DE602004006840D1 - Methode und system zur messung der spezifischen absorbtionsrate - Google Patents

Methode und system zur messung der spezifischen absorbtionsrate

Info

Publication number
DE602004006840D1
DE602004006840D1 DE602004006840T DE602004006840T DE602004006840D1 DE 602004006840 D1 DE602004006840 D1 DE 602004006840D1 DE 602004006840 T DE602004006840 T DE 602004006840T DE 602004006840 T DE602004006840 T DE 602004006840T DE 602004006840 D1 DE602004006840 D1 DE 602004006840D1
Authority
DE
Germany
Prior art keywords
phantom
measuring
field
electric field
sar
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004006840T
Other languages
English (en)
Inventor
Olivier Merckel
Jean-Charles Bolomey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUPELEC
Original Assignee
SUPELEC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUPELEC filed Critical SUPELEC
Publication of DE602004006840D1 publication Critical patent/DE602004006840D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0857—Dosimetry, i.e. measuring the time integral of radiation intensity; Level warning devices for personal safety use
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
DE602004006840T 2003-02-27 2004-02-24 Methode und system zur messung der spezifischen absorbtionsrate Expired - Lifetime DE602004006840D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0302441A FR2851823B1 (fr) 2003-02-27 2003-02-27 Procede et systeme pour mesurer un debit d'absorption specifique das
PCT/FR2004/000409 WO2004079299A2 (fr) 2003-02-27 2004-02-24 Procede et systeme pour mesurer un debit d’absorption specifique das

Publications (1)

Publication Number Publication Date
DE602004006840D1 true DE602004006840D1 (de) 2007-07-19

Family

ID=32843052

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004006840T Expired - Lifetime DE602004006840D1 (de) 2003-02-27 2004-02-24 Methode und system zur messung der spezifischen absorbtionsrate

Country Status (5)

Country Link
EP (1) EP1597601B1 (de)
AT (1) ATE364181T1 (de)
DE (1) DE602004006840D1 (de)
FR (1) FR2851823B1 (de)
WO (1) WO2004079299A2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003052435A1 (en) 2001-08-21 2003-06-26 Cascade Microtech, Inc. Membrane probing system
CN100365420C (zh) * 2003-02-26 2008-01-30 松下电器产业株式会社 无线电通信装置用比吸收率测定装置
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
CA2511134C (en) * 2004-07-05 2011-04-19 Ntt Docomo, Inc. Measurement system of specific absorption rate
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
FR2954829B1 (fr) 2009-12-31 2012-03-02 Art Fi Systeme pour mesurer un champ electromagnetique
EP2610628B1 (de) * 2011-12-30 2018-05-16 Art-Fi Messung eines elektromagnetischen Feldes
FR3039282B1 (fr) 2015-07-24 2020-12-25 Univ Rennes Dispositif pour la dosimetrie electromagnetique et methode associee

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5912554A (en) * 1995-10-30 1999-06-15 Matsushita Electric Industrial Co., Ltd. Electromagnetic radiation measuring apparatus for high frequency analysis of radiation produced by a circuit board
JP2790103B2 (ja) * 1995-12-15 1998-08-27 日本電気株式会社 比吸収率測定装置及び比吸収率測定方法
JP3147100B2 (ja) * 1998-09-18 2001-03-19 日本電気株式会社 Ｓａｒ測定センサ及びｓａｒ測定装置
EP1070966A1 (de) * 1999-07-22 2001-01-24 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Bestimmung der auf ein anatomishes Modell wirkenden elektrischen Feldstärke
FR2797327B1 (fr) * 1999-08-03 2001-11-09 France Telecom Procede et dispositif de mesure en champ proche de rayonnements radioelectriques non controles
US6525657B1 (en) * 2000-04-25 2003-02-25 Aprel, Inc. Apparatus and method for production testing of the RF performance of wireless communications devices
AU2001258966A1 (en) * 2000-05-05 2001-11-20 Integra Antennas Ltd A head phantom arrangement and method of measuring of affect of electromagnetic waves by means of this head phantom

Also Published As

Publication number Publication date
ATE364181T1 (de) 2007-06-15
FR2851823B1 (fr) 2005-09-02
EP1597601B1 (de) 2007-06-06
FR2851823A1 (fr) 2004-09-03
WO2004079299A3 (fr) 2005-01-20
WO2004079299A2 (fr) 2004-09-16
EP1597601A2 (de) 2005-11-23

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Legal Events

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8332 No legal effect for de