DE60143808D1 - Verfahren und vorrichtung zur analog/digital-umsetzung - Google Patents

Verfahren und vorrichtung zur analog/digital-umsetzung

Info

Publication number
DE60143808D1
DE60143808D1 DE60143808T DE60143808T DE60143808D1 DE 60143808 D1 DE60143808 D1 DE 60143808D1 DE 60143808 T DE60143808 T DE 60143808T DE 60143808 T DE60143808 T DE 60143808T DE 60143808 D1 DE60143808 D1 DE 60143808D1
Authority
DE
Germany
Prior art keywords
capacitance
input signal
coupling
amplifier
converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60143808T
Other languages
English (en)
Inventor
Glenn A Mayfield
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Radian Res Inc
Original Assignee
Radian Res Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Radian Res Inc filed Critical Radian Res Inc
Application granted granted Critical
Publication of DE60143808D1 publication Critical patent/DE60143808D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1019—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error by storing a corrected or correction value in a digital look-up table
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Circuits Of Receivers In General (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
DE60143808T 2000-09-15 2001-09-11 Verfahren und vorrichtung zur analog/digital-umsetzung Expired - Lifetime DE60143808D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US23318800P 2000-09-15 2000-09-15
PCT/US2001/042103 WO2002023729A1 (en) 2000-09-15 2001-09-11 Method and apparatus for analog-to-digital conversion

Publications (1)

Publication Number Publication Date
DE60143808D1 true DE60143808D1 (de) 2011-02-17

Family

ID=22876258

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60143808T Expired - Lifetime DE60143808D1 (de) 2000-09-15 2001-09-11 Verfahren und vorrichtung zur analog/digital-umsetzung

Country Status (8)

Country Link
US (1) US6833803B2 (de)
EP (1) EP1332558B1 (de)
AT (1) ATE494661T1 (de)
AU (1) AU2001293267A1 (de)
CA (1) CA2422504C (de)
DE (1) DE60143808D1 (de)
ES (1) ES2356520T3 (de)
WO (1) WO2002023729A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6850181B1 (en) * 2004-01-08 2005-02-01 National Semiconductor Corporation Apparatus and method for noise reduction for a successive approximation analog-to-digital converter circuit
US7324035B2 (en) * 2004-05-13 2008-01-29 University Of Florida Research Foundation, Inc. Amplifier with pulse coded output and remote signal reconstruction from the pulse output
US20070057834A1 (en) * 2005-09-15 2007-03-15 Wake Robert H Method and system for obtaining enhanced signal to noise ratio in a laser imaging apparatus
US7551109B1 (en) * 2007-03-14 2009-06-23 Ashmore Jr Benjamin H Method, system and apparatus for dual mode operation of a converter
JP6195543B2 (ja) * 2014-06-27 2017-09-13 ルネサスエレクトロニクス株式会社 半導体装置
US10388223B2 (en) * 2016-06-30 2019-08-20 Apple Inc. System and method for voltage and current sensing for compensation in an electronic display via analog front end
US10460642B2 (en) * 2016-06-30 2019-10-29 Apple Inc. Noise reduction in LED sensing circuit for electronic display
TWI612772B (zh) * 2016-12-21 2018-01-21 瑞昱半導體股份有限公司 數位式視訊傳輸介面中的輔助通道傳收電路
FR3068126B1 (fr) * 2017-06-27 2019-08-30 Sagemcom Energy & Telecom Sas Procede de mesure d'une vitesse d'un fluide
US10623013B1 (en) 2018-10-29 2020-04-14 Texas Instruments Incorporated Systems with pairs of voltage level shifter switches to couple voltage level shifters to anti-aliasing filters
US11057048B2 (en) * 2019-05-24 2021-07-06 Microchip Technology Incorporated Ratiometric gain error calibration schemes for delta-sigma ADCs with programmable gain amplifier input stages
CN112671405B (zh) * 2020-12-23 2023-12-12 中国原子能科学研究院 一种电离室电荷信号读出装置
CN112737534B (zh) * 2020-12-23 2023-12-12 中国原子能科学研究院 一种电离室电荷信号读出方法
US20230378972A1 (en) * 2022-05-19 2023-11-23 Novatek Microelectronics Corp. Sample and hold circuit and related driver circuit

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2547785C3 (de) 1974-10-24 1979-05-03 Tokyo Shibaura Electric Co., Ltd., Kawasaki, Kanagawa (Japan) Verfahren zur Analog-Digital-Umwandlung einer Gleichspannung und Schaltungsanordnung zur Durchführung des Verfahrens
US4229730A (en) 1979-01-29 1980-10-21 Motorola, Inc. Modified dual-slope analog to digital converter
US5027116A (en) 1987-02-24 1991-06-25 Micro Linear Corporation Self-calibrating analog to digital converter
US4918311A (en) * 1988-04-15 1990-04-17 Andros Analyzers Incorporated Set point control circuit for an infrared gas analyzer
US5012247A (en) * 1988-11-21 1991-04-30 Hewlett-Packard Company Switched-capacitor analog-to-digital converter with autocalibration
JPH04144423A (ja) * 1990-10-05 1992-05-18 Jeol Ltd Ａｄコンバータ
US5262780A (en) 1990-12-14 1993-11-16 Laurel Electronics, Inc. Analog to digital converter with conversion rate inverse to the integration period
US5148171A (en) * 1991-07-25 1992-09-15 Hewlett-Packard Company Multislope continuously integrating analog to digital converter
US5321403A (en) 1993-04-14 1994-06-14 John Fluke Mfg. Co., Inc. Multiple slope analog-to-digital converter
US5621406A (en) * 1994-09-29 1997-04-15 Rosemount Inc. System for calibrating analog-to-digital converter
US5644308A (en) * 1995-01-17 1997-07-01 Crystal Semiconductor Corporation Algorithmic analog-to-digital converter having redundancy and digital calibration
US5745060A (en) * 1996-02-12 1998-04-28 Analog Devices, Inc. Gain calibration circuitry for an analog to digital converter
DE19639410A1 (de) * 1996-09-25 1998-04-02 Siemens Ag Meßeinrichtung für elektrische Leistung
US5841310A (en) 1997-04-08 1998-11-24 Burr-Brown Corporation Current-to-voltage integrator for analog-to-digital converter, and method
US6127955A (en) 1998-11-20 2000-10-03 Telefonaktiebolaget Lm Ericsson (Publ) Method and system for calibrating analog-to-digital conversion
KR100308193B1 (ko) * 1999-06-16 2001-11-01 윤종용 플래시 아날로그-디지털 변환기

Also Published As

Publication number Publication date
AU2001293267A1 (en) 2002-03-26
ES2356520T3 (es) 2011-04-08
EP1332558B1 (de) 2011-01-05
CA2422504C (en) 2012-01-24
WO2002023729A1 (en) 2002-03-21
US6833803B2 (en) 2004-12-21
EP1332558A4 (de) 2004-06-09
CA2422504A1 (en) 2002-03-21
US20030174083A1 (en) 2003-09-18
EP1332558A1 (de) 2003-08-06
ATE494661T1 (de) 2011-01-15

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