DE69215784T2 - Gerät zur Detektion elektrostatischer Kräfte in Lösungen - Google Patents
Gerät zur Detektion elektrostatischer Kräfte in LösungenInfo
- Publication number
- DE69215784T2 DE69215784T2 DE69215784T DE69215784T DE69215784T2 DE 69215784 T2 DE69215784 T2 DE 69215784T2 DE 69215784 T DE69215784 T DE 69215784T DE 69215784 T DE69215784 T DE 69215784T DE 69215784 T2 DE69215784 T2 DE 69215784T2
- Authority
- DE
- Germany
- Prior art keywords
- solutions
- detection
- electrostatic forces
- electrostatic
- forces
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
- G01N27/24—Investigating the presence of flaws
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Micromachines (AREA)
- Control Of Position Or Direction (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19194691 | 1991-07-31 | ||
JP2258392 | 1992-02-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69215784D1 DE69215784D1 (de) | 1997-01-23 |
DE69215784T2 true DE69215784T2 (de) | 1997-04-10 |
Family
ID=26359833
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69215784T Expired - Fee Related DE69215784T2 (de) | 1991-07-31 | 1992-07-31 | Gerät zur Detektion elektrostatischer Kräfte in Lösungen |
Country Status (4)
Country | Link |
---|---|
US (1) | US5329236A (de) |
EP (1) | EP0526228B1 (de) |
JP (1) | JPH05281276A (de) |
DE (1) | DE69215784T2 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10393612B4 (de) * | 2002-11-01 | 2016-08-18 | Keysight Technologies, Inc. (n.d.Ges.d.Staates Delaware) | Rasterkraftmikroskop und Betriebsverfahren zur Topographie- und Erkennungsbildgebung |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6838889B2 (en) * | 2001-01-17 | 2005-01-04 | Veeco Instruments Inc. | Method and apparatus for reducing the parachuting of a probe |
FR2887787B1 (fr) * | 2005-07-01 | 2007-10-05 | Commissariat Energie Atomique | Utilisation de polymeres reactifs pour moduler et controler les flux electrocinetiques dans un dispositif micro-ou nanofluidique |
JP2007147365A (ja) * | 2005-11-25 | 2007-06-14 | Sumitomo Bakelite Co Ltd | 成形品表面の官能基分析方法 |
US7716965B2 (en) * | 2006-10-27 | 2010-05-18 | Ut-Battelle, Llc | Electrochemical sensor having suspended element counter electrode and deflection method for current sensing |
JP5550279B2 (ja) * | 2009-07-28 | 2014-07-16 | キヤノン株式会社 | 電気浸透可動デバイス |
WO2011108540A1 (ja) | 2010-03-03 | 2011-09-09 | 国立大学法人大阪大学 | ヌクレオチドを識別する方法および装置、ならびにポリヌクレオチドのヌクレオチド配列を決定する方法および装置 |
US8549660B2 (en) | 2010-04-09 | 2013-10-01 | Boise State University | Cantilever-based optical fiber probe interfacial force microscope for partial immersion in liquid |
US20120047610A1 (en) | 2010-04-09 | 2012-02-23 | Boise State University | Cantilever-based optical interface force microscope |
JP5672200B2 (ja) * | 2011-09-01 | 2015-02-18 | 株式会社島津製作所 | 原子間力顕微鏡を用いた誘電特性測定方法 |
CA2929929A1 (en) | 2013-09-18 | 2015-03-26 | Quantum Biosystems Inc. | Biomolecule sequencing devices, systems and methods |
JP2015077652A (ja) | 2013-10-16 | 2015-04-23 | クオンタムバイオシステムズ株式会社 | ナノギャップ電極およびその製造方法 |
US9739799B2 (en) * | 2014-02-28 | 2017-08-22 | Bruker Nano, Inc. | Method and apparatus to compensate for deflection artifacts in an atomic force microscope |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3753373A (en) * | 1965-10-22 | 1973-08-21 | Bissett Berman Corp | Transducer system |
DE2510644C2 (de) * | 1975-03-12 | 1983-08-25 | Volker Dr.-Ing. 6750 Kaiserslautern Hans | Einrichtung zum Erfassen von neu auftretenden Fehlstellen in Auskleidungen von Behältern |
JPS57165721A (en) * | 1981-04-06 | 1982-10-12 | Toyota Central Res & Dev Lab Inc | Vibration sensor for engine |
JPS62259050A (ja) * | 1986-05-02 | 1987-11-11 | Hiroshi Ogawa | 物質の構造異常の検出方法 |
JP2690908B2 (ja) * | 1987-09-25 | 1997-12-17 | 株式会社日立製作所 | 表面計測装置 |
US4861990A (en) * | 1988-02-09 | 1989-08-29 | California Institute Of Technology | Tunneling susceptometry |
-
1992
- 1992-07-28 JP JP4201138A patent/JPH05281276A/ja active Pending
- 1992-07-31 US US07/922,787 patent/US5329236A/en not_active Expired - Fee Related
- 1992-07-31 EP EP92306990A patent/EP0526228B1/de not_active Expired - Lifetime
- 1992-07-31 DE DE69215784T patent/DE69215784T2/de not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10393612B4 (de) * | 2002-11-01 | 2016-08-18 | Keysight Technologies, Inc. (n.d.Ges.d.Staates Delaware) | Rasterkraftmikroskop und Betriebsverfahren zur Topographie- und Erkennungsbildgebung |
Also Published As
Publication number | Publication date |
---|---|
EP0526228A1 (de) | 1993-02-03 |
DE69215784D1 (de) | 1997-01-23 |
JPH05281276A (ja) | 1993-10-29 |
US5329236A (en) | 1994-07-12 |
EP0526228B1 (de) | 1996-12-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) | ||
8339 | Ceased/non-payment of the annual fee |