DE68909456D1 - Befestigungsanordnung fuer das messen der statischen charakteristika von aktiven mikrowellenkomponenten mit 3 anschluessen. - Google Patents

Befestigungsanordnung fuer das messen der statischen charakteristika von aktiven mikrowellenkomponenten mit 3 anschluessen.

Info

Publication number
DE68909456D1
DE68909456D1 DE89104997T DE68909456T DE68909456D1 DE 68909456 D1 DE68909456 D1 DE 68909456D1 DE 89104997 T DE89104997 T DE 89104997T DE 68909456 T DE68909456 T DE 68909456T DE 68909456 D1 DE68909456 D1 DE 68909456D1
Authority
DE
Germany
Prior art keywords
connections
measuring
mounting arrangement
static characteristics
microwave components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE89104997T
Other languages
English (en)
Other versions
DE68909456T2 (de
Inventor
Angelo Angelucci
Roberto Burocco
Gianni Clerico Titinet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telecom Italia SpA
Original Assignee
CSELT Centro Studi e Laboratori Telecomunicazioni SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CSELT Centro Studi e Laboratori Telecomunicazioni SpA filed Critical CSELT Centro Studi e Laboratori Telecomunicazioni SpA
Publication of DE68909456D1 publication Critical patent/DE68909456D1/de
Application granted granted Critical
Publication of DE68909456T2 publication Critical patent/DE68909456T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Non-Reversible Transmitting Devices (AREA)
DE89104997T 1988-03-23 1989-03-21 Befestigungsanordnung für das Messen der statischen Charakteristika von aktiven Mikrowellenkomponenten mit 3 Anschlüssen. Expired - Fee Related DE68909456T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT67258/88A IT1219140B (it) 1988-03-23 1988-03-23 Dispositivo per la misura delle caratteristiche statiche di componenti attivi a tre terminali per microonde

Publications (2)

Publication Number Publication Date
DE68909456D1 true DE68909456D1 (de) 1993-11-04
DE68909456T2 DE68909456T2 (de) 1994-03-03

Family

ID=11300918

Family Applications (2)

Application Number Title Priority Date Filing Date
DE198989104997T Pending DE334273T1 (de) 1988-03-23 1989-03-21 Befestigungsanordnung fuer das messen der statischen charakteristika von aktiven mikrowellenkomponenten mit 3 anschluessen.
DE89104997T Expired - Fee Related DE68909456T2 (de) 1988-03-23 1989-03-21 Befestigungsanordnung für das Messen der statischen Charakteristika von aktiven Mikrowellenkomponenten mit 3 Anschlüssen.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE198989104997T Pending DE334273T1 (de) 1988-03-23 1989-03-21 Befestigungsanordnung fuer das messen der statischen charakteristika von aktiven mikrowellenkomponenten mit 3 anschluessen.

Country Status (6)

Country Link
US (1) US4912402A (de)
EP (1) EP0334273B1 (de)
JP (1) JPH0677045B2 (de)
CA (1) CA1305219C (de)
DE (2) DE334273T1 (de)
IT (1) IT1219140B (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5477137A (en) * 1992-10-02 1995-12-19 Motorola, Inc. Probeable substrate substitute for a calibration standard and test fixture
US5420506A (en) * 1993-06-18 1995-05-30 Industrial Technology Research Institute Apparatus and method for testing packaged integrated circuits
USRE45667E1 (en) * 2000-06-13 2015-09-08 Christos Tsironis Adaptable pre-matched tuner system and method
US11029351B1 (en) * 2018-08-20 2021-06-08 Christos Tsironis Transforming load pull test fixture for wave measurements
RU2770299C1 (ru) * 2021-03-19 2022-04-15 Федеральное государственное бюджетное образовательное учреждение высшего образования "Пензенский государственный университет" Способ определения параметров трехэлементного резонансного двухполюсника и измерительная цепь для его осуществления

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1125389B (it) * 1979-06-28 1986-05-14 Cise Spa Struttura periodica di trasmissione di segnali ad onda lenta per elementi circuitali monolitici miniaturizzati operanti a frequenza di microonde
JPS57115852A (en) * 1981-01-10 1982-07-19 Mitsubishi Electric Corp Microwave transistor mount
US4535307A (en) * 1982-06-30 1985-08-13 Raytheon Company Microwave circuit device package
US4538124A (en) * 1984-02-10 1985-08-27 Rca Corporation Planar microwave circuit component mounting system
US4733209A (en) * 1986-06-27 1988-03-22 Augat Inc. Ceramic Scrambler module
JPS6313502A (ja) * 1986-07-04 1988-01-20 Yuniden Kk マイクロ波方向性結合器
US4764723A (en) * 1986-11-10 1988-08-16 Cascade Microtech, Inc. Wafer probe
FR2608772B1 (fr) * 1986-12-23 1989-03-31 Thomson Semiconducteurs Dispositif de mesure des caracteristiques d'un composant hyperfrequence

Also Published As

Publication number Publication date
IT1219140B (it) 1990-05-03
JPH0677045B2 (ja) 1994-09-28
CA1305219C (en) 1992-07-14
EP0334273A3 (en) 1990-07-25
DE68909456T2 (de) 1994-03-03
EP0334273B1 (de) 1993-09-29
DE334273T1 (de) 1990-12-20
IT8867258A0 (it) 1988-03-23
JPH01276077A (ja) 1989-11-06
EP0334273A2 (de) 1989-09-27
US4912402A (en) 1990-03-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee