source-OCT und -Verfahren für bewegte Objekte

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6076604A (ja) * 1983-10-03 1985-05-01 Rikagaku Kenkyusho 位相変調スペックル干渉計による粗面物体の変形測定法および測定装置
GB8820761D0 (en) * 1988-09-02 1988-10-05 Tyrer J R Interferometry
US5481356A (en) * 1994-04-25 1996-01-02 Northwestern University Apparatus and method for nondestructive testing using additive-subtractive phase-modulated interferometry

Also Published As

Publication number Publication date
DK0915317T3 (da) 2003-09-15
EP0915317A1 (en) 1999-05-12
EP0915317B1 (en) 2003-05-14
ATE240502T1 (de) 2003-05-15
US6362873B1 (en) 2002-03-26
NO20002305D0 (no) 2000-04-28
CA2306162A1 (en) 1999-05-14
DE69722000D1 (de) 2003-06-18
ES2199337T3 (es) 2004-02-16
NO20002305L (no) 2000-07-03
NO315535B1 (no) 2003-09-15
DE69722000T2 (de) 2004-02-26
WO1999023446A1 (en) 1999-05-14

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