DE602006021740D1 - Mikroelektronische schaltung ausgestattet mit einer thermischen schutzschaltung und thermische schutzmethode für eine mikroelektronische schaltung - Google Patents

Mikroelektronische schaltung ausgestattet mit einer thermischen schutzschaltung und thermische schutzmethode für eine mikroelektronische schaltung

Info

Publication number
DE602006021740D1
DE602006021740D1 DE602006021740T DE602006021740T DE602006021740D1 DE 602006021740 D1 DE602006021740 D1 DE 602006021740D1 DE 602006021740 T DE602006021740 T DE 602006021740T DE 602006021740 T DE602006021740 T DE 602006021740T DE 602006021740 D1 DE602006021740 D1 DE 602006021740D1
Authority
DE
Germany
Prior art keywords
thermal protection
microelectronic circuit
protection method
microelectronic
circuit equipped
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006021740T
Other languages
English (en)
Inventor
Tomas Jahelka
Jaromir Schindler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Design and Application sro
Original Assignee
STMicroelectronics Design and Application sro
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Design and Application sro filed Critical STMicroelectronics Design and Application sro
Publication of DE602006021740D1 publication Critical patent/DE602006021740D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/569—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for protection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • G01K7/015—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions using microstructures, e.g. made of silicon
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/52—Circuit arrangements for protecting such amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/441—Protection of an amplifier being implemented by clamping means
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/447—Indexing scheme relating to amplifiers the amplifier being protected to temperature influence
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/468—Indexing scheme relating to amplifiers the temperature being sensed
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/78—A comparator being used in a controlling circuit of an amplifier

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE602006021740T 2006-08-04 2006-08-04 Mikroelektronische schaltung ausgestattet mit einer thermischen schutzschaltung und thermische schutzmethode für eine mikroelektronische schaltung Active DE602006021740D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP06118479A EP1887333B1 (de) 2006-08-04 2006-08-04 Mikroelektronische schaltung ausgestattet mit einer thermischen schutzschaltung und thermische schutzmethode für eine mikroelektronische schaltung

Publications (1)

Publication Number Publication Date
DE602006021740D1 true DE602006021740D1 (de) 2011-06-16

Family

ID=37450911

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006021740T Active DE602006021740D1 (de) 2006-08-04 2006-08-04 Mikroelektronische schaltung ausgestattet mit einer thermischen schutzschaltung und thermische schutzmethode für eine mikroelektronische schaltung

Country Status (3)

Country Link
US (1) US7626799B2 (de)
EP (1) EP1887333B1 (de)
DE (1) DE602006021740D1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4992572B2 (ja) * 2007-06-26 2012-08-08 ブラザー工業株式会社 電力供給遮断回路及び液滴吐出装置
JP5053421B2 (ja) * 2010-06-16 2012-10-17 矢崎総業株式会社 信号判定システム及び温度判定システム
US8668384B2 (en) * 2010-10-07 2014-03-11 Raytheon Company System and method for detecting the temperature of an electrophoretic display device
EP2816438B1 (de) * 2013-06-20 2017-11-15 Dialog Semiconductor GmbH Aktive Klemmen für mehrstufige Verstärker in Über-/Unterspannungszuständen
EP3223109B1 (de) * 2014-11-20 2022-04-27 Beijing Vanchip Testing Technologies Co., Ltd. Leistungsregelungsverfahren, vorrichtung und kommunikationsendgerät zur verbesserung des schaltspektrums eines leistungsverstärkers
CN205175565U (zh) 2015-03-30 2016-04-20 意法半导体股份有限公司 温度传感器器件及感测系统
JP6793586B2 (ja) * 2017-03-30 2020-12-02 エイブリック株式会社 ボルテージレギュレータ
TWI646316B (zh) * 2017-12-28 2019-01-01 新唐科技股份有限公司 溫度感測電路
US10833668B2 (en) * 2019-03-07 2020-11-10 Analog Devices International Unlimited Company Integrated and distributed over temperature protection for power management switches

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4667265A (en) * 1985-12-20 1987-05-19 National Semiconductor Corporation Adaptive thermal shutdown circuit
US5070322A (en) * 1989-07-19 1991-12-03 Fuji Electric Co., Ltd. An overheating detection circuit including a reversely biased junction having a temperature dependent reverse leakage current for detecting overheating of a power integrated circuit
US5355123A (en) * 1990-07-17 1994-10-11 Fuji Electric Co., Ltd. Overheating detection circuit for detecting overheating of a power device
EP0488088B1 (de) * 1990-11-26 2000-08-02 Fuji Electric Co., Ltd. Übertemperatur-Detektorschaltung zur Detektierung der Übertemperatur einer Leistungsschaltung
DE4117508A1 (de) 1991-05-24 1992-11-26 Schering Ag Substituierte benzthiazolderivate, verfahren zu ihrer herstellung und ihre verwendung als mittel mit herbizider wirkung
GB9206058D0 (en) 1992-03-20 1992-05-06 Philips Electronics Uk Ltd A semiconductor switch and a temperature sensing circuit for such a switch
JPH1146120A (ja) * 1997-07-25 1999-02-16 Mitsubishi Electric Corp 差動増幅回路
US5955793A (en) 1998-02-11 1999-09-21 Therm-O-Disc, Incorporated High sensitivity diode temperature sensor with adjustable current source
JP3656412B2 (ja) * 1998-07-03 2005-06-08 株式会社日立製作所 車両用電力制御装置
JP2001045655A (ja) * 1999-07-28 2001-02-16 Fujitsu Ltd 温度スイッチ回路

Also Published As

Publication number Publication date
EP1887333A1 (de) 2008-02-13
US20080030914A1 (en) 2008-02-07
EP1887333A3 (de) 2008-12-17
EP1887333B1 (de) 2011-05-04
US7626799B2 (en) 2009-12-01

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