DE69702205D1 - Kontakt mikroradiographie zur charakterisierung von dotierten optischen fasern - Google Patents

Kontakt mikroradiographie zur charakterisierung von dotierten optischen fasern

Info

Publication number
DE69702205D1
DE69702205D1 DE69702205T DE69702205T DE69702205D1 DE 69702205 D1 DE69702205 D1 DE 69702205D1 DE 69702205 T DE69702205 T DE 69702205T DE 69702205 T DE69702205 T DE 69702205T DE 69702205 D1 DE69702205 D1 DE 69702205D1
Authority
DE
Germany
Prior art keywords
microadiography
characterizing
contact
optical fibers
doped optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69702205T
Other languages
English (en)
Other versions
DE69702205T2 (de
Inventor
Claudio Savoia
Marziale Milani
Emilia Sottocasa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
STMicroelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SRL filed Critical STMicroelectronics SRL
Application granted granted Critical
Publication of DE69702205D1 publication Critical patent/DE69702205D1/de
Publication of DE69702205T2 publication Critical patent/DE69702205T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Biochemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Lasers (AREA)
  • Optical Fibers, Optical Fiber Cores, And Optical Fiber Bundles (AREA)
DE69702205T 1996-09-23 1997-09-19 Kontakt mikroradiographie zur charakterisierung von dotierten optischen fasern Expired - Fee Related DE69702205T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT96VA000018A IT1288481B1 (it) 1996-09-23 1996-09-23 Caratterizzazione microscopica di fibre ottiche drogate
PCT/IT1997/000229 WO1998012544A1 (en) 1996-09-23 1997-09-19 Contact macroradiography characterization of doped optical fibers

Publications (2)

Publication Number Publication Date
DE69702205D1 true DE69702205D1 (de) 2000-07-06
DE69702205T2 DE69702205T2 (de) 2000-10-12

Family

ID=11423383

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69702205T Expired - Fee Related DE69702205T2 (de) 1996-09-23 1997-09-19 Kontakt mikroradiographie zur charakterisierung von dotierten optischen fasern

Country Status (7)

Country Link
US (1) US6178222B1 (de)
EP (1) EP0927349B1 (de)
JP (1) JP2001503136A (de)
CN (1) CN1163740C (de)
DE (1) DE69702205T2 (de)
IT (1) IT1288481B1 (de)
WO (1) WO1998012544A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19837490A1 (de) * 1998-08-12 2000-02-17 Inst Halbleiterphysik Gmbh Verfahren zur Vermessung der zweidimensionalen Potentialverteilung in CMOS-Halbleiterbauelementen und Bestimmung der zweidimensionalen Dotierverteilung
JP2014071071A (ja) * 2012-10-01 2014-04-21 Sumitomo Electric Ind Ltd 光学分析方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4616901A (en) * 1982-04-09 1986-10-14 At&T Bell Laboratories Doped optical fiber
US5093572A (en) * 1989-11-02 1992-03-03 Mitsubishi Denki Kabushiki Kaisha Scanning electron microscope for observation of cross section and method of observing cross section employing the same
US5520769A (en) * 1994-12-07 1996-05-28 Advanced Micro Devices, Inc. Method for measuring concentration of dopant within a semiconductor substrate
US5778042A (en) * 1996-07-18 1998-07-07 University Of Hawaii Method of soft x-ray imaging

Also Published As

Publication number Publication date
IT1288481B1 (it) 1998-09-22
ITVA960018A1 (it) 1998-03-23
US6178222B1 (en) 2001-01-23
CN1231727A (zh) 1999-10-13
ITVA960018A0 (it) 1996-09-23
JP2001503136A (ja) 2001-03-06
WO1998012544A1 (en) 1998-03-26
CN1163740C (zh) 2004-08-25
EP0927349B1 (de) 2000-05-31
EP0927349A1 (de) 1999-07-07
DE69702205T2 (de) 2000-10-12

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee