DE602005026409D1 - Integriertes ewp-stm-spinresonanzmikroskop - Google Patents
Integriertes ewp-stm-spinresonanzmikroskopInfo
- Publication number
- DE602005026409D1 DE602005026409D1 DE602005026409T DE602005026409T DE602005026409D1 DE 602005026409 D1 DE602005026409 D1 DE 602005026409D1 DE 602005026409 T DE602005026409 T DE 602005026409T DE 602005026409 T DE602005026409 T DE 602005026409T DE 602005026409 D1 DE602005026409 D1 DE 602005026409D1
- Authority
- DE
- Germany
- Prior art keywords
- spin resonance
- microscope
- integrated
- stm
- tip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/60—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
- G01N24/10—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using electron paramagnetic resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
- G01Q60/12—STS [Scanning Tunnelling Spectroscopy]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/26—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
- G01R33/323—Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/44—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR]
- G01R33/48—NMR imaging systems
- G01R33/4808—Multimodal MR, e.g. MR combined with positron emission tomography [PET], MR combined with ultrasound or MR combined with computed tomography [CT]
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Nanotechnology (AREA)
- Biochemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Networks Using Active Elements (AREA)
- Luminescent Compositions (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Semiconductor Lasers (AREA)
- Magnetic Resonance Imaging Apparatus (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US60632404P | 2004-08-31 | 2004-08-31 | |
US11/216,931 US7109706B2 (en) | 2004-08-31 | 2005-08-30 | Integrated EWP-STM spin resonance microscope |
PCT/US2005/031514 WO2006026770A2 (en) | 2004-08-31 | 2005-08-31 | Integrated ewp-stm spin resonance microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602005026409D1 true DE602005026409D1 (de) | 2011-03-31 |
Family
ID=36000757
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602005026409T Active DE602005026409D1 (de) | 2004-08-31 | 2005-08-31 | Integriertes ewp-stm-spinresonanzmikroskop |
Country Status (5)
Country | Link |
---|---|
US (1) | US7109706B2 (de) |
EP (1) | EP1784932B1 (de) |
AT (1) | ATE498837T1 (de) |
DE (1) | DE602005026409D1 (de) |
WO (1) | WO2006026770A2 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006015379A2 (en) * | 2004-08-02 | 2006-02-09 | Cornell Research Foundation, Inc. | Electron spin resonance microscope for imaging with micron resolution |
WO2006063205A2 (en) * | 2004-12-08 | 2006-06-15 | Intematix Corporation | High throughput screening of catalysts using spin resonance |
US7199584B2 (en) * | 2005-06-07 | 2007-04-03 | Research Foundation Of The City University Of New York | Method and apparatus for high resolution nuclear magnetic resonance imaging and spectroscopy |
US7361893B1 (en) * | 2005-09-30 | 2008-04-22 | Ut-Battelle, Llc | In situ scanning tunneling microscope tip treatment device for spin polarization imaging |
DE102009038472A1 (de) * | 2009-08-21 | 2011-02-24 | Karlsruher Institut für Technologie | LASER-Feld-NMR/MRI sehr großer Magnetfelder und Gradienten |
US10712297B2 (en) * | 2015-04-17 | 2020-07-14 | New York University | Systems and methods for super-resolution surface-layer microscopy using magnetic resonance |
US11921067B2 (en) * | 2015-04-17 | 2024-03-05 | New York University | System and method for magnetic resonance mapping of physical and chemical changes in conducting structures |
WO2016168517A1 (en) * | 2015-04-17 | 2016-10-20 | New York University | Systems and methods for super-resolution surface-layer microscopy using magnetic resonance |
US10753990B2 (en) * | 2017-11-10 | 2020-08-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and apparatus for measuring magnetic field strength |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR950012094A (ko) * | 1993-10-04 | 1995-05-16 | 가나이 쯔또무 | 미소부 물성정보 측정장치 |
US5489774A (en) * | 1994-09-20 | 1996-02-06 | The Board Of Trustees Of The Leland Stanford University | Combined atomic force and near field scanning optical microscope with photosensitive cantilever |
EP0726444B1 (de) * | 1995-02-10 | 2001-10-31 | Bruker Analytik Gmbh | Magnetisches Resonanzverfahren und Vorrichtung zum Wahrnehmen der Atomarstruktur einer Probe längs deren Oberfläche |
US5821410A (en) * | 1996-09-20 | 1998-10-13 | Regents Of The University Of California | Scanning tip microwave near field microscope |
JP3639684B2 (ja) * | 1997-01-13 | 2005-04-20 | キヤノン株式会社 | エバネッセント波検出用の微小探針とその製造方法、及び該微小探針を備えたプローブとその製造方法、並びに該微小探針を備えたエバネッセント波検出装置、近視野走査光学顕微鏡、情報再生装置 |
US6946835B1 (en) * | 2002-02-09 | 2005-09-20 | Intematix Corporation | Spatially resolved spin resonance detection |
US6693426B1 (en) * | 2002-02-09 | 2004-02-17 | Intematix Corporation | Spatially resolved spin resonance detection |
-
2005
- 2005-08-30 US US11/216,931 patent/US7109706B2/en not_active Expired - Fee Related
- 2005-08-31 AT AT05794127T patent/ATE498837T1/de not_active IP Right Cessation
- 2005-08-31 EP EP05794127A patent/EP1784932B1/de not_active Not-in-force
- 2005-08-31 DE DE602005026409T patent/DE602005026409D1/de active Active
- 2005-08-31 WO PCT/US2005/031514 patent/WO2006026770A2/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
US20060071662A1 (en) | 2006-04-06 |
US7109706B2 (en) | 2006-09-19 |
EP1784932A2 (de) | 2007-05-16 |
WO2006026770A2 (en) | 2006-03-09 |
ATE498837T1 (de) | 2011-03-15 |
EP1784932B1 (de) | 2011-02-16 |
WO2006026770A3 (en) | 2006-07-27 |
EP1784932A4 (de) | 2009-10-21 |
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