DE69108393D1 - APPARAT ZUR ERZEUGUNG VON RöNTGENBILDERN UND ZUGEORDNETES VERFAHREN. - Google Patents

APPARAT ZUR ERZEUGUNG VON RöNTGENBILDERN UND ZUGEORDNETES VERFAHREN.

Info

Publication number
DE69108393D1
DE69108393D1 DE69108393T DE69108393T DE69108393D1 DE 69108393 D1 DE69108393 D1 DE 69108393D1 DE 69108393 T DE69108393 T DE 69108393T DE 69108393 T DE69108393 T DE 69108393T DE 69108393 D1 DE69108393 D1 DE 69108393D1
Authority
DE
Germany
Prior art keywords
generating
ray images
associated method
ray
images
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69108393T
Other languages
English (en)
Other versions
DE69108393T2 (de
Inventor
James Cambier
David Pasiak
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cintex Of America Inc Kenosha Wis Us
Original Assignee
PAR Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PAR Technology Corp filed Critical PAR Technology Corp
Publication of DE69108393D1 publication Critical patent/DE69108393D1/de
Application granted granted Critical
Publication of DE69108393T2 publication Critical patent/DE69108393T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G01V5/22—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/56—Switching-on; Switching-off
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/60—Circuit arrangements for obtaining a series of X-ray photographs or for X-ray cinematography
DE69108393T 1990-06-08 1991-06-07 APPARAT ZUR ERZEUGUNG VON RöNTGENBILDERN UND ZUGEORDNETES VERFAHREN. Expired - Fee Related DE69108393T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US53517990A 1990-06-08 1990-06-08
PCT/US1991/004030 WO1991019188A1 (en) 1990-06-08 1991-06-07 X-ray generating apparatus and associated method

Publications (2)

Publication Number Publication Date
DE69108393D1 true DE69108393D1 (de) 1995-04-27
DE69108393T2 DE69108393T2 (de) 1995-10-12

Family

ID=24133174

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69108393T Expired - Fee Related DE69108393T2 (de) 1990-06-08 1991-06-07 APPARAT ZUR ERZEUGUNG VON RöNTGENBILDERN UND ZUGEORDNETES VERFAHREN.

Country Status (5)

Country Link
EP (1) EP0532637B1 (de)
AU (1) AU656727B2 (de)
CA (1) CA2084886A1 (de)
DE (1) DE69108393T2 (de)
WO (1) WO1991019188A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9223818D0 (en) * 1992-11-13 1993-01-06 De Beers Ind Diamond Body scanning system
DE19610093A1 (de) * 1996-03-15 1997-09-18 Bsbg Bremer Sonderabfall Berat Verfahren zum Sortieren von Altbatterien und/oder Altakkumulatoren sowie Vorrichtung zur Durchführung des Verfahrens
GB2382135A (en) * 2001-11-20 2003-05-21 Spectral Fusion Technologies L X-ray apparatus for grading meat samples according to a predetermined meat to fat ratio
DE102006047888A1 (de) * 2006-10-10 2008-04-17 Smiths Heimann Gmbh Verfahren zur Verbesserung der Detailerkennbarkeit in Röntgenbildern
JP6861990B2 (ja) 2017-03-14 2021-04-21 株式会社イシダ Ｘ線検査装置
JP6863267B2 (ja) * 2017-12-21 2021-04-21 株式会社島津製作所 Ｘ線分析装置及び異常検知方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3109093A (en) * 1961-01-31 1963-10-29 Lab For Electronics Inc Apparatus for coordinating camera shutter movement with a pulsed X-ray beam
US3919467A (en) * 1973-08-27 1975-11-11 Ridge Instr Company Inc X-ray baggage inspection system
DE2532300C3 (de) * 1975-07-18 1979-05-17 Heimann Gmbh, 6200 Wiesbaden Anlage zum Prüfen von Gepäckstücken mittels Röntgenstrahlung
AU534695B2 (en) * 1980-06-03 1984-02-09 Commonwealth Of Australia, The Image analysis system
JPS5756740A (en) * 1980-09-22 1982-04-05 Mitsubishi Electric Corp Object inspecting device
DE8133279U1 (de) * 1981-11-13 1986-04-03 Heimann Gmbh, 6200 Wiesbaden Vorrichtung zur Untersuchung des Inhaltes von Containern
US4530006A (en) * 1982-06-03 1985-07-16 North American Philips Corporation Intrinsic object sensing in a digital fan beam X-ray inspection system
GB2149630A (en) * 1983-09-20 1985-06-12 British Gas Corp Real time radiographic inspection
JPS6072199A (ja) * 1983-09-29 1985-04-24 Toshiba Corp Ｘ線装置

Also Published As

Publication number Publication date
EP0532637A1 (de) 1993-03-24
AU8000791A (en) 1991-12-31
DE69108393T2 (de) 1995-10-12
WO1991019188A1 (en) 1991-12-12
AU656727B2 (en) 1995-02-16
EP0532637B1 (de) 1995-03-22
CA2084886A1 (en) 1991-12-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: CINTEX OF AMERICA, INC., KENOSHA, WIS., US

8328 Change in the person/name/address of the agent

Free format text: PRUEFER UND KOLLEGEN, 81545 MUENCHEN

8339 Ceased/non-payment of the annual fee