DE69232117D1 - Messgeraet mit einer akusto-optischen vorrichtung - Google Patents

Messgeraet mit einer akusto-optischen vorrichtung

Info

Publication number
DE69232117D1
DE69232117D1 DE69232117T DE69232117T DE69232117D1 DE 69232117 D1 DE69232117 D1 DE 69232117D1 DE 69232117 T DE69232117 T DE 69232117T DE 69232117 T DE69232117 T DE 69232117T DE 69232117 D1 DE69232117 D1 DE 69232117D1
Authority
DE
Germany
Prior art keywords
acusto
measuring device
optical device
optical
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69232117T
Other languages
English (en)
Other versions
DE69232117T2 (de
Inventor
Paul Anthony Gass
John Roy Sambles
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BTG International Ltd
Original Assignee
BTG International Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BTG International Ltd filed Critical BTG International Ltd
Publication of DE69232117D1 publication Critical patent/DE69232117D1/de
Application granted granted Critical
Publication of DE69232117T2 publication Critical patent/DE69232117T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1748—Comparative step being essential in the method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1757—Time modulation of light being essential to the method of light modification, e.g. using single detector
    • G01N2021/1759—Jittering, dithering, optical path modulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/90—Plate chromatography, e.g. thin layer or paper chromatography
    • G01N30/95—Detectors specially adapted therefor; Signal analysis
DE69232117T 1991-04-12 1992-04-13 Messgeraet mit einer akusto-optischen vorrichtung Expired - Fee Related DE69232117T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB919107796A GB9107796D0 (en) 1991-04-12 1991-04-12 Methods of and apparatus for measurement using acousto-optic devices
PCT/GB1992/000665 WO1992018845A2 (en) 1991-04-12 1992-04-13 Methods of and apparatus for measurement using acousto-optic devices

Publications (2)

Publication Number Publication Date
DE69232117D1 true DE69232117D1 (de) 2001-11-15
DE69232117T2 DE69232117T2 (de) 2002-06-20

Family

ID=10693148

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69232117T Expired - Fee Related DE69232117T2 (de) 1991-04-12 1992-04-13 Messgeraet mit einer akusto-optischen vorrichtung

Country Status (5)

Country Link
EP (1) EP0579707B1 (de)
JP (1) JP3357363B2 (de)
DE (1) DE69232117T2 (de)
GB (1) GB9107796D0 (de)
WO (1) WO1992018845A2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU5134100A (en) * 1999-05-17 2000-12-05 Florida International University Surface plasmon resonance detection with high angular resolution and fast response time
US7317519B2 (en) 2004-10-29 2008-01-08 Agilent Technologies, Inc. Swept-angle SPR measurement system
US20160033408A1 (en) * 2013-08-30 2016-02-04 Panasonic Intellectual Property Management Co., Ltd. Detecting apparatus

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3914055A (en) * 1974-05-23 1975-10-21 Lansing Research Corp Instrument for high resolution spectral analysis with large optical throughput
GB2128734B (en) * 1982-10-08 1986-02-19 Nat Res Dev Irradiative probe system
US4627730A (en) * 1984-07-06 1986-12-09 The Board Of Trustees Of The Leland Stanford Junior University Optical scanning microscope
US4883963A (en) * 1986-04-28 1989-11-28 Bran+Luebbe Gmbh Optical analysis method and apparatus having programmable rapid random wavelength access
GB8721029D0 (en) * 1987-09-08 1987-10-14 Lawrence M Precision angle measurement
US5255071A (en) * 1989-09-13 1993-10-19 Pollak Fred H Photoreflectance method and apparatus utilizing acousto-optic modulation

Also Published As

Publication number Publication date
EP0579707A1 (de) 1994-01-26
WO1992018845A2 (en) 1992-10-29
JPH06507489A (ja) 1994-08-25
WO1992018845A3 (en) 1992-12-23
DE69232117T2 (de) 2002-06-20
GB9107796D0 (en) 1991-05-29
JP3357363B2 (ja) 2002-12-16
EP0579707B1 (de) 2001-10-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee