DE69617919D1 - Speichergerät mit getakteter Spaltenredundanz - Google Patents

Speichergerät mit getakteter Spaltenredundanz

Info

Publication number
DE69617919D1
DE69617919D1 DE69617919T DE69617919T DE69617919D1 DE 69617919 D1 DE69617919 D1 DE 69617919D1 DE 69617919 T DE69617919 T DE 69617919T DE 69617919 T DE69617919 T DE 69617919T DE 69617919 D1 DE69617919 D1 DE 69617919D1
Authority
DE
Germany
Prior art keywords
clocked
storage device
column redundancy
redundancy
column
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69617919T
Other languages
English (en)
Other versions
DE69617919T2 (de
Inventor
Luigi Pascucci
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
STMicroelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SRL filed Critical STMicroelectronics SRL
Publication of DE69617919D1 publication Critical patent/DE69617919D1/de
Application granted granted Critical
Publication of DE69617919T2 publication Critical patent/DE69617919T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/808—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a flexible replacement scheme
DE69617919T 1996-06-06 1996-06-06 Speichergerät mit getakteter Spaltenredundanz Expired - Fee Related DE69617919T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP96830325A EP0811919B1 (de) 1996-06-06 1996-06-06 Speichergerät mit getakteter Spaltenredundanz

Publications (2)

Publication Number Publication Date
DE69617919D1 true DE69617919D1 (de) 2002-01-24
DE69617919T2 DE69617919T2 (de) 2002-08-08

Family

ID=8225931

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69617919T Expired - Fee Related DE69617919T2 (de) 1996-06-06 1996-06-06 Speichergerät mit getakteter Spaltenredundanz

Country Status (3)

Country Link
US (1) US5831915A (de)
EP (1) EP0811919B1 (de)
DE (1) DE69617919T2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6240525B1 (en) * 1998-11-17 2001-05-29 Oak Technology, Inc. Method and apparatus for re-addressing defective memory cells
EP1178491A1 (de) * 2000-08-02 2002-02-06 STMicroelectronics S.r.l. Halbleiterspeicher
US6928377B2 (en) * 2003-09-09 2005-08-09 International Business Machines Corporation Self-test architecture to implement data column redundancy in a RAM
US9953725B2 (en) * 2012-02-29 2018-04-24 Samsung Electronics Co., Ltd. Semiconductor memory devices and methods of operating the same

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0257120B1 (de) * 1986-08-22 1992-06-10 International Business Machines Corporation Dekodierverfahren und -Schaltungsanordnung für einen redundanten CMOS-Halbleiterspeicher
US5708601A (en) * 1993-12-09 1998-01-13 Sgs-Thomson Microelectronics S.R.L. Integrated circuitry for checking the utilization rate of redundancy memory elements in a semiconductor memory device
DE69412230T2 (de) * 1994-02-17 1999-04-08 Sgs Thomson Microelectronics Verfahren zur Programmierung von Redundanzregistern in einer Spaltenredundanzschaltung für einen Halbleiterspeicherbaustein

Also Published As

Publication number Publication date
EP0811919A1 (de) 1997-12-10
US5831915A (en) 1998-11-03
DE69617919T2 (de) 2002-08-08
EP0811919B1 (de) 2001-12-12

Similar Documents

Publication Publication Date Title
DE59701944D1 (de) Lagervorrichtung
DE69703540D1 (de) Speichervorrichtungen
DE69518693T2 (de) Speichervorrichtung
DE69408585T2 (de) Lagervorrichtung
DE19581764T1 (de) Speichereinrichtung
DE69705118T2 (de) Speichervorrichtungsfolgeschaltung
DE69718896T2 (de) Halbleiterspeicheranordnung mit Redundanz
DE69702657D1 (de) Speicheranordnung
DE69505661D1 (de) Speichereinrichtung
DE69618928D1 (de) Halbleiterspeichergerät mit Zeilenredundanz
DE69525637D1 (de) Speichervorrichtung
DE69430890D1 (de) Halbleiterspeichergerät mit Redundanz
DE69722703D1 (de) Speichervorrichtung
DE59703299D1 (de) Redundanzspeichervorrichtung mit rom-speicherzellen
DE59807587D1 (de) Speichervorrichtung
DE59801600D1 (de) Bevorratungsvorrichtung
DE69617919D1 (de) Speichergerät mit getakteter Spaltenredundanz
DE69725131D1 (de) Kurbelwellenlagerung
DE69518660D1 (de) Lagervorrichtung
DE9401555U1 (de) Aufbewahrungsvorrichtung
DE29707932U1 (de) Lagerungsvorrichtung
DE69420363D1 (de) Speichervorrichtung
DE29715441U1 (de) Bootslagervorrichtung
DE69731900D1 (de) Aufbewahrungseinheit
ATA183896A (de) Schichtenspeicheranordnung

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee