DE69000129D1 - Integrierte schaltung mit vollstaendigem schutz gegen ultraviolettstrahlen. - Google Patents

Integrierte schaltung mit vollstaendigem schutz gegen ultraviolettstrahlen.

Info

Publication number
DE69000129D1
DE69000129D1 DE9090403570T DE69000129T DE69000129D1 DE 69000129 D1 DE69000129 D1 DE 69000129D1 DE 9090403570 T DE9090403570 T DE 9090403570T DE 69000129 T DE69000129 T DE 69000129T DE 69000129 D1 DE69000129 D1 DE 69000129D1
Authority
DE
Germany
Prior art keywords
integrated circuit
ultraviolet rays
protection against
against ultraviolet
full protection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE9090403570T
Other languages
English (en)
Other versions
DE69000129T2 (de
Inventor
Franck Edme
Olivier Adjemian
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Publication of DE69000129D1 publication Critical patent/DE69000129D1/de
Application granted granted Critical
Publication of DE69000129T2 publication Critical patent/DE69000129T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/49Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
    • H01L29/4916Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET the conductor material next to the insulator being a silicon layer, e.g. polysilicon doped with boron, phosphorus or nitrogen
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/552Protection against radiation, e.g. light or electromagnetic waves
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/788Field effect transistors with field effect produced by an insulated gate with floating gate
    • H01L29/7881Programmable transistors with only two possible levels of programmation
    • H01L29/7884Programmable transistors with only two possible levels of programmation charging by hot carrier injection
    • H01L29/7885Hot carrier injection from the channel
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B69/00Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Power Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
DE9090403570T 1989-12-16 1990-12-13 Integrierte schaltung mit vollstaendigem schutz gegen ultraviolettstrahlen. Expired - Lifetime DE69000129T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8916649A FR2656156A1 (fr) 1989-12-16 1989-12-16 Circuit integre entierement protege des rayons ultra-violets.

Publications (2)

Publication Number Publication Date
DE69000129D1 true DE69000129D1 (de) 1992-07-09
DE69000129T2 DE69000129T2 (de) 1992-12-17

Family

ID=9388578

Family Applications (1)

Application Number Title Priority Date Filing Date
DE9090403570T Expired - Lifetime DE69000129T2 (de) 1989-12-16 1990-12-13 Integrierte schaltung mit vollstaendigem schutz gegen ultraviolettstrahlen.

Country Status (4)

Country Link
US (1) US5235541A (de)
EP (1) EP0433174B1 (de)
DE (1) DE69000129T2 (de)
FR (1) FR2656156A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05243581A (ja) * 1992-02-28 1993-09-21 Mitsubishi Electric Corp 不揮発性メモリ装置
EP0576773B1 (de) * 1992-06-30 1995-09-13 STMicroelectronics S.r.l. Integrierte Schaltung mit vollständigem Schutz gegen Ultraviolettstrahlen
AT401656B (de) * 1994-11-07 1996-11-25 Chemiefaser Lenzing Ag Flammfestes nicht gewebtes textiles gebilde
KR970054309A (ko) * 1995-12-29 1997-07-31 김주용 불 휘발성 반도체 메모리장치
US5719427A (en) * 1997-01-14 1998-02-17 Pericom Semiconductor Corp. Avalanche-enhanced CMOS transistor for EPROM/EEPROM and ESD-protection structures
GB2341272B (en) 1998-09-03 2003-08-20 Ericsson Telefon Ab L M High voltage shield
US7339835B1 (en) * 2005-02-14 2008-03-04 National Semiconductor Corporation Non-volatile memory structure and erase method with floating gate voltage control
US7923071B2 (en) * 2005-02-15 2011-04-12 Rpo Pty Limited Photolithographic patterning of polymeric materials
US9406621B2 (en) 2010-06-10 2016-08-02 Texas Instruments Incorporated Ultraviolet energy shield for non-volatile charge storage memory
CN102314036A (zh) * 2010-06-29 2012-01-11 普诚科技股份有限公司 抗紫外光的电子装置及其制法
CN114054925A (zh) * 2021-11-10 2022-02-18 合肥维信诺科技有限公司 一种掩膜板的制作方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4404577A (en) * 1980-06-30 1983-09-13 International Business Machines Corp. Electrically alterable read only memory cell
US4530074A (en) * 1982-06-17 1985-07-16 Intel Corporation Radiation shield for a portion of a radiation sensitive integrated circuit
US4519050A (en) * 1982-06-17 1985-05-21 Intel Corporation Radiation shield for an integrated circuit memory with redundant elements
JPS596581A (ja) * 1982-07-02 1984-01-13 Mitsubishi Electric Corp 半導体不揮発性記憶装置
US4577295A (en) * 1983-05-31 1986-03-18 Intel Corporation Hybrid E2 cell and related array
US4805138A (en) * 1985-08-23 1989-02-14 Texas Instruments Incorporated An unerasable eprom cell
JPS62143476A (ja) * 1985-12-18 1987-06-26 Fujitsu Ltd 半導体記憶装置
US5034786A (en) * 1986-08-29 1991-07-23 Waferscale Integration, Inc. Opaque cover for preventing erasure of an EPROM
US4758869A (en) * 1986-08-29 1988-07-19 Waferscale Integration, Inc. Nonvolatile floating gate transistor structure
US4970565A (en) * 1988-09-01 1990-11-13 Atmel Corporation Sealed charge storage structure
US5086410A (en) * 1990-09-14 1992-02-04 National Semiconductor Corporation Non-erasable eprom cell for redundancy circuit
US5050123A (en) * 1990-11-13 1991-09-17 Intel Corporation Radiation shield for EPROM cells

Also Published As

Publication number Publication date
EP0433174A1 (de) 1991-06-19
EP0433174B1 (de) 1992-06-03
FR2656156A1 (fr) 1991-06-21
DE69000129T2 (de) 1992-12-17
US5235541A (en) 1993-08-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee