DE60310026D1 - Pipeline Analog-Digital-Wandler mit Korrektion von Verstärkungsfehlern zwischen den Stufen - Google Patents
Pipeline Analog-Digital-Wandler mit Korrektion von Verstärkungsfehlern zwischen den StufenInfo
- Publication number
- DE60310026D1 DE60310026D1 DE60310026T DE60310026T DE60310026D1 DE 60310026 D1 DE60310026 D1 DE 60310026D1 DE 60310026 T DE60310026 T DE 60310026T DE 60310026 T DE60310026 T DE 60310026T DE 60310026 D1 DE60310026 D1 DE 60310026D1
- Authority
- DE
- Germany
- Prior art keywords
- stages
- correction
- digital converter
- gain errors
- pipeline analog
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
- H03M1/0617—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
- H03M1/0634—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale
- H03M1/0636—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the amplitude domain
- H03M1/0639—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the amplitude domain using dither, e.g. using triangular or sawtooth waveforms
- H03M1/0641—Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence by averaging out the errors, e.g. using sliding scale in the amplitude domain using dither, e.g. using triangular or sawtooth waveforms the dither being a random signal
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
- H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
- H03M1/164—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages
- H03M1/167—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages all stages comprising simultaneous converters
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03425033A EP1441445B1 (de) | 2003-01-24 | 2003-01-24 | Pipeline Analog-Digital-Wandler mit Korrektion von Verstärkungsfehlern zwischen den Stufen |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60310026D1 true DE60310026D1 (de) | 2007-01-11 |
Family
ID=32524306
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60310026T Expired - Lifetime DE60310026D1 (de) | 2003-01-24 | 2003-01-24 | Pipeline Analog-Digital-Wandler mit Korrektion von Verstärkungsfehlern zwischen den Stufen |
Country Status (3)
Country | Link |
---|---|
US (1) | US6970125B2 (de) |
EP (1) | EP1441445B1 (de) |
DE (1) | DE60310026D1 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE60307226D1 (de) * | 2003-02-18 | 2006-09-14 | St Microelectronics Srl | Analog-Digital-Wandler mit Korrektur von Verschiebungsfehlern |
US7280064B2 (en) | 2005-09-08 | 2007-10-09 | Realtek Semiconductor Corp. | Pipeline ADC with minimum overhead digital error correction |
SE530696C2 (sv) * | 2006-12-19 | 2008-08-19 | Radarbolaget I Gaevle Ab | Metod och anordning för detektering av rörelse hos ytan hos ett objekt |
US7602323B2 (en) * | 2007-04-04 | 2009-10-13 | The Regents Of The University Of California | Digital background correction of nonlinear error ADC's |
US9402062B2 (en) * | 2007-07-18 | 2016-07-26 | Mediatek Inc. | Digital television chip, system and method thereof |
US7592938B2 (en) * | 2007-07-23 | 2009-09-22 | Mediatek Inc. | Analog-to-digital converter and method of gain error calibration thereof |
US7554469B2 (en) * | 2007-08-21 | 2009-06-30 | Mediatek Inc. | Method for gain error estimation in an analog-to-digital converter and module thereof |
US20090055127A1 (en) * | 2007-08-21 | 2009-02-26 | Mediatek Inc. | Method for gain error estimation for an analog-to-digital converter |
US7522085B1 (en) * | 2007-10-29 | 2009-04-21 | Texas Instruments Incorporated | Pipelined analog to digital converter without input sample/hold |
US8279955B1 (en) * | 2008-01-15 | 2012-10-02 | Marvell International Ltd. | Systems and methods for calibrating digital baseband DC offset in an OFDM receiver |
EP2335355A1 (de) | 2008-10-06 | 2011-06-22 | Nxp B.V. | Verfahren zur verstärkungskalibration einer adc-stufe und adc-stufe |
US8791844B2 (en) * | 2011-06-09 | 2014-07-29 | Microchip Technology Incorporated | Modified dynamic element matching for reduced latency in a pipeline analog to digital converter |
US8497789B2 (en) * | 2011-06-10 | 2013-07-30 | Microchip Technology Incorporated | Modified dynamic element matching for reduced latency in a pipeline analog to digital converter |
US8717209B2 (en) * | 2012-09-05 | 2014-05-06 | Broadcom Corporation | Successive equalizer for analog-to-digital converter (ADC) error correction |
US8866662B1 (en) * | 2012-10-21 | 2014-10-21 | Steve Naumov | Sequential analog/digital conversion and multiplication |
US9281831B2 (en) * | 2014-03-07 | 2016-03-08 | Integrated Device Technology, Inc. | Digital extraction and correction of the linearity of a residue amplifier in a pipeline ADC |
RU2571916C2 (ru) * | 2014-05-12 | 2015-12-27 | Российская Федерация, от имени которой выступает Министерство обороны Российской Федерации | Способ каскадно-конвейерного аналого-цифрового преобразования |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6103598A (en) * | 1995-07-13 | 2000-08-15 | Canon Kabushiki Kaisha | Process for producing semiconductor substrate |
US6143628A (en) * | 1997-03-27 | 2000-11-07 | Canon Kabushiki Kaisha | Semiconductor substrate and method of manufacturing the same |
US6328796B1 (en) * | 1999-02-01 | 2001-12-11 | The United States Of America As Represented By The Secretary Of The Navy | Single-crystal material on non-single-crystalline substrate |
US6362082B1 (en) * | 1999-06-28 | 2002-03-26 | Intel Corporation | Methodology for control of short channel effects in MOS transistors |
US6656822B2 (en) * | 1999-06-28 | 2003-12-02 | Intel Corporation | Method for reduced capacitance interconnect system using gaseous implants into the ILD |
US6180487B1 (en) * | 1999-10-25 | 2001-01-30 | Advanced Micro Devices, Inc. | Selective thinning of barrier oxide through masked SIMOX implant |
US6455397B1 (en) * | 1999-11-16 | 2002-09-24 | Rona E. Belford | Method of producing strained microelectronic and/or optical integrated and discrete devices |
US6466153B1 (en) * | 1999-12-23 | 2002-10-15 | Texas Instruments Incorporated | Highspeed, high spurious-free dynamic range pipelined analog to digital converter |
US6337651B1 (en) * | 2000-02-17 | 2002-01-08 | Advanced Micro Devices, Inc. | Pipeline analog to digital (A/D) converter with relaxed accuracy requirement for sample and hold stage |
TW452866B (en) * | 2000-02-25 | 2001-09-01 | Lee Tien Hsi | Manufacturing method of thin film on a substrate |
US6486820B1 (en) * | 2001-03-19 | 2002-11-26 | Cisco Systems Wireless Networking (Australia) Pty Limited | Pipeline analog-to-digital converter with common mode following reference generator |
US6606042B2 (en) * | 2001-05-23 | 2003-08-12 | Texas Instruments Incorporated | True background calibration of pipelined analog digital converters |
US6514836B2 (en) * | 2001-06-04 | 2003-02-04 | Rona Elizabeth Belford | Methods of producing strained microelectronic and/or optical integrated and discrete devices |
US6689671B1 (en) * | 2002-05-22 | 2004-02-10 | Advanced Micro Devices, Inc. | Low temperature solid-phase epitaxy fabrication process for MOS devices built on strained semiconductor substrate |
US6753801B2 (en) * | 2002-08-23 | 2004-06-22 | Micron Technology, Inc. | Fully differential reference driver for pipeline analog to digital converter |
US6778126B2 (en) * | 2002-11-21 | 2004-08-17 | Analog Devices, Inc. | Structures and methods that improve the linearity of analog-to-digital converters with introduced nonlinearities |
US7198974B2 (en) * | 2003-03-05 | 2007-04-03 | Micron Technology, Inc. | Micro-mechanically strained semiconductor film |
US7041575B2 (en) * | 2003-04-29 | 2006-05-09 | Micron Technology, Inc. | Localized strained semiconductor on insulator |
US7220656B2 (en) * | 2003-04-29 | 2007-05-22 | Micron Technology, Inc. | Strained semiconductor by wafer bonding with misorientation |
US7115480B2 (en) * | 2003-05-07 | 2006-10-03 | Micron Technology, Inc. | Micromechanical strained semiconductor by wafer bonding |
US7008854B2 (en) * | 2003-05-21 | 2006-03-07 | Micron Technology, Inc. | Silicon oxycarbide substrates for bonded silicon on insulator |
US7501329B2 (en) * | 2003-05-21 | 2009-03-10 | Micron Technology, Inc. | Wafer gettering using relaxed silicon germanium epitaxial proximity layers |
US7273788B2 (en) * | 2003-05-21 | 2007-09-25 | Micron Technology, Inc. | Ultra-thin semiconductors bonded on glass substrates |
US7439158B2 (en) * | 2003-07-21 | 2008-10-21 | Micron Technology, Inc. | Strained semiconductor by full wafer bonding |
US6929984B2 (en) * | 2003-07-21 | 2005-08-16 | Micron Technology Inc. | Gettering using voids formed by surface transformation |
US7153753B2 (en) * | 2003-08-05 | 2006-12-26 | Micron Technology, Inc. | Strained Si/SiGe/SOI islands and processes of making same |
-
2003
- 2003-01-24 DE DE60310026T patent/DE60310026D1/de not_active Expired - Lifetime
- 2003-01-24 EP EP03425033A patent/EP1441445B1/de not_active Expired - Fee Related
-
2004
- 2004-01-23 US US10/764,133 patent/US6970125B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US20040217896A1 (en) | 2004-11-04 |
EP1441445A1 (de) | 2004-07-28 |
US6970125B2 (en) | 2005-11-29 |
EP1441445B1 (de) | 2006-11-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |