DE60121951D1 - Charakterisierung nichtlinearen Verhaltens - Google Patents
Charakterisierung nichtlinearen VerhaltensInfo
- Publication number
- DE60121951D1 DE60121951D1 DE60121951T DE60121951T DE60121951D1 DE 60121951 D1 DE60121951 D1 DE 60121951D1 DE 60121951 T DE60121951 T DE 60121951T DE 60121951 T DE60121951 T DE 60121951T DE 60121951 D1 DE60121951 D1 DE 60121951D1
- Authority
- DE
- Germany
- Prior art keywords
- characterization
- nonlinear behavior
- nonlinear
- behavior
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01203651A EP1296149B1 (de) | 2001-09-24 | 2001-09-24 | Charakterisierung nichtlinearen Verhaltens |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60121951D1 true DE60121951D1 (de) | 2006-09-14 |
DE60121951T2 DE60121951T2 (de) | 2007-04-26 |
Family
ID=8180967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60121951T Expired - Fee Related DE60121951T2 (de) | 2001-09-24 | 2001-09-24 | Charakterisierung nichtlinearen Verhaltens |
Country Status (4)
Country | Link |
---|---|
US (1) | US6839657B2 (de) |
EP (1) | EP1296149B1 (de) |
JP (1) | JP2003179562A (de) |
DE (1) | DE60121951T2 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7038468B2 (en) | 2003-06-11 | 2006-05-02 | Jan Verspecht | Method and a test setup for measuring large-signal S-parameters that include the coefficients relating to the conjugate of the incident waves |
DE102004049421A1 (de) * | 2004-10-08 | 2006-06-14 | Universität Kassel | Meßanordnung zur Intermodulationsanalyse |
FI119079B (fi) * | 2004-11-08 | 2008-07-15 | Elektrobit System Test Oy | Sähkölaitteen sähköisen piirin karakterisointi |
US7548069B2 (en) | 2005-06-10 | 2009-06-16 | Maury Microwave, Inc. | Signal measurement systems and methods |
US20070136018A1 (en) * | 2005-12-09 | 2007-06-14 | Fernandez Andrew D | Nonlinear model calibration using attenuated stimuli |
JP2009522572A (ja) * | 2006-01-09 | 2009-06-11 | エヌエックスピー ビー ヴィ | 非線形動作を決定する方法及び装置 |
US7874587B2 (en) * | 2006-02-07 | 2011-01-25 | Toyota Motor Engineering & Manufacturing North America, Inc. | Glove box assembly exhibiting knee impact force transferring structure with respect to an associated vehicle dash/instrument panel and reinforcing bar and including removable strengthening ribs for tuning of crash safety characteristics |
US7489905B2 (en) * | 2006-03-01 | 2009-02-10 | Research In Motion Limited | System for determining RF path loss between an RF source and an RF receiver with hysteresis and related methods |
US7555293B2 (en) * | 2006-03-01 | 2009-06-30 | Research In Motion Limited | System for determining RF path loss between an RF source and an RF receiver and related methods |
US7555295B2 (en) * | 2006-03-01 | 2009-06-30 | Research In Motion Limited | System for determining radiated radio frequency (RF) receiver sensitivity and related methods |
US7555294B2 (en) * | 2006-03-01 | 2009-06-30 | Research In Motion Limited | System for determining total isotropic sensitivity (TIS) and related methods |
US7505766B2 (en) * | 2006-03-01 | 2009-03-17 | Research In Motion Limited | System for determining conducted radio frequency (RF) receiver sensitivity and related methods |
US20080086668A1 (en) * | 2006-10-05 | 2008-04-10 | Jefferson Stanley T | Model-based testing method and system using embedded models |
DE602008000050D1 (de) | 2007-06-15 | 2009-08-27 | Research In Motion Ltd | System zur Bestimmung der gesamten isotropen Empfindlichkeit mit Hilfe eines Empfangssignalstärkenanzeigerwertes und zugehörige Verfahren |
US8170489B2 (en) | 2008-06-04 | 2012-05-01 | Research In Motion Limited | System and methods for determining radiated radio frequency (RF) receiver sensitivity |
US20150084656A1 (en) * | 2013-09-25 | 2015-03-26 | Tektronix, Inc. | Two port vector network analyzer using de-embed probes |
WO2019140107A1 (en) * | 2018-01-10 | 2019-07-18 | Auspion, Inc. | Method and apparatus for wireless power delivery tracking |
US10985951B2 (en) | 2019-03-15 | 2021-04-20 | The Research Foundation for the State University | Integrating Volterra series model and deep neural networks to equalize nonlinear power amplifiers |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1988008969A1 (en) * | 1987-05-15 | 1988-11-17 | Eip Microwave, Inc. | Method for measurement of amplifier s parameters |
EP0321808A1 (de) * | 1987-12-23 | 1989-06-28 | BBC Brown Boveri AG | Verfahren zum Messen eines Wellenwiderstandes und einer Ausbreitungskonstante eines Zweitors |
US5276411A (en) * | 1992-06-01 | 1994-01-04 | Atn Microwave, Inc. | High power solid state programmable load |
US5572160A (en) * | 1994-12-01 | 1996-11-05 | Teradyne, Inc. | Architecture for RF signal automatic test equipment |
US5773985A (en) * | 1996-06-05 | 1998-06-30 | Wiltron Company | One port complex transmission and group delay measurements |
JP2000269108A (ja) * | 1999-03-15 | 2000-09-29 | Sharp Corp | 半導体製造装置の管理システム |
US6635872B2 (en) * | 2001-04-05 | 2003-10-21 | Applied Materials, Inc. | Defect inspection efficiency improvement with in-situ statistical analysis of defect data during inspection |
JP3698075B2 (ja) * | 2001-06-20 | 2005-09-21 | 株式会社日立製作所 | 半導体基板の検査方法およびその装置 |
GB2382662B (en) * | 2001-11-29 | 2003-12-10 | Univ Cardiff | High frequency circuit analyzer |
-
2001
- 2001-09-24 EP EP01203651A patent/EP1296149B1/de not_active Expired - Lifetime
- 2001-09-24 DE DE60121951T patent/DE60121951T2/de not_active Expired - Fee Related
-
2002
- 2002-09-13 JP JP2002267768A patent/JP2003179562A/ja active Pending
- 2002-09-23 US US10/252,855 patent/US6839657B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2003179562A (ja) | 2003-06-27 |
US20030057963A1 (en) | 2003-03-27 |
EP1296149A1 (de) | 2003-03-26 |
US6839657B2 (en) | 2005-01-04 |
EP1296149B1 (de) | 2006-08-02 |
DE60121951T2 (de) | 2007-04-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de | ||
8370 | Indication of lapse of patent is to be deleted | ||
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US |
|
8339 | Ceased/non-payment of the annual fee |