EP0334273A3 - A fixture for measuring the static characteristics of microwave 3-terminal active components - Google Patents
A fixture for measuring the static characteristics of microwave 3-terminal active components Download PDFInfo
- Publication number
- EP0334273A3 EP0334273A3 EP89104997A EP89104997A EP0334273A3 EP 0334273 A3 EP0334273 A3 EP 0334273A3 EP 89104997 A EP89104997 A EP 89104997A EP 89104997 A EP89104997 A EP 89104997A EP 0334273 A3 EP0334273 A3 EP 0334273A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- microwave
- fixture
- measuring
- active components
- static characteristics
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/045—Sockets or component fixtures for RF or HF testing
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT67258/88A IT1219140B (en) | 1988-03-23 | 1988-03-23 | DEVICE FOR MEASURING STATIC CHARACTERISTICS OF THREE TERMINAL ACTIVE COMPONENTS FOR MICROWAVES |
IT6725888 | 1988-03-23 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0334273A2 EP0334273A2 (en) | 1989-09-27 |
EP0334273A3 true EP0334273A3 (en) | 1990-07-25 |
EP0334273B1 EP0334273B1 (en) | 1993-09-29 |
Family
ID=11300918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP89104997A Expired - Lifetime EP0334273B1 (en) | 1988-03-23 | 1989-03-21 | A fixture for measuring the static characteristics of microwave 3-terminal active components |
Country Status (6)
Country | Link |
---|---|
US (1) | US4912402A (en) |
EP (1) | EP0334273B1 (en) |
JP (1) | JPH0677045B2 (en) |
CA (1) | CA1305219C (en) |
DE (2) | DE334273T1 (en) |
IT (1) | IT1219140B (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5477137A (en) * | 1992-10-02 | 1995-12-19 | Motorola, Inc. | Probeable substrate substitute for a calibration standard and test fixture |
US5420506A (en) * | 1993-06-18 | 1995-05-30 | Industrial Technology Research Institute | Apparatus and method for testing packaged integrated circuits |
USRE45667E1 (en) * | 2000-06-13 | 2015-09-08 | Christos Tsironis | Adaptable pre-matched tuner system and method |
US11029351B1 (en) * | 2018-08-20 | 2021-06-08 | Christos Tsironis | Transforming load pull test fixture for wave measurements |
RU2770299C1 (en) * | 2021-03-19 | 2022-04-15 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Пензенский государственный университет" | Method for determining the parameters of a three-element resonant two-pole and a measuring circuit for its implementation |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT1125389B (en) * | 1979-06-28 | 1986-05-14 | Cise Spa | PERIODIC STRUCTURE FOR THE TRANSMISSION OF SLOW WAVE SIGNALS FOR MINIATURIZED MONOLITHIC CIRCUIT ELEMENTS OPERATING AT MICROWAVE FREQUENCY |
JPS57115852A (en) * | 1981-01-10 | 1982-07-19 | Mitsubishi Electric Corp | Microwave transistor mount |
US4535307A (en) * | 1982-06-30 | 1985-08-13 | Raytheon Company | Microwave circuit device package |
US4538124A (en) * | 1984-02-10 | 1985-08-27 | Rca Corporation | Planar microwave circuit component mounting system |
US4733209A (en) * | 1986-06-27 | 1988-03-22 | Augat Inc. | Ceramic Scrambler module |
JPS6313502A (en) * | 1986-07-04 | 1988-01-20 | Yuniden Kk | Microwave directional coupler |
US4764723A (en) * | 1986-11-10 | 1988-08-16 | Cascade Microtech, Inc. | Wafer probe |
FR2608772B1 (en) * | 1986-12-23 | 1989-03-31 | Thomson Semiconducteurs | DEVICE FOR MEASURING THE CHARACTERISTICS OF A MICROWAVE COMPONENT |
-
1988
- 1988-03-23 IT IT67258/88A patent/IT1219140B/en active
-
1989
- 1989-02-27 US US07/316,409 patent/US4912402A/en not_active Expired - Fee Related
- 1989-03-08 JP JP1053979A patent/JPH0677045B2/en not_active Expired - Lifetime
- 1989-03-10 CA CA000593370A patent/CA1305219C/en not_active Expired - Lifetime
- 1989-03-21 DE DE198989104997T patent/DE334273T1/en active Pending
- 1989-03-21 DE DE89104997T patent/DE68909456T2/en not_active Expired - Fee Related
- 1989-03-21 EP EP89104997A patent/EP0334273B1/en not_active Expired - Lifetime
Non-Patent Citations (3)
Title |
---|
1979 IEEE MIT'S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, pages 99-101, The Insititute of Electrical and Electronic Engineers, Inc., New York, US; R.Q. LANE et al.: "A new self-calibrating transistor test fixture" * |
26TH ELECTRONIC COMPONENTS CONFERENCE, San Francisco, 26th - 28th April 1976, pages 55-60; R.E. MARKLEY et al.: "Handling automation and temperature control added to transistor S-parameter measurement" * |
PATENT ABSTRACTS OF JAPAN, vol. 6, no. 211, 23rd October 1982, page 97 E 137; & JP-A-57 115 852 (MITSUBISHI DENKI K.K.) 19-07-1982 * |
Also Published As
Publication number | Publication date |
---|---|
DE68909456T2 (en) | 1994-03-03 |
EP0334273B1 (en) | 1993-09-29 |
DE334273T1 (en) | 1990-12-20 |
JPH01276077A (en) | 1989-11-06 |
JPH0677045B2 (en) | 1994-09-28 |
IT8867258A0 (en) | 1988-03-23 |
US4912402A (en) | 1990-03-27 |
DE68909456D1 (en) | 1993-11-04 |
IT1219140B (en) | 1990-05-03 |
CA1305219C (en) | 1992-07-14 |
EP0334273A2 (en) | 1989-09-27 |
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Legal Events
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