DE69322800D1 - Verfahren zur Leistungsverbesserung in einem automatischen Testsystem - Google Patents
Verfahren zur Leistungsverbesserung in einem automatischen TestsystemInfo
- Publication number
- DE69322800D1 DE69322800D1 DE69322800T DE69322800T DE69322800D1 DE 69322800 D1 DE69322800 D1 DE 69322800D1 DE 69322800 T DE69322800 T DE 69322800T DE 69322800 T DE69322800 T DE 69322800T DE 69322800 D1 DE69322800 D1 DE 69322800D1
- Authority
- DE
- Germany
- Prior art keywords
- procedure
- test system
- automatic test
- performance improvement
- improvement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F8/00—Arrangements for software engineering
- G06F8/40—Transformation of program code
- G06F8/41—Compilation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
- G06F2201/865—Monitoring of software
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Software Systems (AREA)
- Devices For Executing Special Programs (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Stored Programmes (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/828,534 US5349660A (en) | 1992-01-24 | 1992-01-24 | Method of improving performance in an automated test system |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69322800D1 true DE69322800D1 (de) | 1999-02-11 |
DE69322800T2 DE69322800T2 (de) | 1999-05-12 |
Family
ID=25252090
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69322800T Expired - Fee Related DE69322800T2 (de) | 1992-01-24 | 1993-01-15 | Verfahren zur Leistungsverbesserung in einem automatischen Testsystem |
Country Status (4)
Country | Link |
---|---|
US (1) | US5349660A (de) |
EP (1) | EP0552895B1 (de) |
JP (1) | JP3300090B2 (de) |
DE (1) | DE69322800T2 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1038220A2 (de) * | 1997-11-17 | 2000-09-27 | MCMZ Technology Innovations LLc | Netzwerkkommunicationsarchitektur |
US6598183B1 (en) | 2000-01-04 | 2003-07-22 | Cisco Systems, Inc. | Software tool for automated diagnosis and resolution of problems of voice, data and VoIP communications networks |
US7385927B2 (en) * | 2002-06-24 | 2008-06-10 | Lsi Logic Corporation | Methods and structure for improved testing of embedded systems |
JP4047131B2 (ja) * | 2002-10-18 | 2008-02-13 | 株式会社オーク製作所 | 固体レーザ装置 |
US7543208B2 (en) * | 2006-07-26 | 2009-06-02 | Cisco Technology, Inc. | JTAG to system bus interface for accessing embedded analysis instruments |
US8683451B1 (en) | 2010-04-30 | 2014-03-25 | The United States Of America As Represented By The Secretary Of The Navy | System and method for translating software code |
JP5808922B2 (ja) | 2011-03-16 | 2015-11-10 | 三菱電機株式会社 | 空調機制御インターフェース装置、空気調和機および空調機制御システム |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4402055A (en) * | 1981-01-27 | 1983-08-30 | Westinghouse Electric Corp. | Automatic test system utilizing interchangeable test devices |
US5247693A (en) * | 1985-10-08 | 1993-09-21 | The Foxboro Company | Computer language structure for process control applications and method of translating same into program code to operate the computer |
US5230049A (en) * | 1988-11-29 | 1993-07-20 | International Business Machines Corporation | Program source code translator |
-
1992
- 1992-01-24 US US07/828,534 patent/US5349660A/en not_active Expired - Lifetime
-
1993
- 1993-01-15 DE DE69322800T patent/DE69322800T2/de not_active Expired - Fee Related
- 1993-01-15 EP EP93300256A patent/EP0552895B1/de not_active Expired - Lifetime
- 1993-01-22 JP JP02760493A patent/JP3300090B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0552895A2 (de) | 1993-07-28 |
DE69322800T2 (de) | 1999-05-12 |
EP0552895B1 (de) | 1998-12-30 |
EP0552895A3 (en) | 1993-09-01 |
JP3300090B2 (ja) | 2002-07-08 |
JPH05346332A (ja) | 1993-12-27 |
US5349660A (en) | 1994-09-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US |
|
8339 | Ceased/non-payment of the annual fee |