DE69606515T2 - Elektrostatisch-magnetische Linsenanordnung - Google Patents
Elektrostatisch-magnetische LinsenanordnungInfo
- Publication number
- DE69606515T2 DE69606515T2 DE69606515T DE69606515T DE69606515T2 DE 69606515 T2 DE69606515 T2 DE 69606515T2 DE 69606515 T DE69606515 T DE 69606515T DE 69606515 T DE69606515 T DE 69606515T DE 69606515 T2 DE69606515 T2 DE 69606515T2
- Authority
- DE
- Germany
- Prior art keywords
- electrostatic
- lens arrangement
- magnetic lens
- magnetic
- arrangement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Revoked
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/10—Lenses
- H01J37/145—Combinations of electrostatic and magnetic lenses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/25—Tubes for localised analysis using electron or ion beams
- H01J2237/2505—Tubes for localised analysis using electron or ion beams characterised by their application
- H01J2237/2594—Measuring electric fields or potentials
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE69606515T DE69606515T2 (de) | 1996-02-16 | 1996-07-03 | Elektrostatisch-magnetische Linsenanordnung |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19605855A DE19605855A1 (de) | 1996-02-16 | 1996-02-16 | Detektorobjektiv für Korpuskularstrahlgeräte |
DE69606515T DE69606515T2 (de) | 1996-02-16 | 1996-07-03 | Elektrostatisch-magnetische Linsenanordnung |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69606515D1 DE69606515D1 (de) | 2000-03-09 |
DE69606515T2 true DE69606515T2 (de) | 2000-06-15 |
Family
ID=7785635
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19605855A Withdrawn DE19605855A1 (de) | 1996-02-16 | 1996-02-16 | Detektorobjektiv für Korpuskularstrahlgeräte |
DE69606515T Revoked DE69606515T2 (de) | 1996-02-16 | 1996-07-03 | Elektrostatisch-magnetische Linsenanordnung |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19605855A Withdrawn DE19605855A1 (de) | 1996-02-16 | 1996-02-16 | Detektorobjektiv für Korpuskularstrahlgeräte |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP0790634B1 (de) |
DE (2) | DE19605855A1 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE59711915D1 (de) * | 1997-09-29 | 2004-10-21 | Advantest Corp | Objektivlinse |
WO1999046797A1 (de) | 1998-03-10 | 1999-09-16 | Erik Essers | Rasterelektronenmikroskop |
DE19845329C2 (de) * | 1998-03-10 | 2001-09-27 | Erik Essers | Rasterelektronenmikroskop |
EP0989583A1 (de) | 1998-09-25 | 2000-03-29 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Verfahren und Vorrichtung zur Fokusierung eines Ladungsträgerstrahls |
EP1022766B1 (de) * | 1998-11-30 | 2004-02-04 | Advantest Corporation | Teilchenstrahlgerät |
DE60236302D1 (de) * | 2002-12-17 | 2010-06-17 | Integrated Circuit Testing | Mehrachsige Verbundlinse, Strahlvorrichtung und Verfahren zur Anwendung dieser kombinierten Linse |
DE10317894B9 (de) | 2003-04-17 | 2007-03-22 | Leo Elektronenmikroskopie Gmbh | Fokussiersystem für geladene Teilchen, Elektronenmikroskopiesystem und Elektronenmikroskopieverfahren |
EP2629317B1 (de) | 2012-02-20 | 2015-01-28 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Teilchenstrahlvorrichtung mit dynamischem Fokus und Verfahren zu deren Betrieb |
US10504684B1 (en) * | 2018-07-12 | 2019-12-10 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | High performance inspection scanning electron microscope device and method of operating the same |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2922325A1 (de) * | 1979-06-01 | 1980-12-11 | Philips Patentverwaltung | Rasterelektronenmikroskop |
ATE91822T1 (de) * | 1986-04-24 | 1993-08-15 | Integrated Circuit Testing | Elektrostatisch-magnetische-linse fuer korpuskularstrahlgeraete. |
NL8602177A (nl) * | 1986-08-27 | 1988-03-16 | Philips Nv | Electronen detectie met energie discriminatie. |
DE3766092D1 (de) * | 1986-12-12 | 1990-12-13 | Integrated Circuit Testing | Detektoranordnung mit einem detektorobjektiv fuer korpuskularstrahlgeraete. |
JPH0636346B2 (ja) * | 1988-03-09 | 1994-05-11 | セイコー電子工業株式会社 | 荷電粒子線装置及びこれによる試料観察方法 |
US4926054A (en) * | 1988-03-17 | 1990-05-15 | Ict Integrated Circuit Testing Gesellschaft Fur Halbleiterpruftechnik Mbh | Objective lens for focusing charged particles in an electron microscope |
JP2777840B2 (ja) * | 1990-11-30 | 1998-07-23 | セイコーインスツルメンツ株式会社 | 電子線装置 |
EP0548573B1 (de) * | 1991-11-27 | 1998-02-25 | Hitachi, Ltd. | Elektronenstrahlgerät |
JP3081393B2 (ja) * | 1992-10-15 | 2000-08-28 | 株式会社日立製作所 | 走査電子顕微鏡 |
DE4236273A1 (en) * | 1992-10-27 | 1993-07-01 | Siemens Ag | Lens for focussing electrons for specimen inspection - has field generated by coils and cone-shaped electrode set into entry section |
-
1996
- 1996-02-16 DE DE19605855A patent/DE19605855A1/de not_active Withdrawn
- 1996-07-03 DE DE69606515T patent/DE69606515T2/de not_active Revoked
- 1996-07-03 EP EP96110765A patent/EP0790634B1/de not_active Revoked
Also Published As
Publication number | Publication date |
---|---|
DE19605855A1 (de) | 1997-08-21 |
EP0790634A1 (de) | 1997-08-20 |
EP0790634B1 (de) | 2000-02-02 |
DE69606515D1 (de) | 2000-03-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8363 | Opposition against the patent | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: ADVANTEST CORP., TOKIO/TOKYO, JP |
|
8328 | Change in the person/name/address of the agent |
Free format text: RA U. PA VOLKMAR TETZNER PA MICHAEL TETZNER RA THOMAS TETZNER, 81479 MUENCHEN |
|
8331 | Complete revocation |