DE59709933D1 - Leiterplattenprüfvorrichtung - Google Patents

Leiterplattenprüfvorrichtung

Info

Publication number
DE59709933D1
DE59709933D1 DE59709933T DE59709933T DE59709933D1 DE 59709933 D1 DE59709933 D1 DE 59709933D1 DE 59709933 T DE59709933 T DE 59709933T DE 59709933 T DE59709933 T DE 59709933T DE 59709933 D1 DE59709933 D1 DE 59709933D1
Authority
DE
Germany
Prior art keywords
board
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE59709933T
Other languages
English (en)
Inventor
Gruyter Falko De
Hans-Hermann Higgen
Ruediger Dehmel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ATG Luther and Maelzer GmbH
Original Assignee
Luther and Maelzer GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Luther and Maelzer GmbH filed Critical Luther and Maelzer GmbH
Priority claimed from PCT/EP1997/005656 external-priority patent/WO1999001772A1/de
Application granted granted Critical
Publication of DE59709933D1 publication Critical patent/DE59709933D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07385—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using switching of signals between probe tips and test bed, i.e. the standard contact matrix which in its turn connects to the tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
DE59709933T 1997-07-03 1997-10-15 Leiterplattenprüfvorrichtung Expired - Fee Related DE59709933D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19728427 1997-07-03
DE19730516A DE19730516A1 (de) 1997-07-03 1997-07-16 Leiterplattenprüfvorrichtung
PCT/EP1997/005656 WO1999001772A1 (de) 1997-07-03 1997-10-15 Leiterplattenprüfvorrichtung

Publications (1)

Publication Number Publication Date
DE59709933D1 true DE59709933D1 (de) 2003-05-28

Family

ID=7834530

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19730516A Withdrawn DE19730516A1 (de) 1997-07-03 1997-07-16 Leiterplattenprüfvorrichtung
DE59709933T Expired - Fee Related DE59709933D1 (de) 1997-07-03 1997-10-15 Leiterplattenprüfvorrichtung

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19730516A Withdrawn DE19730516A1 (de) 1997-07-03 1997-07-16 Leiterplattenprüfvorrichtung

Country Status (1)

Country Link
DE (2) DE19730516A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6191600B1 (en) * 1999-01-22 2001-02-20 Delaware Capital Formation, Inc. Scan test apparatus for continuity testing of bare printed circuit boards
US6788078B2 (en) 2001-11-16 2004-09-07 Delaware Capital Formation, Inc. Apparatus for scan testing printed circuit boards

Also Published As

Publication number Publication date
DE19730516A1 (de) 1999-01-07

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: LUTHER & MAELZER GMBH & CO. KG, 31515 WUNSTORF, DE

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee