PT915317E - Processo para melhorar o contraste de imagens obtidas com a utilizacao da tecnica espi com adicao de imagens obtidas por comando por impulsos - Google Patents
Processo para melhorar o contraste de imagens obtidas com a utilizacao da tecnica espi com adicao de imagens obtidas por comando por impulsosInfo
- Publication number
- PT915317E PT915317E PT97830569T PT97830569T PT915317E PT 915317 E PT915317 E PT 915317E PT 97830569 T PT97830569 T PT 97830569T PT 97830569 T PT97830569 T PT 97830569T PT 915317 E PT915317 E PT 915317E
- Authority
- PT
- Portugal
- Prior art keywords
- images obtained
- contrast
- image
- impulses
- command
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02022—Interferometers characterised by the beam path configuration contacting one object by grazing incidence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02012—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation
- G01B9/02014—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation by using pulsed light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02062—Active error reduction, i.e. varying with time
- G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
- G01B9/02069—Synchronization of light source or manipulator and detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02094—Speckle interferometers, i.e. for detecting changes in speckle pattern
- G01B9/02095—Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Ultra Sonic Daignosis Equipment (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
- Magnetic Resonance Imaging Apparatus (AREA)
- Medicines Containing Antibodies Or Antigens For Use As Internal Diagnostic Agents (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP97830569A EP0915317B1 (en) | 1997-11-04 | 1997-11-04 | Method of improving the contrast of images obtained using the pulsed image-addition ESPI technique |
Publications (1)
Publication Number | Publication Date |
---|---|
PT915317E true PT915317E (pt) | 2003-09-30 |
Family
ID=8230841
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PT97830569T PT915317E (pt) | 1997-11-04 | 1997-11-04 | Processo para melhorar o contraste de imagens obtidas com a utilizacao da tecnica espi com adicao de imagens obtidas por comando por impulsos |
Country Status (10)
Country | Link |
---|---|
US (1) | US6362873B1 (pt) |
EP (1) | EP0915317B1 (pt) |
AT (1) | ATE240502T1 (pt) |
CA (1) | CA2306162A1 (pt) |
DE (1) | DE69722000T2 (pt) |
DK (1) | DK0915317T3 (pt) |
ES (1) | ES2199337T3 (pt) |
NO (1) | NO315535B1 (pt) |
PT (1) | PT915317E (pt) |
WO (1) | WO1999023446A1 (pt) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20030075968A (ko) * | 2002-03-22 | 2003-09-26 | 대우전자주식회사 | 이에스피아이장치에서 회전체 변형이나 진동을 측정하는장치 |
US7187437B2 (en) * | 2003-09-10 | 2007-03-06 | Shearographics, Llc | Plurality of light sources for inspection apparatus and method |
US7436504B2 (en) * | 2003-09-10 | 2008-10-14 | Shear Graphics, Llc | Non-destructive testing and imaging |
US6934018B2 (en) * | 2003-09-10 | 2005-08-23 | Shearographics, Llc | Tire inspection apparatus and method |
US8969969B2 (en) | 2009-03-20 | 2015-03-03 | International Business Machines Corporation | High threshold voltage NMOS transistors for low power IC technology |
KR101853018B1 (ko) | 2011-08-04 | 2018-05-02 | 한국전자통신연구원 | 폐루프 타입의 위상 보정기능을 갖는 광 위상 추출 시스템 및 그에 따른 3차원 이미지 추출 방법 |
US10206576B2 (en) * | 2014-09-10 | 2019-02-19 | Samsung Electronics Co., Ltd. | Laser speckle interferometric system and method for mobile devices |
DE102021129555A1 (de) | 2021-11-12 | 2023-05-17 | Carl Zeiss Ag | Weitfeld-Swept-Source-OCT und -Verfahren für bewegte Objekte |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6076604A (ja) * | 1983-10-03 | 1985-05-01 | Rikagaku Kenkyusho | 位相変調スペックル干渉計による粗面物体の変形測定法および測定装置 |
GB8820761D0 (en) * | 1988-09-02 | 1988-10-05 | Tyrer J R | Interferometry |
US5481356A (en) * | 1994-04-25 | 1996-01-02 | Northwestern University | Apparatus and method for nondestructive testing using additive-subtractive phase-modulated interferometry |
-
1997
- 1997-11-04 DE DE69722000T patent/DE69722000T2/de not_active Expired - Fee Related
- 1997-11-04 EP EP97830569A patent/EP0915317B1/en not_active Expired - Lifetime
- 1997-11-04 AT AT97830569T patent/ATE240502T1/de not_active IP Right Cessation
- 1997-11-04 DK DK97830569T patent/DK0915317T3/da active
- 1997-11-04 PT PT97830569T patent/PT915317E/pt unknown
- 1997-11-04 ES ES97830569T patent/ES2199337T3/es not_active Expired - Lifetime
-
1998
- 1998-11-03 CA CA002306162A patent/CA2306162A1/en not_active Abandoned
- 1998-11-03 WO PCT/EP1998/006949 patent/WO1999023446A1/en active Application Filing
-
2000
- 2000-04-11 US US09/547,352 patent/US6362873B1/en not_active Expired - Fee Related
- 2000-04-28 NO NO20002305A patent/NO315535B1/no unknown
Also Published As
Publication number | Publication date |
---|---|
DK0915317T3 (da) | 2003-09-15 |
EP0915317A1 (en) | 1999-05-12 |
EP0915317B1 (en) | 2003-05-14 |
ATE240502T1 (de) | 2003-05-15 |
US6362873B1 (en) | 2002-03-26 |
NO20002305D0 (no) | 2000-04-28 |
CA2306162A1 (en) | 1999-05-14 |
DE69722000D1 (de) | 2003-06-18 |
ES2199337T3 (es) | 2004-02-16 |
NO20002305L (no) | 2000-07-03 |
NO315535B1 (no) | 2003-09-15 |
DE69722000T2 (de) | 2004-02-26 |
WO1999023446A1 (en) | 1999-05-14 |
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