ATE498837T1 - Integriertes ewp-stm-spinresonanzmikroskop - Google Patents

Integriertes ewp-stm-spinresonanzmikroskop

Info

Publication number
ATE498837T1
ATE498837T1 AT05794127T AT05794127T ATE498837T1 AT E498837 T1 ATE498837 T1 AT E498837T1 AT 05794127 T AT05794127 T AT 05794127T AT 05794127 T AT05794127 T AT 05794127T AT E498837 T1 ATE498837 T1 AT E498837T1
Authority
AT
Austria
Prior art keywords
spin resonance
microscope
integrated
stm
tip
Prior art date
Application number
AT05794127T
Other languages
English (en)
Inventor
Xiao-Dong Xiang
Haitao Yang
Original Assignee
Intematix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intematix Corp filed Critical Intematix Corp
Application granted granted Critical
Publication of ATE498837T1 publication Critical patent/ATE498837T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/60—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
    • G01N24/10—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using electron paramagnetic resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/12—STS [Scanning Tunnelling Spectroscopy]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/26—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
    • G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
    • G01R33/323—Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/44—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR]
    • G01R33/48—NMR imaging systems
    • G01R33/4808—Multimodal MR, e.g. MR combined with positron emission tomography [PET], MR combined with ultrasound or MR combined with computed tomography [CT]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical & Material Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Nanotechnology (AREA)
  • Biochemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Networks Using Active Elements (AREA)
  • Luminescent Compositions (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Semiconductor Lasers (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
AT05794127T 2004-08-31 2005-08-31 Integriertes ewp-stm-spinresonanzmikroskop ATE498837T1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US60632404P 2004-08-31 2004-08-31
US11/216,931 US7109706B2 (en) 2004-08-31 2005-08-30 Integrated EWP-STM spin resonance microscope
PCT/US2005/031514 WO2006026770A2 (en) 2004-08-31 2005-08-31 Integrated ewp-stm spin resonance microscope

Publications (1)

Publication Number Publication Date
ATE498837T1 true ATE498837T1 (de) 2011-03-15

Family

ID=36000757

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05794127T ATE498837T1 (de) 2004-08-31 2005-08-31 Integriertes ewp-stm-spinresonanzmikroskop

Country Status (5)

Country Link
US (1) US7109706B2 (de)
EP (1) EP1784932B1 (de)
AT (1) ATE498837T1 (de)
DE (1) DE602005026409D1 (de)
WO (1) WO2006026770A2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2006015379A2 (en) * 2004-08-02 2006-02-09 Cornell Research Foundation, Inc. Electron spin resonance microscope for imaging with micron resolution
WO2006063205A2 (en) * 2004-12-08 2006-06-15 Intematix Corporation High throughput screening of catalysts using spin resonance
US7199584B2 (en) * 2005-06-07 2007-04-03 Research Foundation Of The City University Of New York Method and apparatus for high resolution nuclear magnetic resonance imaging and spectroscopy
US7361893B1 (en) * 2005-09-30 2008-04-22 Ut-Battelle, Llc In situ scanning tunneling microscope tip treatment device for spin polarization imaging
DE102009038472A1 (de) * 2009-08-21 2011-02-24 Karlsruher Institut für Technologie LASER-Feld-NMR/MRI sehr großer Magnetfelder und Gradienten
US10712297B2 (en) * 2015-04-17 2020-07-14 New York University Systems and methods for super-resolution surface-layer microscopy using magnetic resonance
US11921067B2 (en) * 2015-04-17 2024-03-05 New York University System and method for magnetic resonance mapping of physical and chemical changes in conducting structures
WO2016168517A1 (en) * 2015-04-17 2016-10-20 New York University Systems and methods for super-resolution surface-layer microscopy using magnetic resonance
US10753990B2 (en) * 2017-11-10 2020-08-25 Taiwan Semiconductor Manufacturing Co., Ltd. Method and apparatus for measuring magnetic field strength

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR950012094A (ko) * 1993-10-04 1995-05-16 가나이 쯔또무 미소부 물성정보 측정장치
US5489774A (en) * 1994-09-20 1996-02-06 The Board Of Trustees Of The Leland Stanford University Combined atomic force and near field scanning optical microscope with photosensitive cantilever
EP0726444B1 (de) * 1995-02-10 2001-10-31 Bruker Analytik Gmbh Magnetisches Resonanzverfahren und Vorrichtung zum Wahrnehmen der Atomarstruktur einer Probe längs deren Oberfläche
US5821410A (en) * 1996-09-20 1998-10-13 Regents Of The University Of California Scanning tip microwave near field microscope
JP3639684B2 (ja) * 1997-01-13 2005-04-20 キヤノン株式会社 エバネッセント波検出用の微小探針とその製造方法、及び該微小探針を備えたプローブとその製造方法、並びに該微小探針を備えたエバネッセント波検出装置、近視野走査光学顕微鏡、情報再生装置
US6946835B1 (en) * 2002-02-09 2005-09-20 Intematix Corporation Spatially resolved spin resonance detection
US6693426B1 (en) * 2002-02-09 2004-02-17 Intematix Corporation Spatially resolved spin resonance detection

Also Published As

Publication number Publication date
US20060071662A1 (en) 2006-04-06
US7109706B2 (en) 2006-09-19
EP1784932A2 (de) 2007-05-16
WO2006026770A2 (en) 2006-03-09
DE602005026409D1 (de) 2011-03-31
EP1784932B1 (de) 2011-02-16
WO2006026770A3 (en) 2006-07-27
EP1784932A4 (de) 2009-10-21

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