DE60302387D1 - Messpunktauswahl zur Erstellung eines Bitfehlerratediagramms - Google Patents

Messpunktauswahl zur Erstellung eines Bitfehlerratediagramms

Info

Publication number
DE60302387D1
DE60302387D1 DE60302387T DE60302387T DE60302387D1 DE 60302387 D1 DE60302387 D1 DE 60302387D1 DE 60302387 T DE60302387 T DE 60302387T DE 60302387 T DE60302387 T DE 60302387T DE 60302387 D1 DE60302387 D1 DE 60302387D1
Authority
DE
Germany
Prior art keywords
creating
error rate
measurement point
bit error
point selection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60302387T
Other languages
English (en)
Other versions
DE60302387T2 (de
Inventor
Daniel Yves Abramovitch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of DE60302387D1 publication Critical patent/DE60302387D1/de
Application granted granted Critical
Publication of DE60302387T2 publication Critical patent/DE60302387T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00Arrangements for detecting or preventing errors in the information received
    • H04L1/20Arrangements for detecting or preventing errors in the information received using signal quality detector

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Dc Digital Transmission (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
DE60302387T 2002-06-03 2003-03-12 Messpunktauswahl zur Erstellung eines Bitfehlerratediagramms Expired - Fee Related DE60302387T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/162,405 US6745148B2 (en) 2002-06-03 2002-06-03 Intelligent test point selection for bit error rate tester-based diagrams
US162405 2002-06-03

Publications (2)

Publication Number Publication Date
DE60302387D1 true DE60302387D1 (de) 2005-12-29
DE60302387T2 DE60302387T2 (de) 2006-08-03

Family

ID=29549314

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60302387T Expired - Fee Related DE60302387T2 (de) 2002-06-03 2003-03-12 Messpunktauswahl zur Erstellung eines Bitfehlerratediagramms

Country Status (4)

Country Link
US (1) US6745148B2 (de)
EP (1) EP1370021B1 (de)
JP (1) JP2004015807A (de)
DE (1) DE60302387T2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030165259A1 (en) * 2002-02-15 2003-09-04 Balent James S. Signal analysis using image processing techniques
EP1376381A1 (de) * 2003-02-12 2004-01-02 Agilent Technologies Inc Verfahren und System zur Datenabtastung
US20050195194A1 (en) * 2004-03-08 2005-09-08 Cummings Alan K. 3-D eye diagram
US7308371B2 (en) * 2004-06-15 2007-12-11 Intel Corporation Bit error rate testing for high-speed devices
CN102624488B (zh) 2004-09-25 2015-11-25 Tq德尔达有限责任公司 循环冗余校验异常计数器归一化方法、系统和模块
US20070014572A1 (en) * 2005-04-13 2007-01-18 Sada Gilberto I Bit error rate contour-based optimum decision threshold and sampling phase selection
US20070003280A1 (en) * 2005-04-15 2007-01-04 Sada Gilberto I Method and system for determining receiver power for required bit error rate
US20060274873A1 (en) 2005-06-02 2006-12-07 Abramovitch Daniel Y Rapid data point selection for generating eye diagrams
JP4684961B2 (ja) * 2006-07-10 2011-05-18 アンリツ株式会社 試験信号検証装置
US20090107222A1 (en) * 2007-10-29 2009-04-30 Daniel Yves Abramovitch Scanning Probe Microscope with Improved Scanning Speed
US8502821B2 (en) * 2008-02-04 2013-08-06 C Speed, Llc System for three-dimensional rendering of electrical test and measurement signals
US8995514B1 (en) * 2012-09-28 2015-03-31 Xilinx, Inc. Methods of and circuits for analyzing a phase of a clock signal for receiving data
US20170089953A1 (en) * 2015-09-25 2017-03-30 Microsoft Technology Licensing, Llc Contour generation of prompted data signal
JP6672375B2 (ja) * 2018-05-16 2020-03-25 アンリツ株式会社 誤り率測定装置及び該装置のアイマージン測定方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5422761A (en) * 1992-11-20 1995-06-06 International Business Machines Corporation Disk drive with redundant recording
US20030097226A1 (en) * 2001-11-21 2003-05-22 Synthesys Apparatus and method for sampling eye diagrams with window comparators

Also Published As

Publication number Publication date
EP1370021A1 (de) 2003-12-10
US6745148B2 (en) 2004-06-01
US20030225541A1 (en) 2003-12-04
DE60302387T2 (de) 2006-08-03
EP1370021B1 (de) 2005-11-23
JP2004015807A (ja) 2004-01-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8339 Ceased/non-payment of the annual fee