DE69632137D1 - FILAMENT FOR INFRARED RADIATION AND PRODUCTION METHOD - Google Patents

FILAMENT FOR INFRARED RADIATION AND PRODUCTION METHOD

Info

Publication number
DE69632137D1
DE69632137D1 DE69632137T DE69632137T DE69632137D1 DE 69632137 D1 DE69632137 D1 DE 69632137D1 DE 69632137 T DE69632137 T DE 69632137T DE 69632137 T DE69632137 T DE 69632137T DE 69632137 D1 DE69632137 D1 DE 69632137D1
Authority
DE
Germany
Prior art keywords
filament
production method
infrared radiation
infrared
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69632137T
Other languages
German (de)
Other versions
DE69632137T2 (en
Inventor
Edward A Johnson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of DE69632137D1 publication Critical patent/DE69632137D1/en
Application granted granted Critical
Publication of DE69632137T2 publication Critical patent/DE69632137T2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B2203/00—Aspects relating to Ohmic resistive heating covered by group H05B3/00
    • H05B2203/002—Heaters using a particular layout for the resistive material or resistive elements
    • H05B2203/003—Heaters using a particular layout for the resistive material or resistive elements using serpentine layout

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Physical Or Chemical Processes And Apparatus (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE69632137T 1995-08-03 1996-08-02 FILAMENT FOR INFRARED RADIATION AND MANUFACTURING PROCESS Expired - Lifetime DE69632137T2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US51107095A 1995-08-03 1995-08-03
US511070 1995-08-03
PCT/US1996/012604 WO1997006417A1 (en) 1995-08-03 1996-08-02 Infrared radiation filament and method of manufacture

Publications (2)

Publication Number Publication Date
DE69632137D1 true DE69632137D1 (en) 2004-05-13
DE69632137T2 DE69632137T2 (en) 2005-04-14

Family

ID=24033344

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69632137T Expired - Lifetime DE69632137T2 (en) 1995-08-03 1996-08-02 FILAMENT FOR INFRARED RADIATION AND MANUFACTURING PROCESS

Country Status (6)

Country Link
US (2) US5838016A (en)
EP (1) EP0842404B1 (en)
AU (1) AU6764696A (en)
DE (1) DE69632137T2 (en)
NO (1) NO980440L (en)
WO (1) WO1997006417A1 (en)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7119337B1 (en) 1997-08-04 2006-10-10 Ion Optics, Inc. Infrared radiation sources, sensors and source combinations, and methods of manufacture
AU6764696A (en) * 1995-08-03 1997-03-05 Edward A. Johnson Infrared radiation filament and method of manufacture
WO1999022551A1 (en) * 1997-10-27 1999-05-06 Heraeus Noblelight Gmbh Infra red spheroidal radiation emitter
US5939726A (en) * 1997-12-11 1999-08-17 Cal-Sensors, Inc. Infrared radiation source
AU748350B2 (en) * 1998-07-17 2002-06-06 Kanstad Teknologi As Infrared radiation source and its application for gas measurement
NO312860B1 (en) 1998-07-17 2002-07-08 Kanstad Teknologi As Method for forming and fastening a thin, pulse-heated body
EP1101391A4 (en) * 1998-07-30 2005-01-19 Ion Optics Inc Infrared radiation sources, sensors and source combinations, and methods of manufacture
RU2181571C2 (en) * 1999-03-18 2002-04-27 Закрытое акционерное общество "LC" Device and method for performing therapeutic and cosmetic phototreatment of biological tissue
US6756594B2 (en) 2000-01-28 2004-06-29 California Institute Of Technology Micromachined tuned-band hot bolometer emitter
US7280749B2 (en) * 2001-02-12 2007-10-09 Ion Optics, Inc. Filament for radiation source
US6844553B2 (en) * 2001-02-22 2005-01-18 Ion Optics, Inc. Absorption spectroscopy apparatus and method
US6611085B1 (en) 2001-08-27 2003-08-26 Sandia Corporation Photonically engineered incandescent emitter
GB0205484D0 (en) * 2002-03-08 2002-04-24 Bae Systems Plc Improvements in or relating to the calibration of infra red cameras
US6933508B2 (en) * 2002-03-13 2005-08-23 Applied Materials, Inc. Method of surface texturizing
US6812471B2 (en) * 2002-03-13 2004-11-02 Applied Materials, Inc. Method of surface texturizing
US20030209669A1 (en) * 2002-05-09 2003-11-13 Chou Bruce C. S. Miniaturized infrared gas analyzing apparatus
US6963071B2 (en) * 2002-11-25 2005-11-08 Intel Corporation Debris mitigation device
US20040182847A1 (en) * 2003-02-17 2004-09-23 Kazuaki Ohkubo Radiation source for gas sensor
US7122815B2 (en) * 2003-05-27 2006-10-17 Wood Donald S Infrared radiation emitter
US7009193B2 (en) * 2003-10-31 2006-03-07 Infineon Technologies Richmond, Lp Utilization of an ion gauge in the process chamber of a semiconductor ion implanter
JP4877451B2 (en) * 2004-01-23 2012-02-15 セイコーエプソン株式会社 Piezoelectric element manufacturing method and liquid jet head
WO2006007446A2 (en) * 2004-06-17 2006-01-19 Ion Optics, Inc. Photonic crystal emitter, detector, and sensor
EP1779444A4 (en) * 2004-07-08 2011-01-05 Ion Optics Inc Tunable photonic crystal
US7227162B2 (en) * 2005-02-11 2007-06-05 Bae Systems Information And Electronic Systems Integration Inc. Method and apparatus for providing tuning of spectral output for countermeasure devices
US20060292310A1 (en) * 2005-06-27 2006-12-28 Applied Materials, Inc. Process kit design to reduce particle generation
KR100706788B1 (en) * 2005-11-17 2007-04-12 삼성전자주식회사 Filament member and ion source of an ion implantation apparatus having the filament member
US8508128B2 (en) * 2007-11-01 2013-08-13 Elta Systems Ltd. System for providing thermal energy radiation detectable by a thermal imaging unit
JP5345333B2 (en) * 2008-03-31 2013-11-20 Ｈｏｙａ株式会社 Photomask blank, photomask and manufacturing method thereof
WO2010103123A1 (en) * 2009-03-13 2010-09-16 Siemens Aktiengesellschaft Infrared radiator arrangement for a gas analysis device
WO2016142864A1 (en) * 2015-03-09 2016-09-15 Alliance For Sustainable Energy, Llc Batch and continuous methods for evaluating the physical and thermal properties of films
US10181433B2 (en) 2017-03-10 2019-01-15 Microsoft Technology Licensing, Llc Apparatus and method of tunable heat sink

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3875413A (en) * 1973-10-09 1975-04-01 Hewlett Packard Co Infrared radiation source
NO149679C (en) * 1982-02-22 1984-05-30 Nordal Per Erik DEVICE FOR INFRARED RADIO SOURCE
DE3437397A1 (en) * 1984-10-12 1986-04-17 Drägerwerk AG, 2400 Lübeck INFRARED RADIANT
US4859858A (en) * 1986-12-04 1989-08-22 Cascadia Technology Corporation Gas analyzers
US5128514A (en) * 1987-07-31 1992-07-07 Siemens Aktiengesellschaft Black radiator for use as an emitter in calibratable gas sensors
US4922116A (en) * 1988-08-04 1990-05-01 Hughes Aircraft Company Flicker free infrared simulator with resistor bridges
NO170366C (en) * 1989-05-26 1997-02-10 Kanstad Teknologi As Pulsed infrared radiation source
US5074490A (en) * 1989-12-15 1991-12-24 Texas Instruments Incorporated Carrier tracking system
GB2248141A (en) * 1990-09-18 1992-03-25 Servomex Infra-red source
US5152870A (en) * 1991-01-22 1992-10-06 General Electric Company Method for producing lamp filaments of increased radiative efficiency
AU6764696A (en) * 1995-08-03 1997-03-05 Edward A. Johnson Infrared radiation filament and method of manufacture
US5602398A (en) * 1995-12-22 1997-02-11 Pryon Corporation Nondispersive infrared radiation source

Also Published As

Publication number Publication date
US5838016A (en) 1998-11-17
WO1997006417A1 (en) 1997-02-20
AU6764696A (en) 1997-03-05
US6249005B1 (en) 2001-06-19
DE69632137T2 (en) 2005-04-14
NO980440D0 (en) 1998-02-02
EP0842404A1 (en) 1998-05-20
EP0842404A4 (en) 1999-11-03
NO980440L (en) 1998-03-26
EP0842404B1 (en) 2004-04-07

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Legal Events

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8364 No opposition during term of opposition