DE59902649D1 - METHOD AND DEVICE FOR TESTING PRINTED CIRCUITS - Google Patents

METHOD AND DEVICE FOR TESTING PRINTED CIRCUITS

Info

Publication number
DE59902649D1
DE59902649D1 DE59902649T DE59902649T DE59902649D1 DE 59902649 D1 DE59902649 D1 DE 59902649D1 DE 59902649 T DE59902649 T DE 59902649T DE 59902649 T DE59902649 T DE 59902649T DE 59902649 D1 DE59902649 D1 DE 59902649D1
Authority
DE
Germany
Prior art keywords
printed circuits
testing printed
testing
circuits
printed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE59902649T
Other languages
German (de)
Inventor
Gruyter Falko De
Hans-Hermann Higgen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATG Luther and Maelzer GmbH
Original Assignee
Luther and Maelzer GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Luther and Maelzer GmbH filed Critical Luther and Maelzer GmbH
Priority claimed from PCT/EP1999/000873 external-priority patent/WO1999042850A1/en
Application granted granted Critical
Publication of DE59902649D1 publication Critical patent/DE59902649D1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DE59902649T 1998-02-18 1999-02-10 METHOD AND DEVICE FOR TESTING PRINTED CIRCUITS Expired - Fee Related DE59902649D1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19806830 1998-02-18
DE19821225A DE19821225A1 (en) 1998-02-18 1998-05-12 Method for testing printed circuit cards
PCT/EP1999/000873 WO1999042850A1 (en) 1998-02-18 1999-02-10 Method and device for testing printed circuit boards

Publications (1)

Publication Number Publication Date
DE59902649D1 true DE59902649D1 (en) 2002-10-17

Family

ID=7858207

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19821225A Withdrawn DE19821225A1 (en) 1998-02-18 1998-05-12 Method for testing printed circuit cards
DE59902649T Expired - Fee Related DE59902649D1 (en) 1998-02-18 1999-02-10 METHOD AND DEVICE FOR TESTING PRINTED CIRCUITS

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19821225A Withdrawn DE19821225A1 (en) 1998-02-18 1998-05-12 Method for testing printed circuit cards

Country Status (2)

Country Link
KR (1) KR20010041066A (en)
DE (2) DE19821225A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19957286A1 (en) * 1999-11-29 2001-07-05 Atg Test Systems Gmbh Method and device for testing printed circuit boards
DE20005123U1 (en) * 2000-03-20 2001-08-02 Atg Test Systems Gmbh Device for testing printed circuit boards
DE102005028191B4 (en) * 2005-06-17 2009-04-09 Atg Luther & Maelzer Gmbh Method and device for testing unpopulated, large-area circuit boards with a finger tester
KR101222818B1 (en) * 2011-02-28 2013-01-15 대구도시철도공사 Pcb test module for digital track circuit

Also Published As

Publication number Publication date
DE19821225A1 (en) 1999-08-19
KR20010041066A (en) 2001-05-15

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: LUTHER & MAELZER GMBH & CO. KG, 31515 WUNSTORF, DE

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee