DE60130356D1 - METHOD AND DEVICE FOR DETERMINING THE POLARIZATION PROPERTIES OF LIGHT THAT IS EMITTED, REFLECTED, OR LEVIED BY A MATERIAL THROUGH THE USE OF A LASER SCANNING MICROSCOPE - Google Patents

METHOD AND DEVICE FOR DETERMINING THE POLARIZATION PROPERTIES OF LIGHT THAT IS EMITTED, REFLECTED, OR LEVIED BY A MATERIAL THROUGH THE USE OF A LASER SCANNING MICROSCOPE

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Publication number
DE60130356D1
DE60130356D1 DE60130356T DE60130356T DE60130356D1 DE 60130356 D1 DE60130356 D1 DE 60130356D1 DE 60130356 T DE60130356 T DE 60130356T DE 60130356 T DE60130356 T DE 60130356T DE 60130356 D1 DE60130356 D1 DE 60130356D1
Authority
DE
Germany
Prior art keywords
light
determining
intensity
reflected
emitted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60130356T
Other languages
German (de)
Other versions
DE60130356T2 (en
Inventor
Gyozo Garab
Istvan Pomozi
Georg Weiss
Reinhard Joergens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Magyartudomanyos Akademia Szegedi Biologiai Ko Hu
Original Assignee
VEB Carl Zeiss Jena GmbH
Carl Zeiss Jena GmbH
MAGYAR TUDOM NYOS AKAD MIA SZE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VEB Carl Zeiss Jena GmbH, Carl Zeiss Jena GmbH, MAGYAR TUDOM NYOS AKAD MIA SZE filed Critical VEB Carl Zeiss Jena GmbH
Application granted granted Critical
Publication of DE60130356D1 publication Critical patent/DE60130356D1/en
Publication of DE60130356T2 publication Critical patent/DE60130356T2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

The invention relates to a method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope with the tested material being illuminated point by point with a laser beam of known polarization state. According to the invention the light beam with a polarization state modified by the material or the light emitted by the material is being examined by measuring the intensity of two different polarization components of a selected light beam received from each point of said material essentially at the same time and assigning a signal obtained by processing the two intensity signals to a respective point of an image of said material. The apparatus has a polarization state generator between the laser light source and the material being tested, and a detector in a light beam for determining the intensity of light with a polarization state modified by the material or the intensity of light emitted by the material, the improvement of which is that a means for dividing the polarization components in space or time is used in front of the detector.
DE60130356T 2000-11-17 2001-11-16 METHOD AND DEVICE FOR DETERMINING THE POLARIZATION PROPERTIES OF LIGHT THAT IS EMITTED, REFLECTED OR GIVEN BY A MATERIAL THROUGH USING A LASER SCANNING MICROSCOPE Expired - Lifetime DE60130356T2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
HU0004571 2000-11-17
HU0004571A HU226937B1 (en) 2000-11-17 2000-11-17 Method and apparatus for determining polarization amount of material by a laser scanning microscope
PCT/HU2001/000116 WO2002040953A1 (en) 2000-11-17 2001-11-16 Method and apparatus for determining the polarization properties of light emitted, reflected or transmitted by a material using a laser scanning microscope

Publications (2)

Publication Number Publication Date
DE60130356D1 true DE60130356D1 (en) 2007-10-18
DE60130356T2 DE60130356T2 (en) 2008-05-08

Family

ID=89978770

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60130356T Expired - Lifetime DE60130356T2 (en) 2000-11-17 2001-11-16 METHOD AND DEVICE FOR DETERMINING THE POLARIZATION PROPERTIES OF LIGHT THAT IS EMITTED, REFLECTED OR GIVEN BY A MATERIAL THROUGH USING A LASER SCANNING MICROSCOPE

Country Status (7)

Country Link
US (1) US6856391B2 (en)
EP (1) EP1334339B8 (en)
JP (1) JP2004514129A (en)
AT (1) ATE372507T1 (en)
DE (1) DE60130356T2 (en)
HU (1) HU226937B1 (en)
WO (1) WO2002040953A1 (en)

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EP2693201A4 (en) 2011-03-29 2014-10-29 Olympus Corp Photometric analysis device, photometric analysis method, and computer program for photometric analysis, using single light-emitting particle detection
CN103477210B (en) 2011-04-13 2015-09-23 奥林巴斯株式会社 The light analytical equipment utilizing single incandescnet particle to detect, light analytical approach and light analysis computer program
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CN103733049B (en) 2011-08-15 2016-01-20 奥林巴斯株式会社 The light analytical equipment utilizing single incandescnet particle to detect, light analytical approach and light analysis computer program
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JP6010033B2 (en) 2011-08-26 2016-10-19 オリンパス株式会社 Single particle detection apparatus using optical analysis, single particle detection method, and computer program for single particle detection
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CN103930768B (en) 2011-11-10 2016-05-18 奥林巴斯株式会社 The light analytical equipment, light analytical method and the light analysis computer program that utilize single incandescnet particle to detect
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Also Published As

Publication number Publication date
ATE372507T1 (en) 2007-09-15
DE60130356T2 (en) 2008-05-08
HU0004571D0 (en) 2001-02-28
HUP0004571A2 (en) 2002-07-29
WO2002040953A1 (en) 2002-05-23
EP1334339B8 (en) 2007-12-26
US6856391B2 (en) 2005-02-15
EP1334339B1 (en) 2007-09-05
US20030058442A1 (en) 2003-03-27
EP1334339A1 (en) 2003-08-13
JP2004514129A (en) 2004-05-13
HU226937B1 (en) 2010-03-29

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Owner name: MAGYAR TUDOMANYOS AKADEMIA SZEGEDI BIOLOGIAI K, HU

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