DE69630025D1 - Kontrolle eines Infrarotmikroskops - Google Patents

Kontrolle eines Infrarotmikroskops

Info

Publication number
DE69630025D1
DE69630025D1 DE69630025T DE69630025T DE69630025D1 DE 69630025 D1 DE69630025 D1 DE 69630025D1 DE 69630025 T DE69630025 T DE 69630025T DE 69630025 T DE69630025 T DE 69630025T DE 69630025 D1 DE69630025 D1 DE 69630025D1
Authority
DE
Germany
Prior art keywords
control
infrared microscope
microscope
infrared
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69630025T
Other languages
English (en)
Other versions
DE69630025T2 (de
Inventor
Ralph Lance Carter
Simon Adrian Wells
David Robert Clark
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Ltd
Original Assignee
PerkinElmer Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Ltd filed Critical PerkinElmer Ltd
Application granted granted Critical
Publication of DE69630025D1 publication Critical patent/DE69630025D1/de
Publication of DE69630025T2 publication Critical patent/DE69630025T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Microscoopes, Condenser (AREA)
DE69630025T 1996-07-16 1996-07-16 Kontrolle eines Infrarotmikroskops Expired - Lifetime DE69630025T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP96305198A EP0819963B1 (de) 1996-07-16 1996-07-16 Kontrolle eines Infrarotmikroskops

Publications (2)

Publication Number Publication Date
DE69630025D1 true DE69630025D1 (de) 2003-10-23
DE69630025T2 DE69630025T2 (de) 2004-04-01

Family

ID=8225012

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69630025T Expired - Lifetime DE69630025T2 (de) 1996-07-16 1996-07-16 Kontrolle eines Infrarotmikroskops

Country Status (3)

Country Link
EP (1) EP0819963B1 (de)
JP (1) JP4035206B2 (de)
DE (1) DE69630025T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9801636D0 (en) * 1998-01-27 1998-03-25 Reilly Peter J Microscope control
JP3322227B2 (ja) * 1998-12-10 2002-09-09 株式会社島津製作所 赤外顕微鏡
WO2001073374A1 (de) * 2000-03-27 2001-10-04 Buechler Roman Messmikroskop
EP1164406B1 (de) * 2000-06-17 2019-04-17 Leica Microsystems CMS GmbH Verfahren und Vorrichtung zur Beleuchtung eines Objekts
DE10115589B4 (de) * 2000-06-17 2020-07-30 Leica Microsystems Cms Gmbh Konfokales Scanmikroskop
CN101975987B (zh) * 2010-09-27 2012-11-07 江苏大学 基于便携桥搭结构的显微镜自动控制台
JP6082557B2 (ja) * 2012-09-28 2017-02-15 グローリー株式会社 スペクトルセンサの光学系調整方法及び光学系調整装置並びに紙葉類識別装置
CN105005140B (zh) * 2015-07-28 2018-03-09 苏州南光电子科技有限公司 一种显微镜载物台的标本固定器自动控制系统
DE202016102771U1 (de) 2016-05-24 2016-08-03 Andreas Gerzen Mikroskopheizsystem
CN110715616B (zh) * 2019-10-14 2021-09-07 中国科学院光电技术研究所 一种基于聚焦评价算法的结构光微纳三维形貌测量方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4202037A (en) * 1977-04-22 1980-05-06 Der Loos Hendrik Van Computer microscope apparatus and method for superimposing an electronically-produced image from the computer memory upon the image in the microscope's field of view
US4672559A (en) * 1984-12-26 1987-06-09 E. I. Du Pont De Nemours And Company Method for operating a microscopical mapping system
US5216596A (en) * 1987-04-30 1993-06-01 Corabi International Telemetrics, Inc. Telepathology diagnostic network
JPH0245734A (ja) * 1988-08-05 1990-02-15 Mitsubishi Heavy Ind Ltd 自動組織解析処理装置
JP2925647B2 (ja) * 1990-04-16 1999-07-28 オリンパス光学工業株式会社 顕微鏡変倍装置

Also Published As

Publication number Publication date
EP0819963B1 (de) 2003-09-17
DE69630025T2 (de) 2004-04-01
JP4035206B2 (ja) 2008-01-16
EP0819963A1 (de) 1998-01-21
JPH10104158A (ja) 1998-04-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition