DE69126329T2 - Verfahren und vorrichtung zur laser-ultraschallfehlerprüfung - Google Patents

Verfahren und vorrichtung zur laser-ultraschallfehlerprüfung

Info

Publication number
DE69126329T2
DE69126329T2 DE69126329T DE69126329T DE69126329T2 DE 69126329 T2 DE69126329 T2 DE 69126329T2 DE 69126329 T DE69126329 T DE 69126329T DE 69126329 T DE69126329 T DE 69126329T DE 69126329 T2 DE69126329 T2 DE 69126329T2
Authority
DE
Germany
Prior art keywords
laser ultrasonic
error testing
ultrasonic error
testing
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69126329T
Other languages
English (en)
Other versions
DE69126329D1 (de
Inventor
Kazuteru Naruo
Keisho Arai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Atomic Energy Agency
Original Assignee
DORYOKURO KAKUNENRYO KAIHATSU JIGYODAN TOKIO/TOKYO JP
Doryokuro Kakunenryo Kaihatsu Jigyodan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by DORYOKURO KAKUNENRYO KAIHATSU JIGYODAN TOKIO/TOKYO JP, Doryokuro Kakunenryo Kaihatsu Jigyodan filed Critical DORYOKURO KAKUNENRYO KAIHATSU JIGYODAN TOKIO/TOKYO JP
Priority claimed from PCT/JP1991/001607 external-priority patent/WO1993010445A1/ja
Publication of DE69126329D1 publication Critical patent/DE69126329D1/de
Application granted granted Critical
Publication of DE69126329T2 publication Critical patent/DE69126329T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/042—Wave modes
    • G01N2291/0427—Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/263—Surfaces
    • G01N2291/2636—Surfaces cylindrical from inside
DE69126329T 1991-11-22 1991-11-22 Verfahren und vorrichtung zur laser-ultraschallfehlerprüfung Expired - Fee Related DE69126329T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP1991/001607 WO1993010445A1 (en) 1990-10-09 1991-11-22 Laser ultrasonic flaw detection method and apparatus

Publications (2)

Publication Number Publication Date
DE69126329D1 DE69126329D1 (de) 1997-07-03
DE69126329T2 true DE69126329T2 (de) 1997-11-20

Family

ID=14014742

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69126329T Expired - Fee Related DE69126329T2 (de) 1991-11-22 1991-11-22 Verfahren und vorrichtung zur laser-ultraschallfehlerprüfung

Country Status (4)

Country Link
US (1) US5457997A (de)
EP (1) EP0614084B1 (de)
CA (1) CA2123493C (de)
DE (1) DE69126329T2 (de)

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DE4419750C1 (de) * 1994-06-06 1995-06-22 Siemens Ag Prooftest für keramische Bauteile
US5929337A (en) * 1994-11-11 1999-07-27 M & A Packaging Services Limited Non-mechanical contact ultrasound system for monitoring contents of a moving container
GB9522949D0 (en) * 1995-11-09 1996-01-10 M & A Packaging Serv Ltd Fill level measuring
US5773721A (en) * 1996-07-31 1998-06-30 General Electric Company Laser beam aiming apparatus for ultrasonic inspection
US6715354B2 (en) 1998-02-24 2004-04-06 Massachusetts Institute Of Technology Flaw detection system using acoustic doppler effect
US6057927A (en) * 1998-02-25 2000-05-02 American Iron And Steel Institute Laser-ultrasound spectroscopy apparatus and method with detection of shear resonances for measuring anisotropy, thickness, and other properties
US6008887A (en) * 1998-03-20 1999-12-28 Lasson Technologies, Inc. Single beam laser surface velocity and displacement measurement apparatus
US6747268B1 (en) 1999-04-02 2004-06-08 Georgia Tech Research Corporation Object inspection method and system
US6186004B1 (en) * 1999-05-27 2001-02-13 The Regents Of The University Of California Apparatus and method for remote, noninvasive characterization of structures and fluids inside containers
US6253621B1 (en) * 1999-08-31 2001-07-03 Advanced Micro Devices Micro-void detection
US6728515B1 (en) 2000-02-16 2004-04-27 Massachusetts Institute Of Technology Tuned wave phased array
CN1185485C (zh) * 2000-05-02 2005-01-19 富士胶片株式会社 超声波探头
CN1252468C (zh) * 2000-05-02 2006-04-19 富士胶片株式会社 超声波探头及使用其的超声波诊断装置
US6523412B1 (en) * 2000-06-28 2003-02-25 Framatome Anp Inc. Apparatus and method for inspecting spring hold down bolts of an upper tie plate
US6833554B2 (en) 2000-11-21 2004-12-21 Massachusetts Institute Of Technology Laser-induced defect detection system and method
US6646550B1 (en) 2001-08-23 2003-11-11 Battelle Memorial Institute Radio frequency security system and method for a building facility
US7081815B2 (en) * 2001-08-23 2006-07-25 Battelle Memorial Institute Radio frequency security system, method for a building facility or the like, and apparatus and methods for remotely monitoring the status of fire extinguishers
US6732587B2 (en) 2002-02-06 2004-05-11 Lockheed Martin Corporation System and method for classification of defects in a manufactured object
US6938488B2 (en) * 2002-08-21 2005-09-06 Battelle Memorial Institute Acoustic inspection device
US7701027B1 (en) * 2005-03-04 2010-04-20 Hrl Laboratories, Llc Method and apparatus for reduction of non-adaptive signals in photo-EMF sensors
US20060272418A1 (en) * 2005-06-03 2006-12-07 Brown University Opto-acoustic methods and apparatus for perfoming high resolution acoustic imaging and other sample probing and modification operations
US7624640B2 (en) * 2005-06-03 2009-12-01 Brown University Opto-acoustic methods and apparatus for performing high resolution acoustic imaging and other sample probing and modification operations
EP1742049B1 (de) * 2005-07-07 2009-12-09 Kabushiki Kaisha Toshiba Laserbasiertes Wartungsgerät
US7569734B2 (en) * 2005-11-30 2009-08-04 Brown University Method of using rhodium quinonoid catalysts
JP4871952B2 (ja) * 2006-04-14 2012-02-08 東芝三菱電機産業システム株式会社 レーザ超音波式特性測定装置
US8302480B2 (en) * 2007-02-05 2012-11-06 Brown University Enhanced ultra-high resolution acoustic microscope
JP5134277B2 (ja) * 2007-03-30 2013-01-30 三菱重工業株式会社 超音波検査装置
JP5260130B2 (ja) * 2007-08-10 2013-08-14 三菱重工業株式会社 超音波検査装置、超音波検査方法および原子力プラントの非破壊検査方法
US7734133B2 (en) * 2008-05-15 2010-06-08 Lockheed Martin Corporation Hollow core waveguide for laser generation of ultrasonic waves
US8312773B2 (en) 2008-12-18 2012-11-20 General Electric Company Laser ultrasonic device
WO2010113250A1 (ja) * 2009-03-31 2010-10-07 トヨタ自動車株式会社 接合品質検査装置及び接合品質検査方法
US8955776B2 (en) * 2010-02-26 2015-02-17 Alstom Technology Ltd Method of constructing a stationary coal nozzle
KR101736641B1 (ko) * 2015-12-24 2017-05-17 주식회사 포스코 균열 측정 장치 및 방법
CN106645399B (zh) * 2016-10-14 2019-11-26 厦门大学 一种复合材料损伤检测评估方法和系统
RU2664933C1 (ru) * 2017-06-30 2018-08-23 Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский технологический университет "МИСиС" Способ определения макрорельефа поверхности и внутренних включений объекта и устройство для его реализации
CN107131946B (zh) * 2017-07-11 2024-04-05 北京强度环境研究所 反射信号增强片及热噪声环境下的振动响应测量试验方法
CN110006998B (zh) * 2019-04-25 2021-10-26 扬州东升汽车零部件股份有限公司 一种用于检测空心管件焊缝的检测系统以及检测方法
CN113324912A (zh) * 2021-04-14 2021-08-31 航天科工防御技术研究试验中心 塑封结构内部缺陷检测设备、方法及存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS606860A (ja) * 1983-06-15 1985-01-14 Hitachi Ltd 非接触式超音波探傷方法およびその装置
US4512197A (en) * 1983-09-01 1985-04-23 The United States Of America As Represented By The Secretary Of The Navy Apparatus for generating a focusable and scannable ultrasonic beam for non-destructive examination
US4567769A (en) * 1984-03-08 1986-02-04 Rockwell International Corporation Contact-free ultrasonic transduction for flaw and acoustic discontinuity detection
US4554836A (en) * 1984-08-31 1985-11-26 The United States Of America As Represented By The Secretary Of The Navy Laser vibrometer
JPS6358155A (ja) * 1986-08-28 1988-03-12 Mitsubishi Electric Corp 非接触型超音波発生装置

Also Published As

Publication number Publication date
EP0614084B1 (de) 1997-05-28
CA2123493C (en) 1999-09-21
CA2123493A1 (en) 1993-05-27
DE69126329D1 (de) 1997-07-03
EP0614084A1 (de) 1994-09-07
US5457997A (en) 1995-10-17
EP0614084A4 (de) 1994-06-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: JAPAN NUCLEAR CYCLE DEVELOPMENT INSTITUTE, TOKAI,

8339 Ceased/non-payment of the annual fee