DE602004019393D1 - System und Verfahren zur Messung und Kontrolle der Energie eines ultrakurzen Pulses eines Laserstrahls - Google Patents

System und Verfahren zur Messung und Kontrolle der Energie eines ultrakurzen Pulses eines Laserstrahls

Info

Publication number
DE602004019393D1
DE602004019393D1 DE602004019393T DE602004019393T DE602004019393D1 DE 602004019393 D1 DE602004019393 D1 DE 602004019393D1 DE 602004019393 T DE602004019393 T DE 602004019393T DE 602004019393 T DE602004019393 T DE 602004019393T DE 602004019393 D1 DE602004019393 D1 DE 602004019393D1
Authority
DE
Germany
Prior art keywords
energy
remainder
laser beam
measuring
lem
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004019393T
Other languages
English (en)
Inventor
Michael Schuhmacher
Markus Schiller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Technolas Perfect Vision GmbH
Original Assignee
20 10 Perfect Vision Optische Geraete GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 20 10 Perfect Vision Optische Geraete GmbH filed Critical 20 10 Perfect Vision Optische Geraete GmbH
Publication of DE602004019393D1 publication Critical patent/DE602004019393D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00Measuring the characteristics of individual optical pulses or of optical pulse trains
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Lasers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Laser Beam Processing (AREA)
DE602004019393T 2004-04-29 2004-12-20 System und Verfahren zur Messung und Kontrolle der Energie eines ultrakurzen Pulses eines Laserstrahls Expired - Lifetime DE602004019393D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/835,088 US7103077B2 (en) 2004-04-29 2004-04-29 System and method for measuring and controlling an energy of an ultra-short pulse of a laser beam

Publications (1)

Publication Number Publication Date
DE602004019393D1 true DE602004019393D1 (de) 2009-03-26

Family

ID=34928760

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004019393T Expired - Lifetime DE602004019393D1 (de) 2004-04-29 2004-12-20 System und Verfahren zur Messung und Kontrolle der Energie eines ultrakurzen Pulses eines Laserstrahls

Country Status (6)

Country Link
US (1) US7103077B2 (de)
EP (1) EP1591762B1 (de)
JP (1) JP2005315848A (de)
AT (1) ATE422664T1 (de)
DE (1) DE602004019393D1 (de)
ES (1) ES2318237T3 (de)

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CN101681119A (zh) * 2007-05-31 2010-03-24 康宁股份有限公司 具有光束指向校正的光调制器
US8953651B2 (en) 2010-02-24 2015-02-10 Alcon Lensx, Inc. High power femtosecond laser with repetition rate adjustable according to scanning speed
US20110206071A1 (en) * 2010-02-24 2011-08-25 Michael Karavitis Compact High Power Femtosecond Laser with Adjustable Repetition Rate
US9054479B2 (en) * 2010-02-24 2015-06-09 Alcon Lensx, Inc. High power femtosecond laser with adjustable repetition rate
US8718103B2 (en) 2010-03-12 2014-05-06 Electronics And Telecommunications Research Institute Apparatus for adjusting polarization characteristics, and ultra-short ultra-high intensity pulse laser generator comprising same
US8553311B2 (en) * 2010-04-02 2013-10-08 Electro Scientific Industries, Inc. Method for accomplishing high-speed intensity variation of a polarized output laser beam
CN102141436B (zh) * 2010-12-15 2012-07-04 北京理工大学 一种具有自动跟踪功能的飞焦级激光微能量计
JP5879747B2 (ja) 2011-05-26 2016-03-08 オムロン株式会社 光増幅装置およびレーザ加工装置
US20140091198A1 (en) * 2011-10-11 2014-04-03 Mitsubishi Electric Corporation Laser output measurement mechanism
US8908739B2 (en) 2011-12-23 2014-12-09 Alcon Lensx, Inc. Transverse adjustable laser beam restrictor
US10114157B2 (en) * 2012-09-20 2018-10-30 Applied Materials, Inc. Pulse width controller
EP3711161B1 (de) * 2018-03-08 2023-11-01 Alcon Inc. Detektion von spitzenlaserimpulsen unter verwendung von timings des steuersignals
WO2020139207A1 (en) * 2018-12-25 2020-07-02 Aselsan Elektroni̇k Sanayi̇ Ve Ti̇caret Anoni̇m Şi̇rketi̇ A method and apparatus for pulsed power measurement

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US4733398A (en) * 1985-09-30 1988-03-22 Kabushiki Kaisha Tohsiba Apparatus for stabilizing the optical output power of a semiconductor laser
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JPH11287707A (ja) * 1998-03-31 1999-10-19 Sumitomo Heavy Ind Ltd レーザパルスエネルギ計測装置、並びにこれを用いた加工用レーザパルス供給制御装置及び方法
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Also Published As

Publication number Publication date
EP1591762B1 (de) 2009-02-11
JP2005315848A (ja) 2005-11-10
US20050243877A1 (en) 2005-11-03
ES2318237T3 (es) 2009-05-01
US7103077B2 (en) 2006-09-05
ATE422664T1 (de) 2009-02-15
EP1591762A1 (de) 2005-11-02

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: TECHNOLAS PERFECT VISION GMBH, 80992 MUENCHEN, DE

8364 No opposition during term of opposition