DE60328409D1 - Röntgenuntersuchungsgerät - Google Patents
RöntgenuntersuchungsgerätInfo
- Publication number
- DE60328409D1 DE60328409D1 DE60328409T DE60328409T DE60328409D1 DE 60328409 D1 DE60328409 D1 DE 60328409D1 DE 60328409 T DE60328409 T DE 60328409T DE 60328409 T DE60328409 T DE 60328409T DE 60328409 D1 DE60328409 D1 DE 60328409D1
- Authority
- DE
- Germany
- Prior art keywords
- investigation unit
- investigation
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000011835 investigation Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14665—Imagers using a photoconductor layer
- H01L27/14676—X-ray, gamma-ray or corpuscular radiation imagers
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP02079795 | 2002-11-19 | ||
PCT/IB2003/004818 WO2004047179A1 (en) | 2002-11-19 | 2003-10-27 | X-ray examination apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60328409D1 true DE60328409D1 (de) | 2009-08-27 |
Family
ID=32319621
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60328409T Expired - Lifetime DE60328409D1 (de) | 2002-11-19 | 2003-10-27 | Röntgenuntersuchungsgerät |
Country Status (7)
Country | Link |
---|---|
US (1) | US7260180B2 (de) |
EP (1) | EP1565942B1 (de) |
JP (1) | JP4388899B2 (de) |
CN (1) | CN100449765C (de) |
AU (1) | AU2003274488A1 (de) |
DE (1) | DE60328409D1 (de) |
WO (1) | WO2004047179A1 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7884438B2 (en) * | 2005-07-29 | 2011-02-08 | Varian Medical Systems, Inc. | Megavoltage imaging with a photoconductor based sensor |
GB2433648A (en) * | 2005-12-21 | 2007-06-27 | Durham Scient Crystals Ltd | Radiation detector formed by deposition of bulk semiconductor crystal layers |
US7564950B2 (en) * | 2006-02-17 | 2009-07-21 | Siemens Medical Solutions Usa, Inc. | Multi-leaf collimator based field size clipping for automatic adaptation to allowed image area |
JP4882456B2 (ja) * | 2006-03-31 | 2012-02-22 | 株式会社Ihi | イオン注入装置 |
WO2013188498A2 (en) * | 2012-06-12 | 2013-12-19 | Arizona Board Of Regents Acting For And On Behalf Of Arizona State University | Imaging system and methods of manufacturing and using the same |
CN104597060B (zh) * | 2015-01-09 | 2018-01-16 | 中国科学院高能物理研究所 | 一种用于平板探测器的安装结构 |
WO2019019041A1 (en) | 2017-07-26 | 2019-01-31 | Shenzhen Xpectvision Technology Co., Ltd. | METHODS OF MAKING AND USING X-RAY DETECTORS |
CN109171791A (zh) * | 2018-10-17 | 2019-01-11 | 上海联影医疗科技有限公司 | 一种ct参考探测器及ct探测结构 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0293094B1 (de) * | 1987-05-26 | 1993-11-18 | Matsushita Electric Industrial Co., Ltd. | Strahlungsdetektor |
US5886353A (en) * | 1995-04-21 | 1999-03-23 | Thermotrex Corporation | Imaging device |
GB2318448B (en) | 1996-10-18 | 2002-01-16 | Simage Oy | Imaging detector and method of production |
JP3649907B2 (ja) | 1998-01-20 | 2005-05-18 | シャープ株式会社 | 二次元画像検出器およびその製造方法 |
WO2001003418A1 (en) * | 1999-07-05 | 2001-01-11 | Koninklijke Philips Electronics N.V. | Image detector |
WO2001008224A1 (en) * | 1999-07-26 | 2001-02-01 | Edge Medical Devices Ltd. | Digital detector for x-ray imaging |
JP2001187046A (ja) * | 1999-12-27 | 2001-07-10 | Ge Medical Systems Global Technology Co Llc | マルチスライスx線ct装置及びその制御方法 |
JP4280024B2 (ja) * | 2001-04-23 | 2009-06-17 | 株式会社東芝 | X線平面検出器 |
US6488409B1 (en) * | 2001-06-05 | 2002-12-03 | Ge Medical Systems Global Technology Company, Llc | X-ray detector image quality test techniques |
-
2003
- 2003-10-27 EP EP03758463A patent/EP1565942B1/de not_active Expired - Lifetime
- 2003-10-27 CN CNB200380103521XA patent/CN100449765C/zh not_active Expired - Fee Related
- 2003-10-27 AU AU2003274488A patent/AU2003274488A1/en not_active Abandoned
- 2003-10-27 JP JP2004552952A patent/JP4388899B2/ja not_active Expired - Fee Related
- 2003-10-27 WO PCT/IB2003/004818 patent/WO2004047179A1/en active Application Filing
- 2003-10-27 DE DE60328409T patent/DE60328409D1/de not_active Expired - Lifetime
- 2003-10-27 US US10/535,058 patent/US7260180B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP4388899B2 (ja) | 2009-12-24 |
JP2006506157A (ja) | 2006-02-23 |
US7260180B2 (en) | 2007-08-21 |
EP1565942B1 (de) | 2009-07-15 |
WO2004047179A1 (en) | 2004-06-03 |
CN1711642A (zh) | 2005-12-21 |
EP1565942A1 (de) | 2005-08-24 |
AU2003274488A1 (en) | 2004-06-15 |
CN100449765C (zh) | 2009-01-07 |
US20060056593A1 (en) | 2006-03-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |