DE60024376D1 - Field effect semiconductor device - Google Patents

Field effect semiconductor device

Info

Publication number
DE60024376D1
DE60024376D1 DE60024376T DE60024376T DE60024376D1 DE 60024376 D1 DE60024376 D1 DE 60024376D1 DE 60024376 T DE60024376 T DE 60024376T DE 60024376 T DE60024376 T DE 60024376T DE 60024376 D1 DE60024376 D1 DE 60024376D1
Authority
DE
Germany
Prior art keywords
semiconductor device
field effect
effect semiconductor
field
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60024376T
Other languages
German (de)
Other versions
DE60024376T2 (en
Inventor
Makoto Inai
Hidehiko Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Application granted granted Critical
Publication of DE60024376D1 publication Critical patent/DE60024376D1/en
Publication of DE60024376T2 publication Critical patent/DE60024376T2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/80Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier
    • H01L29/802Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier with heterojunction gate, e.g. transistors with semiconductor layer acting as gate insulating layer, MIS-like transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Junction Field-Effect Transistors (AREA)
DE60024376T 1999-09-09 2000-09-11 Field effect semiconductor device Expired - Lifetime DE60024376T2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP25605999A JP3707766B2 (en) 1999-09-09 1999-09-09 Field effect semiconductor device
JP25605999 1999-09-09

Publications (2)

Publication Number Publication Date
DE60024376D1 true DE60024376D1 (en) 2006-01-05
DE60024376T2 DE60024376T2 (en) 2006-08-03

Family

ID=17287342

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60024376T Expired - Lifetime DE60024376T2 (en) 1999-09-09 2000-09-11 Field effect semiconductor device

Country Status (4)

Country Link
US (1) US7208777B1 (en)
EP (1) EP1083608B1 (en)
JP (1) JP3707766B2 (en)
DE (1) DE60024376T2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005249407A (en) * 2004-03-01 2005-09-15 Yokogawa Electric Corp Micro-array substrate for biopolymer, hybridization device and hybridization method
JP4854980B2 (en) * 2005-03-30 2012-01-18 住友電工デバイス・イノベーション株式会社 Switch circuit and semiconductor device manufacturing method
US8680580B2 (en) * 2007-11-19 2014-03-25 Renesas Electronics Corporation Field effect transistor and process for manufacturing same
US9685509B2 (en) 2013-07-30 2017-06-20 Samsung Electronics Co., Ltd. Finfet devices including high mobility channel materials with materials of graded composition in recessed source/drain regions
US9917158B2 (en) 2013-07-30 2018-03-13 Samsung Electronics Co., Ltd. Device contact structures including heterojunctions for low contact resistance

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3069106B2 (en) 1989-04-27 2000-07-24 株式会社日立製作所 Semiconductor device
JPH07147395A (en) 1991-11-27 1995-06-06 Sanyo Electric Co Ltd Field effect type semiconductor device
JPH06333956A (en) * 1992-08-26 1994-12-02 Sanyo Electric Co Ltd Field effect semiconductor device
JPH06252175A (en) 1993-02-24 1994-09-09 Sony Corp Transistor having high electron mobility
JP3616447B2 (en) 1996-02-27 2005-02-02 富士通株式会社 Semiconductor device
JPH1056168A (en) 1996-08-08 1998-02-24 Mitsubishi Electric Corp Field-effect transistor
JPH11177079A (en) 1997-12-15 1999-07-02 Nec Corp Field-effect transistor
JP3707765B2 (en) 1999-09-09 2005-10-19 株式会社村田製作所 Field effect semiconductor device

Also Published As

Publication number Publication date
JP2001085672A (en) 2001-03-30
DE60024376T2 (en) 2006-08-03
US7208777B1 (en) 2007-04-24
JP3707766B2 (en) 2005-10-19
EP1083608A1 (en) 2001-03-14
EP1083608B1 (en) 2005-11-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition