DE602005004276D1 - Für unregelmäßiges Abtasten geeignetes Verfahren und Vorrichtung zur Spektralschätzung - Google Patents

Für unregelmäßiges Abtasten geeignetes Verfahren und Vorrichtung zur Spektralschätzung

Info

Publication number
DE602005004276D1
DE602005004276D1 DE602005004276T DE602005004276T DE602005004276D1 DE 602005004276 D1 DE602005004276 D1 DE 602005004276D1 DE 602005004276 T DE602005004276 T DE 602005004276T DE 602005004276 T DE602005004276 T DE 602005004276T DE 602005004276 D1 DE602005004276 D1 DE 602005004276D1
Authority
DE
Germany
Prior art keywords
sample value
sub
sampling
aliasing
frequency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE602005004276T
Other languages
English (en)
Other versions
DE602005004276T2 (de
Inventor
Ivars Bilinskis
Jurijs Artjuhs
Aleksandrs Ribakovs
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INST OF ELECTRONICS AND COMP S
Original Assignee
INST OF ELECTRONICS AND COMP S
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INST OF ELECTRONICS AND COMP S filed Critical INST OF ELECTRONICS AND COMP S
Publication of DE602005004276D1 publication Critical patent/DE602005004276D1/de
Application granted granted Critical
Publication of DE602005004276T2 publication Critical patent/DE602005004276T2/de
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H03M1/1265—Non-uniform sampling
    • H03M1/128—Non-uniform sampling at random intervals, e.g. digital alias free signal processing [DASP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analogue/Digital Conversion (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
DE602005004276T 2005-07-22 2005-07-22 Für unregelmäßiges Abtasten geeignetes Verfahren und Vorrichtung zur Spektralschätzung Expired - Fee Related DE602005004276T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05015952A EP1746427B1 (de) 2005-07-22 2005-07-22 Für unregelmäßiges Abtasten geeignetes Verfahren und Vorrichtung zur Spektralschätzung

Publications (2)

Publication Number Publication Date
DE602005004276D1 true DE602005004276D1 (de) 2008-02-21
DE602005004276T2 DE602005004276T2 (de) 2008-12-24

Family

ID=35428081

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005004276T Expired - Fee Related DE602005004276T2 (de) 2005-07-22 2005-07-22 Für unregelmäßiges Abtasten geeignetes Verfahren und Vorrichtung zur Spektralschätzung

Country Status (4)

Country Link
EP (1) EP1746427B1 (de)
AT (1) ATE383583T1 (de)
DE (1) DE602005004276T2 (de)
WO (1) WO2007009558A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007046318A1 (de) * 2007-09-27 2009-04-02 Robert Bosch Gmbh Abtastverfahren
JP2011503072A (ja) 2007-11-13 2011-01-27 レノビス， インコーポレイテッド イオンチャネルのリガンドとしてのアミド誘導体ならびにそれを使用する薬学的組成物および方法
EP2282220A1 (de) * 2009-08-07 2011-02-09 Nxp B.V. Spektrumanalyse
US8917798B2 (en) 2009-12-03 2014-12-23 Qualcomm Incorporated Method and apparatus for distributed processing for wireless sensors
CN109885805B (zh) * 2019-01-29 2022-10-14 南京工业职业技术学院 一种多分量非平稳信号的瞬时频率估计方法
CN111490789B (zh) * 2020-04-15 2023-03-10 中国科学技术大学 基于伪中位数累加的周期性弱信号检测方法及装置
CN112129983B (zh) * 2020-09-25 2024-05-10 中北大学 一种基于等时间间隔等效取样的波形恢复数据处理方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5115189A (en) * 1991-02-06 1992-05-19 Hewlett-Packard Company Anti-aliasing dithering method and apparatus for low frequency signal sampling
US6477553B1 (en) * 1999-01-13 2002-11-05 Philip Druck Measurement scale for non-uniform data sampling in N dimensions
ATE332038T1 (de) * 2002-01-17 2006-07-15 Inst Of Electronics And Comp S Verfahren und gerät zur aliasunterdrückenden digitalisierung von hochfrequenzanalogsignalen

Also Published As

Publication number Publication date
EP1746427B1 (de) 2008-01-09
ATE383583T1 (de) 2008-01-15
DE602005004276T2 (de) 2008-12-24
EP1746427A1 (de) 2007-01-24
WO2007009558A1 (en) 2007-01-25

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee