DE602005015848D1 - METHOD AND SYSTEM FOR CONTROLLING INTERCHANGEABLE COMPONENTS IN A MODULAR TEST SYSTEM - Google Patents

METHOD AND SYSTEM FOR CONTROLLING INTERCHANGEABLE COMPONENTS IN A MODULAR TEST SYSTEM

Info

Publication number
DE602005015848D1
DE602005015848D1 DE602005015848T DE602005015848T DE602005015848D1 DE 602005015848 D1 DE602005015848 D1 DE 602005015848D1 DE 602005015848 T DE602005015848 T DE 602005015848T DE 602005015848 T DE602005015848 T DE 602005015848T DE 602005015848 D1 DE602005015848 D1 DE 602005015848D1
Authority
DE
Germany
Prior art keywords
interchangeable components
modular test
test system
controlling
controlling interchangeable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005015848T
Other languages
German (de)
Inventor
Ankan Pramanick
Mark Elston
Toshiaki Adachi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/917,916 external-priority patent/US7184917B2/en
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602005015848D1 publication Critical patent/DE602005015848D1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

DE602005015848T 2004-05-22 2005-05-23 METHOD AND SYSTEM FOR CONTROLLING INTERCHANGEABLE COMPONENTS IN A MODULAR TEST SYSTEM Active DE602005015848D1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US57357704P 2004-05-22 2004-05-22
US10/917,916 US7184917B2 (en) 2003-02-14 2004-08-13 Method and system for controlling interchangeable components in a modular test system
PCT/JP2005/009815 WO2005114240A1 (en) 2004-05-22 2005-05-23 Method and system for controlling interchangeable components in a modular test system

Publications (1)

Publication Number Publication Date
DE602005015848D1 true DE602005015848D1 (en) 2009-09-17

Family

ID=38131583

Family Applications (3)

Application Number Title Priority Date Filing Date
DE602005015848T Active DE602005015848D1 (en) 2004-05-22 2005-05-23 METHOD AND SYSTEM FOR CONTROLLING INTERCHANGEABLE COMPONENTS IN A MODULAR TEST SYSTEM
DE602005018205T Active DE602005018205D1 (en) 2004-05-22 2005-05-23 PROCESS AND STRUCTURE FOR DEVELOPING A TEST PROGRAM FOR INTEGRATED SEMICONDUCTOR CIRCUITS
DE602005018204T Active DE602005018204D1 (en) 2004-05-22 2005-05-23 PROCESS AND STRUCTURE FOR DEVELOPING A TEST PROGRAM FOR INTEGRATED SEMICONDUCTOR CIRCUITS

Family Applications After (2)

Application Number Title Priority Date Filing Date
DE602005018205T Active DE602005018205D1 (en) 2004-05-22 2005-05-23 PROCESS AND STRUCTURE FOR DEVELOPING A TEST PROGRAM FOR INTEGRATED SEMICONDUCTOR CIRCUITS
DE602005018204T Active DE602005018204D1 (en) 2004-05-22 2005-05-23 PROCESS AND STRUCTURE FOR DEVELOPING A TEST PROGRAM FOR INTEGRATED SEMICONDUCTOR CIRCUITS

Country Status (4)

Country Link
JP (1) JP4332200B2 (en)
CN (6) CN100541218C (en)
AT (3) ATE438865T1 (en)
DE (3) DE602005015848D1 (en)

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US7925940B2 (en) * 2007-10-17 2011-04-12 Synopsys, Inc. Enhancing speed of simulation of an IC design while testing scan circuitry
US8094566B2 (en) * 2009-12-24 2012-01-10 Advantest Corporation Test apparatus and test method
CN102215140B (en) * 2010-04-02 2013-03-27 英业达股份有限公司 Checking device for storage area network
CN102378232A (en) * 2010-08-23 2012-03-14 财团法人资讯工业策进会 Wireless network signal test system and measuring method thereof
CN103109275B (en) * 2010-09-07 2016-02-03 爱德万测试公司 The system of virtual instrument, method and apparatus is used in semiconductor test environment
CN101980174B (en) * 2010-11-24 2012-07-04 中国人民解放军国防科学技术大学 Method for automatically testing energy consumption of computer application program interval
JP2012167958A (en) * 2011-02-10 2012-09-06 Nippon Syst Wear Kk Examination information display, method, program, and computer readable medium storing such software
CN102608517A (en) * 2012-02-16 2012-07-25 工业和信息化部电子第五研究所 Method for rapidly creating integrated circuit test program package
US9606183B2 (en) * 2012-10-20 2017-03-28 Advantest Corporation Pseudo tester-per-site functionality on natively tester-per-pin automatic test equipment for semiconductor test
US10161993B2 (en) * 2013-02-21 2018-12-25 Advantest Corporation Tester with acceleration on memory and acceleration for automatic pattern generation within a FPGA block
JP6174898B2 (en) * 2013-04-30 2017-08-02 ルネサスエレクトロニクス株式会社 Semiconductor test equipment
TWI490689B (en) * 2013-05-17 2015-07-01 英業達股份有限公司 System for updating test command and method thereof
CN104298590B (en) * 2013-07-16 2019-05-10 爱德万测试公司 For pressing the quick semantic processor of pin APG
CN103413003B (en) * 2013-08-21 2016-07-06 浪潮(北京)电子信息产业有限公司 A kind of sequence transmission, reception device and method
KR102147172B1 (en) * 2014-04-09 2020-08-31 삼성전자주식회사 System on chip and verification method thereof
US9672020B2 (en) 2014-09-19 2017-06-06 Microsoft Technology Licensing, Llc Selectively loading precompiled header(s) and/or portion(s) thereof
US10955804B2 (en) 2014-12-17 2021-03-23 Siemens Aktiengesellchaft Checking a functional module of an automation installation
CN107454124B (en) * 2016-05-31 2020-11-03 创新先进技术有限公司 Equipment automation method and device
CN106507098B (en) * 2016-10-09 2018-10-19 珠海市魅族科技有限公司 The method and apparatus of data processing
CN106603074A (en) * 2016-11-03 2017-04-26 武汉新芯集成电路制造有限公司 DAC circuit parallel testing system and parallel testing method
CN107959981B (en) * 2017-10-30 2020-07-10 捷开通讯(深圳)有限公司 Communication terminal and communication testing method
CN109324956B (en) * 2018-08-20 2021-11-05 深圳前海微众银行股份有限公司 System testing method, apparatus and computer readable storage medium
CN109508290A (en) * 2018-10-25 2019-03-22 深圳点猫科技有限公司 A kind of automated testing method and electronic equipment based on educational system
CN109884923A (en) * 2019-02-21 2019-06-14 苏州天准科技股份有限公司 A kind of configurable system of automation equipment control moduleization
CN109975650B (en) * 2019-04-30 2024-07-12 珠海市运泰利自动化设备有限公司 TypeC connects even board multichannel test platform
CN110954804B (en) * 2019-12-19 2021-11-02 上海御渡半导体科技有限公司 Device and method for accurately diagnosing cBit array faults in batch
KR20230109626A (en) * 2020-12-03 2023-07-20 시놉시스, 인크. Automatic sequential retries for hardware design compile failures
CN113051114A (en) * 2021-03-19 2021-06-29 无锡市软测认证有限公司 Method for improving chip testing efficiency
CN113050952B (en) * 2021-04-19 2024-07-05 杭州至千哩科技有限公司 Pseudo instruction compiling method, pseudo instruction compiling device, computer equipment and storage medium
CN113238834B (en) * 2021-05-31 2023-08-08 北京世冠金洋科技发展有限公司 Simulation model file processing method and device and electronic equipment
CN113342649B (en) * 2021-05-31 2023-11-14 上海创景信息科技有限公司 Method, medium and equipment for realizing unit test based on real target machine
KR102314419B1 (en) * 2021-07-27 2021-10-19 (주) 에이블리 Apparatus and method for generating semiconductor test pattern
CN113740077B (en) * 2021-09-13 2024-08-16 广州文远知行科技有限公司 Vehicle chassis testing method, device, equipment and storage medium
CN114252758A (en) * 2021-12-03 2022-03-29 杭州至千哩科技有限公司 ATE test channel resource allocation method, device, equipment and storage medium
CN114646867B (en) * 2022-05-18 2022-10-28 南京宏泰半导体科技有限公司 Integrated circuit concurrent testing device and method
CN115630594B (en) * 2022-12-19 2023-03-21 杭州加速科技有限公司 Method and system for converting chip design simulation file into Pattern file
CN116257037B (en) * 2023-05-15 2023-08-11 通达电磁能股份有限公司 Method, system, electronic device and storage medium for generating controller test program
CN116520754B (en) * 2023-06-27 2023-09-22 厦门芯泰达集成电路有限公司 DPS module control method and system based on preloading mode
CN117539700A (en) * 2023-11-13 2024-02-09 宁畅信息产业(北京)有限公司 Test management method, device, equipment and medium

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US6208439B1 (en) * 1990-11-09 2001-03-27 Litel Instruments Generalized geometric transforms for computer generated holograms
US6779140B2 (en) * 2001-06-29 2004-08-17 Agilent Technologies, Inc. Algorithmically programmable memory tester with test sites operating in a slave mode
US7178115B2 (en) * 2002-04-11 2007-02-13 Advantest Corp. Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturing

Also Published As

Publication number Publication date
JP2009008683A (en) 2009-01-15
CN100580473C (en) 2010-01-13
CN1997908A (en) 2007-07-11
DE602005018205D1 (en) 2010-01-21
CN100541218C (en) 2009-09-16
CN1997909A (en) 2007-07-11
ATE451624T1 (en) 2009-12-15
CN1997909B (en) 2010-11-10
CN1989417A (en) 2007-06-27
CN1981200A (en) 2007-06-13
JP4332200B2 (en) 2009-09-16
CN1981203A (en) 2007-06-13
CN1981202A (en) 2007-06-13
DE602005018204D1 (en) 2010-01-21
CN100585422C (en) 2010-01-27
ATE438865T1 (en) 2009-08-15
ATE451625T1 (en) 2009-12-15
CN1989417B (en) 2011-03-16

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