DE69024529D1 - Informationserfassungsgerät - Google Patents

Informationserfassungsgerät

Info

Publication number
DE69024529D1
DE69024529D1 DE69024529T DE69024529T DE69024529D1 DE 69024529 D1 DE69024529 D1 DE 69024529D1 DE 69024529 T DE69024529 T DE 69024529T DE 69024529 T DE69024529 T DE 69024529T DE 69024529 D1 DE69024529 D1 DE 69024529D1
Authority
DE
Germany
Prior art keywords
information acquisition
acquisition device
information
acquisition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69024529T
Other languages
English (en)
Other versions
DE69024529T2 (de
Inventor
Hiroyasu Nose
Toshimitsu Kawase
Toshihiko Miyazaki
Takahiro Oguchi
Akihiko Yamano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Application granted granted Critical
Publication of DE69024529D1 publication Critical patent/DE69024529D1/de
Publication of DE69024529T2 publication Critical patent/DE69024529T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1418—Disposition or mounting of heads or record carriers
    • G11B9/1427—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement
    • G11B9/1436—Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other
    • G11B9/1454—Positioning the head or record carrier into or out of operative position or across information tracks; Alignment of the head relative to the surface of the record carrier
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q80/00—Applications, other than SPM, of scanning-probe techniques
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/85—Scanning probe control process
    • Y10S977/851—Particular movement or positioning of scanning tip

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
DE69024529T 1989-05-08 1990-05-08 Informationserfassungsgerät Expired - Fee Related DE69024529T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1113691A JP2686645B2 (ja) 1989-05-08 1989-05-08 走査型トンネル電流検出装置

Publications (2)

Publication Number Publication Date
DE69024529D1 true DE69024529D1 (de) 1996-02-15
DE69024529T2 DE69024529T2 (de) 1996-08-29

Family

ID=14618743

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69024529T Expired - Fee Related DE69024529T2 (de) 1989-05-08 1990-05-08 Informationserfassungsgerät

Country Status (4)

Country Link
US (1) US5432346A (de)
EP (1) EP0397116B1 (de)
JP (1) JP2686645B2 (de)
DE (1) DE69024529T2 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5154809A (en) * 1984-07-09 1992-10-13 Millipore Corporation Process for purifying water
JP2945090B2 (ja) * 1990-07-09 1999-09-06 キヤノン株式会社 エンコーダ
CA2060674C (en) * 1991-02-08 1996-10-01 Masahiro Tagawa Driving apparatus and a recording and/or reproducing apparatus using the same
JPH0674773A (ja) * 1992-08-26 1994-03-18 Akai Electric Co Ltd 振動ジャイロ用振動子
DE59307710D1 (de) * 1993-02-15 1998-01-02 Ibm Kraftmikroskop und Verfahren zur Messung von atomaren Kräften in mehreren Richtungen
JP2983876B2 (ja) * 1994-03-22 1999-11-29 徹雄 大原 リアルタイムかつナノメータスケールの位置測定方法および装置
DE4432304C2 (de) * 1994-09-10 1996-10-17 Forschungszentrum Juelich Gmbh Verfahren zum Scannen einer Probenoberfläche mit einer Rastersonde eines Rastersondenmikroskops
JP3581421B2 (ja) * 1995-02-23 2004-10-27 キヤノン株式会社 情報処理装置
US5744799A (en) * 1996-05-20 1998-04-28 Ohara; Tetsuo Apparatus for and method of real-time nanometer-scale position measurement of the sensor of a scanning tunneling microscope or other sensor scanning atomic or other undulating surfaces
JP3278046B2 (ja) * 1997-07-29 2002-04-30 セイコーインスツルメンツ株式会社 ３次元走査プローブ顕微鏡
US6169281B1 (en) 1998-07-29 2001-01-02 International Business Machines Corporation Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions
EP1192442A1 (de) * 1999-06-05 2002-04-03 Daewoo Electronics Co., Ltd Mikroskop auf der grundlage atomarer kräfte und zugehöriges betriebsverfahren
ATE338301T1 (de) 2002-04-15 2006-09-15 Epos Technologies Ltd Verfahren und system zum erfassen von positionsdaten
WO2005111653A2 (en) 2004-05-17 2005-11-24 Epos Technologies Limited Acoustic robust synchronization signaling for acoustic positioning system
EP1804609A2 (de) * 2004-09-29 2007-07-11 Tel Hashomer Medical Research Infrastructure and Services Ltd. Überwachung von durch konvektion verbesserter drug delivery
US7367944B2 (en) 2004-12-13 2008-05-06 Tel Hashomer Medical Research Infrastructure And Services Ltd. Method and system for monitoring ablation of tissues
ES2376588T3 (es) 2005-03-23 2012-03-15 Epos Development Ltd. Procedimiento y sistema para un montaje de pluma digital.
KR101639420B1 (ko) * 2007-03-14 2016-07-22 퀄컴 테크놀로지스, 인크. Ｍｅｍｓ 마이크로폰
US9181555B2 (en) * 2007-07-23 2015-11-10 Ramot At Tel-Aviv University Ltd. Photocatalytic hydrogen production and polypeptides capable of same

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4618767A (en) * 1985-03-22 1986-10-21 International Business Machines Corporation Low-energy scanning transmission electron microscope
JPS62209302A (ja) * 1986-03-10 1987-09-14 Shimadzu Corp 平行移動量検出装置
DE3771711D1 (de) * 1987-05-12 1991-08-29 Ibm Atomares kraeftemikroskop mit oscillierendem quarz.
EP0646913B1 (de) * 1987-08-25 1999-01-13 Canon Kabushiki Kaisha Tunnelstromkodierer
DE3850544T2 (de) * 1987-09-24 1994-11-24 Canon Kk Mikrosonde, deren Herstellung und elektronisches Gerät, das diese Mikrosonde gebraucht.
JP2547869B2 (ja) * 1988-11-09 1996-10-23 キヤノン株式会社 プローブユニット，該プローブの駆動方法及び該プローブユニットを備えた走査型トンネル電流検知装置
US4992659A (en) * 1989-07-27 1991-02-12 International Business Machines Corporation Near-field lorentz force microscopy

Also Published As

Publication number Publication date
DE69024529T2 (de) 1996-08-29
JPH02293622A (ja) 1990-12-04
JP2686645B2 (ja) 1997-12-08
EP0397116A2 (de) 1990-11-14
EP0397116B1 (de) 1996-01-03
EP0397116A3 (de) 1993-07-14
US5432346A (en) 1995-07-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: WESER & KOLLEGEN, 81245 MUENCHEN

8339 Ceased/non-payment of the annual fee