DE69215784T2 - Gerät zur Detektion elektrostatischer Kräfte in Lösungen - Google Patents

Gerät zur Detektion elektrostatischer Kräfte in Lösungen

Info

Publication number
DE69215784T2
DE69215784T2 DE69215784T DE69215784T DE69215784T2 DE 69215784 T2 DE69215784 T2 DE 69215784T2 DE 69215784 T DE69215784 T DE 69215784T DE 69215784 T DE69215784 T DE 69215784T DE 69215784 T2 DE69215784 T2 DE 69215784T2
Authority
DE
Germany
Prior art keywords
solutions
detection
electrostatic forces
electrostatic
forces
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69215784T
Other languages
English (en)
Other versions
DE69215784D1 (de
Inventor
Nobuhiro Gemma
Takashi Ishino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE69215784D1 publication Critical patent/DE69215784D1/de
Application granted granted Critical
Publication of DE69215784T2 publication Critical patent/DE69215784T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/24—Investigating the presence of flaws
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Micromachines (AREA)
  • Control Of Position Or Direction (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE69215784T 1991-07-31 1992-07-31 Gerät zur Detektion elektrostatischer Kräfte in Lösungen Expired - Fee Related DE69215784T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP19194691 1991-07-31
JP2258392 1992-02-07

Publications (2)

Publication Number Publication Date
DE69215784D1 DE69215784D1 (de) 1997-01-23
DE69215784T2 true DE69215784T2 (de) 1997-04-10

Family

ID=26359833

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69215784T Expired - Fee Related DE69215784T2 (de) 1991-07-31 1992-07-31 Gerät zur Detektion elektrostatischer Kräfte in Lösungen

Country Status (4)

Country Link
US (1) US5329236A (de)
EP (1) EP0526228B1 (de)
JP (1) JPH05281276A (de)
DE (1) DE69215784T2 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10393612B4 (de) * 2002-11-01 2016-08-18 Keysight Technologies, Inc. (n.d.Ges.d.Staates Delaware) Rasterkraftmikroskop und Betriebsverfahren zur Topographie- und Erkennungsbildgebung

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6838889B2 (en) * 2001-01-17 2005-01-04 Veeco Instruments Inc. Method and apparatus for reducing the parachuting of a probe
FR2887787B1 (fr) * 2005-07-01 2007-10-05 Commissariat Energie Atomique Utilisation de polymeres reactifs pour moduler et controler les flux electrocinetiques dans un dispositif micro-ou nanofluidique
JP2007147365A (ja) * 2005-11-25 2007-06-14 Sumitomo Bakelite Co Ltd 成形品表面の官能基分析方法
US7716965B2 (en) * 2006-10-27 2010-05-18 Ut-Battelle, Llc Electrochemical sensor having suspended element counter electrode and deflection method for current sensing
JP5550279B2 (ja) * 2009-07-28 2014-07-16 キヤノン株式会社 電気浸透可動デバイス
US9194838B2 (en) 2010-03-03 2015-11-24 Osaka University Method and device for identifying nucleotide, and method and device for determining nucleotide sequence of polynucleotide
US8549660B2 (en) 2010-04-09 2013-10-01 Boise State University Cantilever-based optical fiber probe interfacial force microscope for partial immersion in liquid
US20120047610A1 (en) 2010-04-09 2012-02-23 Boise State University Cantilever-based optical interface force microscope
JP5672200B2 (ja) * 2011-09-01 2015-02-18 株式会社島津製作所 原子間力顕微鏡を用いた誘電特性測定方法
WO2015042200A1 (en) 2013-09-18 2015-03-26 Osaka University Biomolecule sequencing devices, systems and methods
JP2015077652A (ja) 2013-10-16 2015-04-23 クオンタムバイオシステムズ株式会社 ナノギャップ電極およびその製造方法
US9739799B2 (en) * 2014-02-28 2017-08-22 Bruker Nano, Inc. Method and apparatus to compensate for deflection artifacts in an atomic force microscope

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3753373A (en) * 1965-10-22 1973-08-21 Bissett Berman Corp Transducer system
DE2510644C2 (de) * 1975-03-12 1983-08-25 Volker Dr.-Ing. 6750 Kaiserslautern Hans Einrichtung zum Erfassen von neu auftretenden Fehlstellen in Auskleidungen von Behältern
JPS57165721A (en) * 1981-04-06 1982-10-12 Toyota Central Res & Dev Lab Inc Vibration sensor for engine
JPS62259050A (ja) * 1986-05-02 1987-11-11 Hiroshi Ogawa 物質の構造異常の検出方法
JP2690908B2 (ja) * 1987-09-25 1997-12-17 株式会社日立製作所 表面計測装置
US4861990A (en) * 1988-02-09 1989-08-29 California Institute Of Technology Tunneling susceptometry

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10393612B4 (de) * 2002-11-01 2016-08-18 Keysight Technologies, Inc. (n.d.Ges.d.Staates Delaware) Rasterkraftmikroskop und Betriebsverfahren zur Topographie- und Erkennungsbildgebung

Also Published As

Publication number Publication date
US5329236A (en) 1994-07-12
EP0526228A1 (de) 1993-02-03
DE69215784D1 (de) 1997-01-23
JPH05281276A (ja) 1993-10-29
EP0526228B1 (de) 1996-12-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee